Method and apparatus for semiconductor testing at low temperature
US-9224659-B2 · Dec 29, 2015 · US
US10151774B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-10151774-B2 |
| Application number | US-201514735405-A |
| Country | US |
| Kind code | B2 |
| Filing date | Jun 10, 2015 |
| Priority date | Jun 10, 2015 |
| Publication date | Dec 11, 2018 |
| Grant date | Dec 11, 2018 |
A practical reading order for non-experts. Skip the full description unless you need deep technical detail.
What the patent document calls the invention.
A short plain-language summary of the technical disclosure.
Who owns or filed the patent and who is credited as inventor.
Filing, priority, publication, and grant dates set the timeline.
The legal scope of protection — read this for what is actually claimed.
Technology tags used to group this patent with similar filings.
Prior art links and similar publications in this corpus.
Official abstract text for this publication.
Disclosed are an electrical contact for contacting an electrical component, an apparatus for testing an electrical component and a method of assembling an apparatus comprising an electrical contact for testing an electrical component. The electrical contact comprises a first member longitudinally extending and having an end, said first member having a first longitudinal side and a second longitudinal side; a second member having a first segment extending longitudinally adjacent to the first longitudinal side of the first member, a second segment extending longitudinally adjacent to the second longitudinal side of the first member, and a third segment extending substantially transverse to the first member and located adjacent to the end of the first member, the third segment being provided to couple the first segment to the second segment; wherein a continuous channel is defined between the first member and the second member such that the first member and the second member are electrically isolated from each other.
Opening claim text (preview).
The invention claimed is: 1. An electrical contact for conductively receiving a lead of an electrical component, the electrical contact comprising: first and second members configured and dimensioned to provide a substantially planar surface for receiving a corresponding substantially planar surface of said lead of the electrical component on both of said first and second members; the first member longitudinally extending and having an end, a first longitudinal side, and a second longitudinal side opposite to the first longitudinal side; the second member having a first segment extending longitudinally adjacent to the first longitudinal side of the first member, a second segment extending longitudinally adjacent to the second longitudinal side of the first member, and a third segment extending substantially transverse to the first member and located adjacent to the end of the first member, the third segment being provided to couple the first segment to the second segment; wherein a continuous channel is defined between the first member and the second member such that the first member and the second member are electrically isolated from each other. 2. The electrical contact according to claim 1 , wherein the second member terminates at an end at the second segment, said end of the second member being adjacent to the second longitudinal side of the first member. 3. The electrical contact according to claim 1 , wherein the first and second segments of the second member are substantially parallel to the first member. 4. The electrical contact according to claim 1 , wherein one of the first member and the second member is configured to supply a signal to the electrical component and the other one of the first member and the second member is configured to detect a signal from the electrical component. 5. The electrical contact according to claim 1 , wherein said first, second and third segments together define a U-shape of said second member, thereby defining a continuous U-shaped channel between the first member and the second member. 6. The electrical contact according to claim 1 , wherein said lead of the electrical component is received simultaneously on both of said first and second members. 7. An apparatus for testing an electrical component, said apparatus comprising at least one electrical contact for conductively receiving a lead of the electrical component, the electrical contact comprising: first and second members configured and dimensioned to provide a substantially planar surface for receiving a corresponding substantially planar surface of said lead of the electrical component on both of said first and second members; the first member longitudinally extending and having an end, said first member having a first longitudinal side, and a second longitudinal side opposite to the first longitudinal side; the second member having a first segment extending longitudinally adjacent to the first longitudinal side of the first member, a second segment extending longitudinally adjacent to the second longitudinal side of the first member, and a third segment extending substantially transverse to the first member and located adjacent to the end of the first member, the third segment being provided to couple the first segment to the second segment; wherein a continuous channel is defined between the first member and the second member such that the first member and the second member are electrically isolated from each other. 8. The apparatus according to claim 7 , wherein the second member terminates at an end at the second segment, said end of the second member being adjacent to the second longitudinal side of the first member. 9. The apparatus according to claim 7 , further comprising a holder for maintaining the first member and the second member of the at least one electrical contact in a fixed position. 10. The apparatus according to claim 7 , wherein the first and second segments of the second member are substantially parallel to the first member. 11. The apparatus according to claim 7 , wherein one of the first member and the second member is configured to supply a signal to the electrical component and the other one of the first member and the second member is configured to detect a signal from the electrical component. 12. The apparatus according to claim 7 , wherein said first, second and third segments together define a U-shape of said second member, thereby defining a continuous U-shaped channel between the first member and the second member. 13. The apparatus according to claim 7 , wherein said lead of the electrical component is received simultaneously on both of said first and second members. 14. A method of assembling an apparatus for testing an electrical component, said method comprising providing a holder; providing at least one electrical contact for conductively receiving a lead of the electrical component, the electrical contact comprising: first and second members configured and dimensioned to provide a substantially planar surface for receiving a corresponding substantially planar surface of said lead of the electrical component on both of said first and second members; the first member longitudinally extending and having an end, said first member having a first longitudinal side, and a second longitudinal side opposite to the first longitudinal side; the first member being supported by a first support strip to facilitate fixation by the holder; the second member being supported by a second support strip to facilitate fixation by the holder, the second member further having a first segment extending longitudinally adjacent to the first longitudinal side of the first member, a second segment extending longitudinally adjacent to the second longitudinal side of the first member, and a third segment extending substantially transverse to the first member and located adjacent to the end of the first member, the third segment being provided to couple the first segment to the second segment; and a continuous channel defined between the first member and the second member such that the first member and the second member are electrically isolated from each other; and fixedly securing the first and second support strips relative to each other by fastening end portions of the first and second support strips with the holder. 15. The method according to claim 14 , wherein the first and second segments of the second member are fixedly secured substantially parallel to the first member. 16. The method according to claim 14 , wherein said first, second and third segments together define a U-shape of said second member, thereby defining a continuous U-shaped channel between the first member and the second member. 17. The method according to claim 14 , wherein said lead of the electrical component is received simultaneously on both of said first and second members.
Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets (G01R1/067 takes precedence; mass production testing systems G01R31/59; testing of connections G01R31/66; for testing printed circuit boards G01R31/2808) · CPC title
Housings; Supporting members; Arrangements of terminals · CPC title
Connectors, terminals (G01R1/0425 and G01R1/0433 take precedence; with measurement function for battery poles G01R31/364) · CPC title
Related publications grouped by family.
Answers are generated from the same data shown on this page.