Method for manufacturing semiconductor device
US-10957785-B2 · Mar 23, 2021 · US
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Xie Xinyun patents
Xie Xinyun is listed as an inventor on 27 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Xie Xinyun |
| Total patents | 27 |
| First publication | Feb 5, 2015 |
| Latest publication | Mar 23, 2021 |
Notable patents
Publications ranked by popularity score, then publication date.
Method for manufacturing semiconductor device
US-2019326418-A1 · Oct 24, 2019 · US
Method for manufacturing semiconductor device
US-10381464-B2 · Aug 13, 2019 · US
Fin-type semiconductor device
US-10312333-B2 · Jun 4, 2019 · US
FinFET devices having a material formed on reduced source/drain region
US-10290724-B2 · May 14, 2019 · US
Method for manufacturing semiconductor device
US-2018337265-A1 · Nov 22, 2018 · US
Semiconductor device and FinFET transistor
US-10134761-B2 · Nov 20, 2018 · US
Fin-type semiconductor device
US-2018175151-A1 · Jun 21, 2018 · US
Semiconductor device having improved core and input/output device reliability
US-9985015-B2 · May 29, 2018 · US
Fabricating method of fin-type semiconductor device
US-9923065-B2 · Mar 20, 2018 · US
Recent patents
Latest publications not already listed above.
FINFET structure and method of forming same
US-9899380-B2 · Feb 20, 2018 · US
Semiconductor device and finfet transistor
US-2018006063-A1 · Jan 4, 2018 · US
Semiconductor device, FinFET transistor and fabrication method thereof
US-9799676-B2 · Oct 24, 2017 · US
Finfet devices having a material formed on reduced source/drain region
US-2017229559-A1 · Aug 10, 2017 · US
FinFET device having a material formed on reduced source/drain region and method of forming the same
US-9673325-B2 · Jun 6, 2017 · US
FinFET and fabrication method thereof
US-9634087-B1 · Apr 25, 2017 · US
Semiconductor device having improved core and input/output device reliability
US-2017040310-A1 · Feb 9, 2017 · US
Semiconductor device and fabricating method thereof
US-2017033190-A1 · Feb 2, 2017 · US
Semiconductor device, finfet transistor and fabrication method thereof
US-2016351591-A1 · Dec 1, 2016 · US
Method for core and in/out-put device reliability improve at high-K last process
US-9502403-B2 · Nov 22, 2016 · US
Semiconductor device and fabrication method thereof
US-9472668-B2 · Oct 18, 2016 · US
Finfet structure and method of forming same
US-2016240530-A1 · Aug 18, 2016 · US
Methods for finfet source/drain formation and finfet devices
US-2016093738-A1 · Mar 31, 2016 · US
Semiconductor device and fabrication method thereof
US-2016020325-A1 · Jan 21, 2016 · US
Method for FinFET SRAM ratio tuning
US-9184170-B2 · Nov 10, 2015 · US
Method for finfet sram ratio tuning
US-2015102423-A1 · Apr 16, 2015 · US
Method for core and in/out-put device reliability improve at high-k last process
US-2015035079-A1 · Feb 5, 2015 · US
Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Semiconductor Mfg Int Shanghai Corp | 21 |
| Semiconductor Mfg Int Beijing Corp | 9 |
| Semiconductor Mfg Int Shanghai | 5 |
| Semiconductor Mfg Intl Shanghai Corp | 1 |
| Semiconductor Mfg Intl Beijing Corp | 1 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| H10D84/038 | 23 |
| H10D30/024 | 19 |
| H10D30/62 | 14 |
| H01L29/66795 | 13 |
| H10P50/242 | 10 |