Semiconductor device including threshold voltage measurement circuitry
US-10107854-B2 · Oct 23, 2018 · US
US10884185B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-10884185-B2 |
| Application number | US-201916380111-A |
| Country | US |
| Kind code | B2 |
| Filing date | Apr 10, 2019 |
| Priority date | Apr 12, 2018 |
| Publication date | Jan 5, 2021 |
| Grant date | Jan 5, 2021 |
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A semiconductor device may include a substrate having waveguides thereon, and a superlattice overlying the substrate and waveguides. The superlattice may include stacked groups of layers, with each group of layers comprising a stacked base semiconductor monolayers defining a base semiconductor portion, and at least one non-semiconductor monolayer constrained within a crystal lattice of adjacent base semiconductor portions. The semiconductor device may further include an active device layer on the superlattice including at least one active semiconductor device.
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That which is claimed is: 1. A semiconductor device comprising: a substrate having a plurality of waveguides thereon; a superlattice overlying the substrate and waveguides, the superlattice comprising a plurality of stacked groups of layers, each group of layers comprising a plurality of stacked base semiconductor monolayers defining a base semiconductor portion, and at least one non-semiconductor monolayer constrained within a crystal lattice of adjacent base semiconductor portions; and an active device layer on the superlattice comprising at least one active semiconductor device. 2. The semiconductor device of claim 1 wherein the substrate comprises a semiconductor-on-insulator (SOI) substrate. 3. The semiconductor device of claim 1 further comprising a plurality of optical modulator regions within the superlattice. 4. The semiconductor device of claim 3 further comprising vias extending through the active device layer to the optical modulator regions. 5. The semiconductor device of claim 3 wherein the optical modulator regions comprise a dopant. 6. The semiconductor device of claim 1 wherein the at least one active optical device comprises at least one metal oxide semiconductor field effect transistor (MOSFET). 7. The semiconductor device of claim 1 wherein the base semiconductor monolayers comprise silicon. 8. The semiconductor device of claim 1 wherein the at least one non-semiconductor monolayer comprises oxygen. 9. A semiconductor device comprising: a semiconductor-on-insulator (SOI) substrate having a plurality of waveguides thereon; a superlattice overlying the SOI substrate and waveguides, the superlattice comprising a plurality of stacked groups of layers, each group of layers comprising a plurality of stacked base semiconductor monolayers defining a base semiconductor portion, and at least one non-semiconductor monolayer constrained within a crystal lattice of adjacent base semiconductor portions; a plurality of optical modulator regions within the superlattice; and an active device layer on the superlattice comprising at least one active semiconductor device. 10. The semiconductor device of claim 9 further comprising vias extending through the active device layer to the optical modulator regions. 11. The semiconductor device of claim 9 wherein the optical modulator regions comprise a dopant. 12. The semiconductor device of claim 9 wherein the at least one active optical device comprises at least one metal oxide semiconductor field effect transistor (MOSFET). 13. The semiconductor device of claim 9 wherein the base semiconductor monolayers comprise silicon. 14. The semiconductor device of claim 9 wherein the at least one non-semiconductor monolayer comprises oxygen. 15. A semiconductor device comprising: a substrate having a plurality of waveguides thereon; a superlattice overlying the substrate and waveguides, the superlattice comprising a plurality of stacked groups of layers, each group of layers comprising a plurality of stacked base silicon monolayers defining a base silicon portion, and at least one oxygen monolayer constrained within a crystal lattice of adjacent base silicon portions; and an active device layer on the superlattice comprising at least one active semiconductor device. 16. The semiconductor device of claim 15 wherein the substrate comprises a semiconductor-on-insulator (SOI) substrate. 17. The semiconductor device of claim 15 further comprising a plurality of optical modulator regions within the superlattice. 18. The semiconductor device of claim 17 further comprising vias extending through the active device layer to the optical modulator regions. 19. The semiconductor device of claim 17 wherein the optical modulator regions comprise a dopant. 20. The semiconductor device of claim 15 wherein the at least one active optical device comprises at least one metal oxide semiconductor field effect transistor (MOSFET).
Alternating layers, e.g. superlattice · CPC title
Vias, e.g. via plugs · CPC title
Integrated devices comprising both bulk components and either SOI or SOS components on the same substrate · CPC title
having quantum effects only in the vertical direction, i.e. layered structures having quantum effects solely resulting from vertical potential variation · CPC title
having quantum effect structures or superlattices, e.g. tunnel junctions · CPC title
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