Method and apparatus for aligning electronic components

Patent metadata

Field	Value
Publication number	US-2018252766-A1
Application number	US-201715450101-A
Country	US
Kind code	A1
Filing date	Mar 6, 2017
Priority date	Mar 6, 2017
Publication date	Sep 6, 2018
Grant date	—

Abstract

A method for automated alignment between a plurality of electronic components and at least one testing device for receiving the electronic components for testing which includes defining a fiducial marker and positioning a moveable imaging device relative to a stationary imaging device, such that the fiducial marker is within a field of view of the moveable imaging device and within a field of view of the stationary imaging device. The moveable imaging device determines, with respect to each of the at least one testing device, a first offset between the testing device and the fidicual marker. The stationary imaging device determines, with respect to each electronic component, a second offset between the electronic component and the fidicual marker. Alignment is effected between each electronic component and the testing device in accordance with the first and second offsets.

First claim

1 . A method for automated alignment between a plurality of electronic components and at least one testing device for receiving the electronic components for testing, the method comprising the steps of:
defining a fiducial marker; positioning a moveable imaging device relative to a stationary imaging device, such that the fiducial marker is within a field of view of the moveable imaging device and within a field of view of the stationary imaging device; determining, by the moveable imaging device with respect to each of the at least one testing device, a first offset between the testing device and the fidicual marker; determining, by the stationary imaging device with respect to each electronic component, a second offset between the electronic component and the fidicual marker; and effecting alignment between each electronic component and the testing device in accordance with the first and second offsets.

2 . The method according to claim 1 , wherein the fiducial marker is a visible reference marker placed between the stationary imaging device and the moveable imaging device.

3 . The method according to claim 1 , wherein the moveable imaging device is coupled to a rotary device.

4 . The method according to claim 3 , further comprising the step of conveying the moveable imaging device by the rotary device to each of the at least one testing device for determining the first offset.

5 . The method according to claim 3 , wherein each of the moveable and stationary imaging devices is positioned along a same circumferential path of the rotary device.

6 . The method according to claim 1 , further comprising adjusting each electronic component in accordance with the first and second offsets to align the electronic component with the testing device receiving it for testing.

7 . The method according to claim 1 , further comprising adjusting each testing device in accordance with the first and second offsets to align the testing device with the electronic component receivable by the testing device for testing.

8 . The method according to claim 7 , further comprising the step of fixedly holding the electronic component while the testing device is being adjusted.

9 . An apparatus for testing electronic components, the apparatus comprising:
a rotary device; a plurality of pick heads arranged circumferentially around the rotary device, each pick head being configured for holding an electronic component; at least one testing device for receiving the electronic components for testing; a moveable imaging device coupled to the rotary device; a stationary imaging device which the moveable imaging device is positionable relative to such that a fiducial marker is definable within a field of view of the moveable imaging device and within a field of view of the stationary imaging device; and an adjustment device for effecting alignment between each electronic component and the testing device receiving it in accordance with a first offset and a second offset, wherein the first offset is determined by the moveable imaging device with respect to each of the at least one testing device, the first offset being between the testing device and the fiducial marker; and wherein the second offset is determined by the stationary imaging device with respect to each electronic component, the second offset being between the electronic component and the fiducial marker.

10 . The apparatus according to claim 9 , further comprising a visible reference marker placed between the stationary imaging device and the moveable imaging device.

11 . The apparatus according to claim 9 , wherein each of the moveable and stationary imaging devices is positioned along a same circumferential path of the rotary device.

12 . The apparatus according to claim 11 , wherein the moveable imaging device is conveyable by the rotary device to each of the at least one testing device for determining the first offset.

13 . The apparatus according to claim 9 , wherein the adjustment device is configured for adjusting each electronic component in accordance with the first and second offsets to align the electronic component with the testing device receiving it for testing.

14 . The apparatus according to claim 9 , wherein the adjustment device is configured for adjusting each testing device in accordance with the first and second offsets to align the testing device with the electronic component receivable by the testing device for testing.

15 . The apparatus according to claim 14 , further comprising a holding device separate from the adjustment device, the holding device being configured for fixedly holding the electronic component while the testing device is being adjusted by the adjustment device.

Assignees

• Asm Tech Singapore Pte Ltd

Inventors

• Cheng Chi Wah
• Leung Chi Hung
• Cheung Yu Sze
• Lau Kai Fung

Classifications

• G01B11/272

  using photoelectric detection means · CPC title

• G01R31/2808 Primary

  Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards (probe, multiprobe, probe manipulator or probe fixture G01R1/067) · CPC title

• G01R31/2891 Primary

  related to sensing or controlling of force, position, temperature (G01R31/2874 takes precedence; sensing of force G01L; sensing of position G01B, G01D; sensing of temperature G01K; controlling in general G05) · CPC title

• G01B11/26

  for measuring angles or tapers; for testing the alignment of axes · CPC title