Method for calculating film thickness of grain boundary oxide layer, method for determining plating properties, method for manufacturing plated steel sheet, and film thickness calculation device
US-2025164422-A1 · May 22, 2025 · US
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Hayashi Kazushi patents
Hayashi Kazushi is listed as an inventor on 20 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Hayashi Kazushi |
| Total patents | 20 |
| First publication | Dec 10, 2015 |
| Latest publication | May 22, 2025 |
Notable patents
Publications ranked by popularity score, then publication date.
Cyclic azine compound, material for organic light emitting diode, electron transport material for organic light emitting diode, and organic light emitting diode
US-2022274952-A1 · Sep 1, 2022 · US
Method for evaluating quality of oxide semiconductor thin film, method for managing quality of oxide semiconductor thin film, and device for manufacturing semiconductor using said method for managing quality
US-10475711-B2 · Nov 12, 2019 · US
Method for evaluating quality of oxide semiconductor thin film, method for managing quality of oxide semiconductor thin film, and device for manufacturing semiconductor using said method for managing quality
US-2019122941-A1 · Apr 25, 2019 · US
Quality evaluation method for laminate having protective layer on surface of oxide semiconductor thin film and quality control method for oxide semiconductor thin film
US-10203367-B2 · Feb 12, 2019 · US
Evaluation method for oxide semiconductor thin film, quality control method for oxide semiconductor thin film, and evaluation element and evaluation device used in the evaluation method
US-10090208-B2 · Oct 2, 2018 · US
Negative electrode for iron-air secondary battery, iron-air secondary battery, and production method of negative electrode for iron-air secondary battery
US-2018219220-A1 · Aug 2, 2018 · US
Method for evaluating oxide semiconductor thin film, method for managing quality of oxide semiconductor thin film, and evaluation element and evaluation device used in above evaluation method
US-9816944-B2 · Nov 14, 2017 · US
Method for evaluating quality of oxide semiconductor thin film and laminated body having protective film on surface of oxide semiconductor thin film, and method for managing quality of oxide semiconductor thin film
US-9780005-B2 · Oct 3, 2017 · US
Quality evaluation method for laminate having protective layer on surface of oxide semiconductor thin film and quality control method for oxide semiconductor thin film
US-2017184660-A1 · Jun 29, 2017 · US
Recent patents
Latest publications not already listed above.
Oxide for semiconductor layer of thin film transistor, thin film transistor and display device
US-9583633-B2 · Feb 28, 2017 · US
Method for evaluating oxide semiconductor thin film, method for managing quality of oxide semiconductor thin film, and evaluation element and evaluation device used in above evaluation method
US-2016282284-A1 · Sep 29, 2016 · US
Evaluation device for oxide semiconductor thin film
US-2016223462-A1 · Aug 4, 2016 · US
Oxide for semiconductor layer of thin film transistor, thin film transistor and display device
US-2016211384-A1 · Jul 21, 2016 · US
Method for evaluating oxide semiconductor thin film, and method for quality control of oxide semiconductor thin film
US-9316589-B2 · Apr 19, 2016 · US
Apparatus and method for measuring semiconductor carrier lifetime
US-9279762-B2 · Mar 8, 2016 · US
Evaluation method for oxide semiconductor thin film, quality control method for oxide semiconductor thin film, and evaluation element and evaluation device used in the evaluation method
US-2015371906-A1 · Dec 24, 2015 · US
Oxide for semiconductor layer of thin film transistor, thin film transistor, and display device
US-2015364553-A1 · Dec 17, 2015 · US
Oxide for semiconductor layer of thin film transistor, thin film transistor, and display device
US-2015357474-A1 · Dec 10, 2015 · US
Method for evaluating oxide semiconductor thin film, and method for quality control of oxide semiconductor thin film
US-2015355095-A1 · Dec 10, 2015 · US
Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Kobe Steel Ltd | 18 |
| Samsung Display Co Ltd | 2 |
| Hayashi Kazushi | 1 |
| Takamatsu Hiroyuki | 1 |
| Fukumoto Yoshito | 1 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| H10D30/6755 | 12 |
| H10P74/203 | 12 |
| H10D99/00 | 11 |
| H01L22/12 | 9 |
| H10D30/6756 | 8 |