Implementing resistance defect performance mitigation using test signature directed self heating and increased voltage
US-2016379898-A1 · Dec 29, 2016 · US
Aspects of quality control [QC] (G01R31/31718 takes precedence; program control for QC G05B19/41875)
Aspects of quality control [QC] (G01R31/31718 takes precedence; program control for QC G05B19/41875) · Cooperative Patent Classification (CPC)
Computing, optics, measurement, and control technologies.
Related technology areas
Mapped technology topics for this CPC code.
| Metric | Value |
|---|---|
| CPC code | G01R31/2894 |
| Official title | {Aspects of quality control [QC] (G01R31/31718 takes precedence; program control for QC G05B19/41875)} |
| Display label | Aspects of quality control [QC] (G01R31/31718 takes precedence; program control for QC G05B19/41875) |
| Total patents | 369 |
Filing trend
Year-over-year patent counts classified under this CPC code.
Filing activity over the last five years is stable.
| Year | Patents |
|---|---|
| 2015 | 39 |
| 2016 | 33 |
| 2017 | 32 |
| 2018 | 39 |
| 2019 | 32 |
| 2020 | 29 |
| 2021 | 24 |
| 2022 | 35 |
| 2023 | 41 |
| 2024 | 32 |
| 2025 | 28 |
| 2026 | 5 |
Representative patents
Representative publications under this CPC code from precomputed stats, or recent filings when stats are unavailable.
Integrated circuit chip reliability qualification using a sample-specific expected fail rate
US-2016377674-A1 · Dec 29, 2016 · US
Charge sharing testing of through-body-vias
US-9513330-B2 · Dec 6, 2016 · US
Efficient method of retesting integrated circuits
US-2016320444-A1 · Nov 3, 2016 · US
Method and apparatus for detection of failures in under-fill layers in integrated circuit assemblies
US-2016322265-A1 · Nov 3, 2016 · US
Detecting apparatus, wafer and electronic device
US-9466540-B2 · Oct 11, 2016 · US
Electronic devcie with chip-on-film package
US-2016291087-A1 · Oct 6, 2016 · US
Creation and scheduling of a decision and execution tree of a test cell controller
US-9448276-B2 · Sep 20, 2016 · US
Reliability test screen optimization
US-9429619-B2 · Aug 30, 2016 · US
Methods and devices for determining logical to physical mapping on an integrated circuit
US-2016245861-A1 · Aug 25, 2016 · US
Apparatus and methods for through substrate via test
US-2016233136-A1 · Aug 11, 2016 · US
Method of design-based defect classification and system thereof
US-9401013-B2 · Jul 26, 2016 · US
Electronic device with chip-on-film package
US-9400310-B2 · Jul 26, 2016 · US
Method of generating quality affecting factor for semiconductor manufacturing process and generating system for the same
US-2016202312-A1 · Jul 14, 2016 · US
Pattern quality management chart, pattern quality management method, and pattern formation method
US-2016195599-A1 · Jul 7, 2016 · US
Methods and devices for determining logical to physical mapping on an integrated circuit
US-9378848-B2 · Jun 28, 2016 · US
Optimal test flow scheduling within automated test equipment for minimized mean time to detect failure
US-2016154719-A9 · Jun 2, 2016 · US
Touchdown monitoring for individual dies of a semiconductor wafer
US-9347979-B2 · May 24, 2016 · US
Methodology for testing integrated circuits
US-9304163-B2 · Apr 5, 2016 · US
Integrated fan-out pillar probe system
US-2016077147-A1 · Mar 17, 2016 · US
Frequently asked questions
Answers are generated from the same data shown on this page.
- What is CPC G01R31/2894?
- CPC G01R31/2894 is the Cooperative Patent Classification code for “Aspects of quality control [QC] (G01R31/31718 takes precedence; program control for QC G05B19/41875).”
- How many patents are filed under CPC G01R31/2894 (Aspects of quality control [QC] (G01R31/31718 takes precedence; program control for QC G05B19/41875))?
- Our database includes 369 publications tagged with this CPC code.
- Is patent activity under CPC G01R31/2894 growing?
- Publication counts under this code: 32 in 2024 vs 28 in 2025 (latest complete years).