Apparatus and method for authentication of electronic device test stations
US-10996308-B2 · May 4, 2021 · US
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Cheung Yu Sze patents
Cheung Yu Sze is listed as an inventor on 23 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Cheung Yu Sze |
| Total patents | 23 |
| First publication | Feb 16, 2016 |
| Latest publication | May 4, 2021 |
Notable patents
Publications ranked by popularity score, then publication date.
Test handler having multiple testing sectors
US-2020341056-A1 · Oct 29, 2020 · US
Apparatus and method for inspecting substantially transparent electronic devices
US-10699932-B2 · Jun 30, 2020 · US
Method and apparatus for aligning electronic components
US-10473714-B2 · Nov 12, 2019 · US
Apparatus and method for authentication of electronic device test stations
US-2019317174-A1 · Oct 17, 2019 · US
Apparatus and method for inspecting substantially transparent electronic devices
US-2019311931-A1 · Oct 10, 2019 · US
Method and apparatus for aligning probe pins with respect to positions of electronic devices
US-10324126-B2 · Jun 18, 2019 · US
Electrical contact having electrical isolated members for contacting an electrical component
US-10151774-B2 · Dec 11, 2018 · US
Apparatus and method for adjustment of a handling device for handling electronic components
US-10115620-B2 · Oct 30, 2018 · US
Apparatus for securing electronic devices on a carrier during transportation
US-10091919-B2 · Oct 2, 2018 · US
Recent patents
Latest publications not already listed above.
Method and apparatus for aligning electronic components
US-2018252766-A1 · Sep 6, 2018 · US
Apparatus for securing electronic devices on a carrier during transportation
US-2018242481-A1 · Aug 23, 2018 · US
Electronic device separator for a feeding apparatus
US-9850074-B2 · Dec 26, 2017 · US
Method and apparatus for aligning probe pins with respect to positions of electronic devices
US-2017356958-A1 · Dec 14, 2017 · US
Electronic device separator for a feeding apparatus
US-2017283178-A1 · Oct 5, 2017 · US
High throughput test handler system
US-9606171-B2 · Mar 28, 2017 · US
Apparatus and method for adjustment of a handling device for handling electronic components
US-2017062256-A1 · Mar 2, 2017 · US
Apparatus and method for transferring electronic devices
US-9561914-B1 · Feb 7, 2017 · US
Electrical contact for contacting an electrical component
US-2016363610-A1 · Dec 15, 2016 · US
Method for aligning electronic components
US-9510460-B2 · Nov 29, 2016 · US
Apparatus and method of using an imaging device for adjustment of at least one handling device for handling semiconductor components
US-9465383-B2 · Oct 11, 2016 · US
High throughput test handler system
US-2016216322-A1 · Jul 28, 2016 · US
Test contactor for electrical testing of electronic components
US-9261536-B2 · Feb 16, 2016 · US
Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Asm Tech Singapore Pte Ltd | 24 |
| Cheung Yu Sze | 3 |
| Siu Hing Suen | 2 |
| Cheng Chi Wah | 2 |
| Lam Yan Yiu | 1 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| G01R31/2893 | 7 |
| G01R31/2891 | 4 |
| G01R1/0408 | 4 |
| H10P72/53 | 4 |
| H01L21/681 | 4 |