Integrated circuits having cross-couple constructs and semiconductor devices including integrated circuits
US-12532545-B2 · Jan 20, 2026 · US
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Lee Dal-Hee patents
Lee Dal-Hee is listed as an inventor on 31 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Lee Dal-Hee |
| Total patents | 31 |
| First publication | Feb 10, 2015 |
| Latest publication | Jan 20, 2026 |
Notable patents
Publications ranked by popularity score, then publication date.
Integrated circuits having cross-couple constructs and semiconductor devices including integrated circuits
US-2024203974-A1 · Jun 20, 2024 · US
Integrated circuits having cross-couple constructs and semiconductor devices including integrated circuits
US-11955471-B2 · Apr 9, 2024 · US
Integrated circuits having cross-couple constructs and semiconductor devices including integrated circuits
US-11335673-B2 · May 17, 2022 · US
Integrated circuits having cross-couple constructs and semiconductor devices including integrated circuits
US-2022149032-A1 · May 12, 2022 · US
Scan flip-flop and scan test circuit including the same
US-11287474-B2 · Mar 29, 2022 · US
Integrated circuit including interconnection and method of fabricating the same, the interconnection including a pattern shaped for mitigating electromigration
US-11189639-B2 · Nov 30, 2021 · US
Integrated circuit including multiple-height cell and method of manufacturing the integrated circuit
US-11101267-B2 · Aug 24, 2021 · US
Integrated circuit including interconnection and method of fabricating the same, the interconnection including a pattern shaped and/or a via disposed for mitigating electromigration
US-2020235126-A1 · Jul 23, 2020 · US
Integrated circuit including interconnection and method of fabricating the same, the interconnection including a pattern shaped and/or a via disposed for mitigating electromigration
US-10651201-B2 · May 12, 2020 · US
Recent patents
Latest publications not already listed above.
Integrated circuit including multiple-height cell and method of manufacturing the integrated circuit
US-2020051977-A1 · Feb 13, 2020 · US
Scan flip-flop and scan test circuit including the same
US-2019383875-A1 · Dec 19, 2019 · US
Scan flip-flop and scan test circuit including the same
US-10429443-B2 · Oct 1, 2019 · US
Integrated circuits having cross-couple constructs and semiconductor devices including integrated circuits
US-2019198491-A1 · Jun 27, 2019 · US
Engineering change order (ECO) cell, layout thereof and integrated circuit including the ECO cell
US-10192860-B2 · Jan 29, 2019 · US
Methods of generating integrated circuit layout using standard cell library
US-10108772-B2 · Oct 23, 2018 · US
Integrated circuit including interconnection for mitigating electromigration and method of fabricating the same
US-2018294280-A1 · Oct 11, 2018 · US
Integrated circuit and semiconductor device including the same
US-9960768-B2 · May 1, 2018 · US
Integrated circuit and semiconductor device including the same
US-9831877-B2 · Nov 28, 2017 · US
Scan flip-flop and scan test circuit including the same
US-2017328954-A1 · Nov 16, 2017 · US
Scan flip-flop and scan test circuit including the same
US-9753086-B2 · Sep 5, 2017 · US
Method and program for designing integrated circuit
US-9665678-B2 · May 30, 2017 · US
Engineering change order (eco) cell, layout thereof and integrated circuit including the eco cell
US-2017116366-A1 · Apr 27, 2017 · US
Integrated circuit and semiconductor device including the same
US-2017093401-A1 · Mar 30, 2017 · US
Methods of generating integrated circuit layout using standard cell library
US-2017011160-A1 · Jan 12, 2017 · US
Methods of generating integrated circuit layout using standard cell library
US-9460259-B2 · Oct 4, 2016 · US
Integrated circuit and semiconductor device including the same
US-2016285452-A1 · Sep 29, 2016 · US
Integrated circuit and semiconductor device including the same
US-9379705-B2 · Jun 28, 2016 · US
Methods of generating integrated circuit layout using standard cell library
US-2016055285-A1 · Feb 25, 2016 · US
Method and program for designing integrated circuit
US-2016034627-A1 · Feb 4, 2016 · US
Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Samsung Electronics Co Ltd | 31 |
| Kim Ha-Young | 1 |
| Cho Sung-Wee | 1 |
| Lee Dal-Hee | 1 |
| Lee Jae-Ha | 1 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| H10D89/10 | 21 |
| H01L27/0207 | 14 |
| H10D84/038 | 12 |
| H03K19/018507 | 11 |
| H10W20/43 | 10 |