Die ring sequencer device and method thereof
US-2026023111-A1 · Jan 22, 2026 · US
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Werhane Kevin G patents
Werhane Kevin G is listed as an inventor on 35 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Werhane Kevin G |
| Total patents | 35 |
| First publication | Dec 20, 2018 |
| Latest publication | Jan 22, 2026 |
Notable patents
Publications ranked by popularity score, then publication date.
Radiation monitoring using accumulated parity of non-protected latches
US-2025336464-A1 · Oct 30, 2025 · US
Apparatus with calibration input mechanism and methods for operating the same
US-2025284435-A1 · Sep 11, 2025 · US
Apparatuses and methods including dice latches in a semiconductor device
US-12394456-B2 · Aug 19, 2025 · US
Apparatus with calibration input mechanism and methods for operating the same
US-12333191-B2 · Jun 17, 2025 · US
Apparatuses, systems, and methods for error correction
US-2025021435-A1 · Jan 16, 2025 · US
Test mode security circuit
US-12100476-B2 · Sep 24, 2024 · US
Systems and methods for testing redundant fuse latches in a memory device
US-12100467-B2 · Sep 24, 2024 · US
Apparatuses, systems, and methods for error correction
US-12079076-B2 · Sep 3, 2024 · US
Apparatus with calibration input mechanism and methods for operating the same
US-2024241671-A1 · Jul 18, 2024 · US
Recent patents
Latest publications not already listed above.
Asynchronous signal to command timing calibration for testing accuracy
US-11955160-B2 · Apr 9, 2024 · US
Test mode security circuit
US-2024087625-A1 · Mar 14, 2024 · US
Systems and methods for testing redundant fuse latches in a memory device
US-2024071560-A1 · Feb 29, 2024 · US
Asynchronous signal to command timing calibration for testing accuracy
US-2023420030-A1 · Dec 28, 2023 · US
Apparatuses and methods including dice latches in a semiconductor device
US-2023343376-A1 · Oct 26, 2023 · US
Apparatuses and methods including dice latches in a semiconductor device
US-11727967-B2 · Aug 15, 2023 · US
Apparatuses and methods including dice latches in a semiconductor device
US-2023223059-A1 · Jul 13, 2023 · US
Serial interfaces with shadow registers, and associated systems, devices, and methods
US-11675589-B2 · Jun 13, 2023 · US
Apparatuses and methods for fuse error detection
US-11645134-B2 · May 9, 2023 · US
Serial interfaces with shadow registers, and associated systems, devices, and methods
US-2023063588-A1 · Mar 2, 2023 · US
Interconnected command/address resources
US-11342042-B2 · May 24, 2022 · US
Apparatuses, systems, and methods for error correction
US-2022156148-A1 · May 19, 2022 · US
Apparatuses, systems, and methods for error correction
US-11263078-B2 · Mar 1, 2022 · US
Transmit line monitoring circuitry, and related methods, devices, and systems
US-11183260-B1 · Nov 23, 2021 · US
Interconnected command/address resources
US-2021304838-A1 · Sep 30, 2021 · US
Memory device random option inversion
US-11081166-B1 · Aug 3, 2021 · US
Segmented digital die ring
US-11054468-B2 · Jul 6, 2021 · US
Apparatuses, systems, and methods for error correction
US-2021200629-A1 · Jul 1, 2021 · US
Apparatuses and methods for fuse error detection
US-2021055981-A1 · Feb 25, 2021 · US
Memory read masking
US-10930327-B1 · Feb 23, 2021 · US
Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Micron Technology Inc | 34 |
| Lodestar Licensing Group Llc | 1 |
| Micron Technolgy Inc | 1 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| G11C29/42 | 6 |
| G11C11/4087 | 6 |
| G11C17/16 | 6 |
| G11C29/18 | 6 |
| H03K5/133 | 6 |