Method and apparatus for semiconductor testing at low temperature
US-9224659-B2 · Dec 29, 2015 · US
US2016363610A1 · US · A1
| Field | Value |
|---|---|
| Publication number | US-2016363610-A1 |
| Application number | US-201514735405-A |
| Country | US |
| Kind code | A1 |
| Filing date | Jun 10, 2015 |
| Priority date | Jun 10, 2015 |
| Publication date | Dec 15, 2016 |
| Grant date | — |
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Disclosed are an electrical contact for contacting an electrical component, an apparatus for testing an electrical component and a method of assembling an apparatus comprising an electrical contact for testing an electrical component. The electrical contact comprises a first member longitudinally extending and having an end, said first member having a first longitudinal side and a second longitudinal side; a second member having a first segment extending longitudinally adjacent to the first longitudinal side of the first member, a second segment extending longitudinally adjacent to the second longitudinal side of the first member, and a third segment extending substantially transverse to the first member and located adjacent to the end of the first member, the third segment being provided to couple the first segment to the second segment; wherein a continuous channel is defined between the first member and the second member such that the first member and the second member are electrically isolated from each other.
Opening claim text (preview).
1 . An electrical contact for contacting an electrical component, the electrical contact comprising a first member longitudinally extending and having an end, said first member having a first longitudinal side and a second longitudinal side; a second member having a first segment extending longitudinally adjacent to the first longitudinal side of the first member, a second segment extending longitudinally adjacent to the second longitudinal side of the first member, and a third segment extending substantially transverse to the first member and located adjacent to the end of the first member, the third segment being provided to couple the first segment to the second segment; wherein a continuous channel is defined between the first member and the second member such that the first member and the second member are electrically isolated from each other. 2 . The electrical contact according to claim 1 , wherein the second member terminates at an end at the second segment, said end of the second member being adjacent to the second longitudinal side of the first member. 3 . The electrical contact according to claim 1 , wherein the first and second segments of the second member are substantially parallel to the first member. 4 . The electrical contact according to claim 1 , wherein one of the first member and the second member is configured to supply a signal to the electrical component and the other one of the first member and the second member is configured to detect a signal from the electrical component. 5 . The electrical contact according to claim 1 , wherein the first member and the second member are each configured to have a planar surface for establishing contact with a lead of the electrical component. 6 . The electrical contact according to claim 5 , wherein the planar surface of the first member and the planar surface of the second member are coplanar. 7 . An apparatus for testing an electrical component, said apparatus comprising at least one electrical contact for contacting the electrical component, the electrical contact comprising: a first member longitudinally extending and having an end, said first member having a first longitudinal side and a second longitudinal side; a second member having a first segment extending longitudinally adjacent to the first longitudinal side of the first member, a second segment extending longitudinally adjacent to the second longitudinal side of the first member, and a third segment extending substantially transverse to the first member and located adjacent to the end of the first member, the third segment being provided to couple the first segment to the second segment; wherein a continuous channel is defined between the first member and the second member such that the first member and the second member are electrically isolated from each other. 8 . The apparatus according to claim 7 , wherein the second member terminates at an end at the second segment, said end of the second member being adjacent to the second longitudinal side of the first member. 9 . The apparatus according to claim 7 , further comprising a holder for maintaining the first member and the second member of the at least one electrical contact in a fixed position. 10 . The apparatus according to claim 7 , wherein the first and second segments of the second member are substantially parallel to the first member. 11 . The apparatus according to claim 7 , wherein one of the first member and the second member is configured to supply a signal to the electrical component and the other one of the first member and the second member is configured to detect a signal from the electrical component. 12 . The apparatus according to claim 7 , wherein the first member and the second member are each configured to have a planar surface for establishing contact with a lead of the electrical component. 13 . The apparatus according to claim 12 , wherein the planar surface of the first member and the planar surface of the second member are coplanar. 14 . A method of assembling an apparatus for testing an electrical component, said method comprising providing a holder; providing at least one electrical contact for contacting the electrical component, the electrical contact comprising a first member longitudinally extending and having an end, said first member having a first longitudinal side and a second longitudinal side, the first member being supported by a first support strip to facilitate fixation by the holder; a second member being supported by a second support strip to facilitate fixation by the holder, the second member further having a first segment extending longitudinally adjacent to the first longitudinal side of the first member, a second segment extending longitudinally adjacent to the second longitudinal side of the first member, and a third segment extending substantially transverse to the first member and located adjacent to the end of the first member, the third segment being provided to couple the first segment to the second segment; and a continuous channel defined between the first member and the second member such that the first member and the second member are electrically isolated from each other; and fixedly securing the first and second support strips relative to each other by fastening end portions of the first and second support strips with the holder. 15 . The method according to claim 14 , wherein the first and second segments of the second member are fixedly secured substantially parallel to the first member.
Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets (G01R1/067 takes precedence; mass production testing systems G01R31/59; testing of connections G01R31/66; for testing printed circuit boards G01R31/2808) · CPC title
for manufacturing contact members, e.g. by punching and by bending · CPC title
Contact members · CPC title
Connectors, terminals (G01R1/0425 and G01R1/0433 take precedence; with measurement function for battery poles G01R31/364) · CPC title
Housings; Supporting members; Arrangements of terminals · CPC title
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