On-chip copy with data folding in three-dimensional non-volatile memory array
US-10635585-B2 · Apr 28, 2020 · US
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Raghu Deepak patents
Raghu Deepak is listed as an inventor on 51 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Raghu Deepak |
| Total patents | 51 |
| First publication | Jan 6, 2015 |
| Latest publication | Apr 28, 2020 |
Notable patents
Publications ranked by popularity score, then publication date.
On-Chip Copy with Data Folding in Three-Dimensional Non-Volatile Memory Array
US-2019354478-A1 · Nov 21, 2019 · US
Memory die temperature adjustment based on a power condition
US-10379754-B2 · Aug 13, 2019 · US
Methods and operations using XNOR functions with flash devices and solid state drives
US-10373696-B2 · Aug 6, 2019 · US
Methods and operations using xnor functions with flash devices and solid state drives
US-2019057750-A1 · Feb 21, 2019 · US
Memory system with a weighted read retry table
US-10102920-B2 · Oct 16, 2018 · US
Adaptive hard and soft bit decoding
US-10025661-B1 · Jul 17, 2018 · US
Non-volatile memory with read disturb detection for open blocks
US-10026488-B2 · Jul 17, 2018 · US
Adaptive Hard And Soft Bit Decoding
US-2018181462-A1 · Jun 28, 2018 · US
Adaptive temperature and memory parameter throttling
US-10007311-B2 · Jun 26, 2018 · US
Recent patents
Latest publications not already listed above.
Memory die temperature adjustment based on a power condition
US-2018143772-A1 · May 24, 2018 · US
Non-volatile memory with read disturb detection for open blocks
US-2018053562-A1 · Feb 22, 2018 · US
Memory system with a weighted read retry table
US-2018046527-A1 · Feb 15, 2018 · US
Adaptive temperature and memory parameter throttling
US-2018046231-A1 · Feb 15, 2018 · US
Memory die temperature adjustment based on a power condition
US-9880752-B2 · Jan 30, 2018 · US
Systems and methods for sampling data at a non-volatile memory system
US-9785357-B2 · Oct 10, 2017 · US
Proxy wordline stress for read disturb detection
US-9741444-B2 · Aug 22, 2017 · US
Proxy wordline stress for read disturb detection
US-2017213599-A1 · Jul 27, 2017 · US
Non-volatile storage system with self-test for read performance enhancement feature setup
US-9679661-B1 · Jun 13, 2017 · US
Proxy wordline stress for read disturb detection
US-9646709-B2 · May 9, 2017 · US
Accelerated physical secure erase
US-9633738-B1 · Apr 25, 2017 · US
Systems and Methods for Sampling Data at a Non-Volatile Memory System
US-2017109040-A1 · Apr 20, 2017 · US
Memory die temperature adjustment based on a power condition
US-2017090784-A1 · Mar 30, 2017 · US
Proxy wordline stress for read disturb detection
US-2017076811-A1 · Mar 16, 2017 · US
Read scrub with adaptive counter management
US-9552171-B2 · Jan 24, 2017 · US
Read Scrub with Adaptive Counter Management
US-2016124679-A1 · May 5, 2016 · US
Zoned erase verify in three dimensional nonvolatile memory
US-9312026-B2 · Apr 12, 2016 · US
Zoned Erase Verify in Three Dimensional Nonvolatile Memory
US-2016055918-A1 · Feb 25, 2016 · US
Back gate operation with elevated threshold voltage
US-9240238-B2 · Jan 19, 2016 · US
Techniques for detection and treating memory hole to local interconnect marginality defects
US-9224502-B1 · Dec 29, 2015 · US
Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Sandisk Technologies Inc | 32 |
| Sandisk Technologies Llc | 16 |
| Western Digital Tech Inc | 7 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| G11C16/0483 | 29 |
| G11C16/26 | 24 |
| G11C16/10 | 18 |
| G11C11/5642 | 17 |
| G11C29/52 | 12 |