Method and apparatus for aligning probe pins with respect to positions of electronic devices

Patent metadata

Field	Value
Publication number	US-10324126-B2
Application number	US-201615178956-A
Country	US
Kind code	B2
Filing date	Jun 10, 2016
Priority date	Jun 10, 2016
Publication date	Jun 18, 2019
Grant date	Jun 18, 2019

Abstract

A method for aligning probe pins with respect to positions of electronic devices comprises conducting contact stamping on a first electronic device with the probe pins to form first probe marks on lead pads of the first electronic device, capturing an image of the first electronic device, determining positions of the first probe marks on the first electronic device using the captured image, calculating an offset using the positions of the first probe marks, adjusting relative positions between a subsequent plurality of electronic devices and the probe pins using the offset, and contacting lead pads of the subsequent plurality of electronic devices with the probe pins for testing said electronic devices. The first probe marks are configured to have greater visibility as compared with second probe marks formed when contacting the lead pads of the subsequent plurality of electronic devices with the probe pins, so as to improve the accuracy of the offset calculated.

First claim

The invention claimed is:

1. A method for aligning probe pins with respect to positions of electronic devices, the method comprising:
conducting contact stamping on a first electronic device with the probe pins multiple times repeatedly at a same position of the probe pins relative to the first electronic device to form deeper first probe marks on lead pads of the first electronic device;
capturing an image of the first electronic device;
determining positions of the first probe marks on the first electronic device using the captured image;
calculating an offset using the positions of the first probe marks;
adjusting relative positions between a subsequent plurality of electronic devices and the probe pins using the offset; and
contacting lead pads of the subsequent plurality of electronic devices with the probe pins for testing said electronic devices, the contacting of the lead pads of the subsequent plurality of electronic devices with the probe pins forming second probe marks, wherein the first probe marks have a different characteristic than the second probe marks, and wherein the different characteristic is that the first probe marks formed during the contact stamping are configured to have greater visibility as compared with the second probe marks.

2. The method according to claim 1 , further comprising the following steps prior to the step of conducting contact stamping on the first electronic device with the probe pins:
retrieving the first electronic device with a handling member; and
determining a position of the first electronic device relative to the handling member.

3. The method according to claim 2 , wherein the step of adjusting the relative positions between the subsequent plurality of electronic devices and the probe pins using the offset comprises:
retrieving a subsequent electronic device with the handling member;
determining a position of the subsequent electronic device relative to the handling member;
calculating a difference between the position of the subsequent electronic device relative to the handling member and the position of the first electronic device relative to the handling member; and
adjusting the relative position between the subsequent electronic device and the probe pins using the offset and the calculated difference.

4. The method according to claim 3 , wherein the step of adjusting the relative position between the subsequent electronic device and the probe pins is conducted by an adjusting station that is integrated with a contactor station for testing the electronic device such that the adjusting station and the contactor station form a single station.

5. The method according to claim 4 , wherein the step of adjusting the relative positions between the subsequent plurality of electronic devices and the probe pins using the offset further comprises the step of adjusting positions of the probe pins using the single station.

6. The method according to claim 3 , wherein the step of adjusting the relative position between the subsequent electronic device and the probe pins is conducted by an adjusting station that is separate from a contactor station for testing the electronic device.

7. The method according to claim 6 , wherein the step of adjusting the relative positions between the subsequent plurality of electronic devices and the probe pins using the offset is performed by the adjusting station with respect to the handling member prior to the contacting of the lead pads of the subsequent plurality of electronic devices with the probe pins.

8. The method according to claim 2 , wherein the step of determining the position of the first electronic device relative to the handling member comprises capturing an image of the first electronic device and determining the position using the captured image.

9. The method according to claim 8 , wherein the step of capturing the image of the first electronic device prior to the step of conducting contact stamping on the first electronic device with the probe pins and the step of capturing the image of the first electronic device after the step of conducting contact stamping on the first electronic device with the probe pins are conducted using a single imaging station.

10. The method according to claim 8 , wherein the step of capturing the image of the first electronic device prior to the step of conducting contact stamping on the first electronic device with the probe pins is conducted using one imaging station and the step of capturing the image of the first electronic device after the step of conducting contact stamping on the first electronic device with the probe pins is conducted using another imaging station.

11. The method according to claim 1 , further comprising adjusting a relative position between the first electronic device and the probe pins prior to the step of conducting contact stamping on the first electronic device with the probe pins.

12. The method according to claim 1 , wherein the step of calculating the offset comprises determining differences in the positions of the first probe marks and centres of respective lead pads of the first electronic device the first probe marks are formed on.

13. The method according to claim 1 , wherein the first probe marks are formed to have a first level of depth and the second probe marks have a second level of depth, the second level of depth being less than the first level of depth.

14. The method according to claim 1 , wherein the step of adjusting the relative positions between the subsequent plurality of electronic devices and the probe pins using the offset is conducted manually using an adjusting station including a gauge configured to facilitate manual adjustment of positions of the electronic devices or the probe pins.

15. An apparatus for aligning probe pins with respect to positions of electronic devices, the apparatus comprising:
a contactor station configured to conduct contact stamping on a first electronic device with the probe pins multiple times repeatedly at a same position of the probe pins relative to the first electronic device to form deeper first probe marks on lead pads of the first electronic device and to contact lead pads of a subsequent plurality of electronic devices with the probe pins to conduct testing of the subsequent plurality of electronic devices with the probe pins, which testing forms second probe marks, the first probe marks having a different characteristic than the second probe marks, and the different characteristic is that the first probe marks formed during the contact stamping are configured to have greater visibility as compared with the second probe marks;
an imaging station configured to capture an image of the first electronic device after the contact stamping of the first electronic device with the probe pins;
a processing module configured to determine positions of the first probe marks on the first electronic device using the captured image and to calculate an offset using the positions of the first probe marks; and
an adjusting station configured for adjusting relative positions between the subsequent plurality of electronic devices and the probe pins using the offset prior to the testing of the subsequent plurality of electronic devices with the probe pins.

Assignees

• Asm Tech Singapore Pte Ltd

Inventors

• Cheung Yu Sze
• Ng Hon Kam
• YIP Chun Shing

Classifications

• G01R1/06794

  Devices for sensing when probes are in contact, or in position to contact, with measured object · CPC title

• G01R31/00 Primary

  Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere ({measuring superconductive properties G01R33/1238;} testing line transmission systems H04B3/46; testing or measuring semiconductors or solid state devices during manufacture {H10P74/00}) · CPC title

• G06T7/74

  involving reference images or patches · CPC title

• G01R31/2891 Primary

  related to sensing or controlling of force, position, temperature (G01R31/2874 takes precedence; sensing of force G01L; sensing of position G01B, G01D; sensing of temperature G01K; controlling in general G05) · CPC title

• G01R1/07364

  with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch · CPC title