Method and apparatus for aligning electronic components

US10473714B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-10473714-B2
Application numberUS-201715450101-A
CountryUS
Kind codeB2
Filing dateMar 6, 2017
Priority dateMar 6, 2017
Publication dateNov 12, 2019
Grant dateNov 12, 2019

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

A method for automated alignment between a plurality of electronic components and at least one testing device for receiving the electronic components for testing which includes defining a fiducial marker and positioning a moveable imaging device relative to a stationary imaging device, such that the fiducial marker is within a field of view of the moveable imaging device and within a field of view of the stationary imaging device. The moveable imaging device determines, with respect to each of the at least one testing device, a first offset between the testing device and the fidicual marker. The stationary imaging device determines, with respect to each electronic component, a second offset between the electronic component and the fidicual marker. Alignment is effected between each electronic component and the testing device in accordance with the first and second offsets.

First claim

Opening claim text (preview).

The invention claimed is: 1. A method for automated alignment between a plurality of electronic components and at least one testing device for receiving the electronic components for testing, the method comprising the steps of: defining a fiducial marker; positioning a moveable imaging device relative to a stationary imaging device, such that the fiducial marker is within a field of view of the moveable imaging device and within a field of view of the stationary imaging device; determining, by the moveable imaging device with respect to each of the at least one testing device, a first offset between the testing device and the fidicual marker; determining, by the stationary imaging device with respect to each electronic component, a second, offset between the electronic component and the fidicual marker; and effecting alignment between each electronic component and the testing device in accordance with the first and second offsets. 2. The method according to claim 1 , wherein the fiducial marker is a visible reference marker placed between the stationary imaging device and the moveable imaging device. 3. The method according to claim 1 , wherein the moveable imaging device is coupled to a rotary device. 4. The method according to claim 3 , further comprising the step of conveying the moveable imaging device by the rotary device to each of the at least one testing device for determining the first offset. 5. The method according to claim 3 , wherein each of the moveable and stationary imaging devices is positioned along a same circumferential path of the rotary device. 6. The method according to claim 1 , further comprising adjusting each electronic component in accordance with the first and second offsets to align the electronic component with the testing device receiving it for testing. 7. The method according to claim 1 , further comprising adjusting each testing device in accordance with the first and second offsets to align the testing device with the electronic component receivable by the testing device for testing. 8. The method according to claim 7 , further comprising the step of fixedly holding the electronic component while the testing device is being adjusted. 9. The method according to claim 1 , wherein the fiducial marker is within the field of view of the movable imaging device and within the field of the stationary imaging device at the same time. 10. A method for automated alignment between a plurality of electronic components and at least one testing device for receiving the electronic components for testing, the method comprising the steps of: defining a fiducial marker; positioning a first imaging device and a second imaging device to be relatively movable, such that the fiducial marker is within a field of view of the first imaging device and within a field of view of the second imaging device; determining, by the first imaging device with respect to each of the at least one testing device, a first offset between the testing device and the fidicual marker; determining, by the second imaging device with respect to each electronic component, a second offset between the electronic component and the fidicual marker; and effecting alignment between each electronic component and the testing device in accordance with the first and second offsets. 11. The method according to claim 10 , wherein the fiducial marker comprises an object to be simultaneously placed in the field of view of each of the first and the second imaging devices during the determining steps.

Assignees

Inventors

Classifications

  • using photoelectric detection means · CPC title

  • related to sensing or controlling of force, position, temperature (G01R31/2874 takes precedence; sensing of force G01L; sensing of position G01B, G01D; sensing of temperature G01K; controlling in general G05) · CPC title

  • Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards (probe, multiprobe, probe manipulator or probe fixture G01R1/067) · CPC title

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What does patent US10473714B2 cover?
A method for automated alignment between a plurality of electronic components and at least one testing device for receiving the electronic components for testing which includes defining a fiducial marker and positioning a moveable imaging device relative to a stationary imaging device, such that the fiducial marker is within a field of view of the moveable imaging device and within a field of v…
Who is the assignee on this patent?
Asm Tech Singapore Pte Ltd
What technology area does this patent fall under?
Primary CPC classification G01R31/2891. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Nov 12 2019 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 2 related publications on this page (citations in our corpus or others sharing the same primary CPC).