Wafer bath imaging
US-2026073508-A1 · Mar 12, 2026 · US
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Estrella Joel patents
Estrella Joel is listed as an inventor on 20 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Estrella Joel |
| Total patents | 20 |
| First publication | Nov 29, 2018 |
| Latest publication | Mar 12, 2026 |
Notable patents
Publications ranked by popularity score, then publication date.
Wafer bath imaging
US-12488452-B2 · Dec 2, 2025 · US
Apparatus and method for detecting and monitoring objects in a fluid bath and adjusting the fluid bath based on the measured object properties
US-2025308960-A1 · Oct 2, 2025 · US
Bath systems and methods thereof
US-2025196175-A1 · Jun 19, 2025 · US
Bath systems and methods thereof
US-12226796-B2 · Feb 18, 2025 · US
Bath Systems and Methods Thereof
US-2023356255-A1 · Nov 9, 2023 · US
Bath systems and methods thereof
US-11738363-B2 · Aug 29, 2023 · US
Systems and methods for spin process video analysis during substrate processing
US-11637031-B2 · Apr 25, 2023 · US
Wafer bath imaging
US-2022405902-A1 · Dec 22, 2022 · US
Bath Systems and Methods Thereof
US-2022388022-A1 · Dec 8, 2022 · US
Recent patents
Latest publications not already listed above.
Enhancement of yield of functional microelectronic devices
US-11435393-B2 · Sep 6, 2022 · US
Enhancement of yield of functional microelectronic devices
US-11346882-B2 · May 31, 2022 · US
Systems and methods for automated video analysis detection techniques for substrate process
US-11276157-B2 · Mar 15, 2022 · US
Systems and Methods for Automated Video Analysis Detection Techniques for Substrate Process
US-2021150697-A1 · May 20, 2021 · US
Systems and Methods for Spin Process Video Analysis During Substrate Processing
US-2021129166-A1 · May 6, 2021 · US
Systems and Methods for Spin Process Video Analysis During Substrate Processing
US-2021134637-A1 · May 6, 2021 · US
Amelioration of global wafer distortion based on determination of localized distortions of a semiconductor wafer
US-10622233-B2 · Apr 14, 2020 · US
Enhancement of yield of functional microelectronic devices
US-2019137565-A1 · May 9, 2019 · US
Enhancement of yield of functional microelectronic devices
US-2019139798-A1 · May 9, 2019 · US
Amelioration of global wafer distortion based on determination of localized distortions of a semiconductor wafer
US-2018342410-A1 · Nov 29, 2018 · US
Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Tokyo Electron Ltd | 20 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| H10P72/0604 | 14 |
| G06T2207/30148 | 11 |
| G06T7/0004 | 11 |
| H10P74/203 | 9 |
| H10P72/0426 | 8 |