System for generating a test pattern to detect and isolate stuck faults for an interface using transition coding
US-9852806-B2 · Dec 26, 2017 · US
by replacing auxiliary circuits, e.g. spare voltage generators, decoders or sense amplifiers, to be used instead of defective ones
by replacing auxiliary circuits, e.g. spare voltage generators, decoders or sense amplifiers, to be used instead of defective ones · Cooperative Patent Classification (CPC)
Computing, optics, measurement, and control technologies.
Related technology areas
Mapped technology topics for this CPC code.
| Metric | Value |
|---|---|
| CPC code | G11C29/702 |
| Official title | {by replacing auxiliary circuits, e.g. spare voltage generators, decoders or sense amplifiers, to be used instead of defective ones} |
| Display label | by replacing auxiliary circuits, e.g. spare voltage generators, decoders or sense amplifiers, to be used instead of defective ones |
| Total patents | 422 |
Filing trend
Year-over-year patent counts classified under this CPC code.
Filing activity over the last five years is declining.
| Year | Patents |
|---|---|
| 2015 | 23 |
| 2016 | 22 |
| 2017 | 24 |
| 2018 | 33 |
| 2019 | 35 |
| 2020 | 45 |
| 2021 | 51 |
| 2022 | 44 |
| 2023 | 41 |
| 2024 | 44 |
| 2025 | 36 |
| 2026 | 24 |
Representative patents
Representative publications under this CPC code from precomputed stats, or recent filings when stats are unavailable.
Semiconductor system including replacement storage unit
US-9842035-B2 · Dec 12, 2017 · US
Semicondutor memory device and memory system including the same
US-9824755-B2 · Nov 21, 2017 · US
Semiconductor memory devices, memory systems including the same and method of correcting errors in the same
US-9786387-B2 · Oct 10, 2017 · US
Three-dimensional integrated circuit
US-2017229381-A1 · Aug 10, 2017 · US
Semiconductor memory device and data storage device including the same
US-2017212816-A1 · Jul 27, 2017 · US
Assigning redundancy in encoding data onto crossbar memory arrays
US-2017199786-A1 · Jul 13, 2017 · US
System and Method of Transferring Data over Available Pins
US-2017133082-A1 · May 11, 2017 · US
Self-repair logic for stacked memory architecture
US-9646720-B2 · May 9, 2017 · US
Operating method of memory system
US-9620246-B2 · Apr 11, 2017 · US
Nonvolatile semiconductor memory device
US-9595311-B2 · Mar 14, 2017 · US
Fault-tolerance through silicon via interface and controlling method thereof
US-9588717-B2 · Mar 7, 2017 · US
Semiconductor apparatus, stack semiconductor apparatus, and test method of the stack semiconductor apparatus
US-2017059648-A1 · Mar 2, 2017 · US
Techniques to achieve area reduction through co-optimizing logic core blocks and memory redundancies
US-2017023863-A1 · Jan 26, 2017 · US
Test method for memory
US-9548138-B2 · Jan 17, 2017 · US
Semiconductor memory device
US-9472297-B2 · Oct 18, 2016 · US
Semiconductor memory device including repair circuit
US-9424953-B2 · Aug 23, 2016 · US
Integrated circuit having voltage mismatch reduction
US-9390816-B2 · Jul 12, 2016 · US
Semiconductor memory device
US-2016180947-A1 · Jun 23, 2016 · US
Operating method of memory system
US-2016179615-A1 · Jun 23, 2016 · US
Frequently asked questions
Answers are generated from the same data shown on this page.
- What is CPC G11C29/702?
- CPC G11C29/702 is the Cooperative Patent Classification code for “by replacing auxiliary circuits, e.g. spare voltage generators, decoders or sense amplifiers, to be used instead of defective ones.”
- How many patents are filed under CPC G11C29/702 (by replacing auxiliary circuits, e.g. spare voltage generators, decoders or sense amplifiers, to be used instead of defective ones)?
- Our database includes 422 publications tagged with this CPC code.
- Is patent activity under CPC G11C29/702 growing?
- Publication counts under this code: 44 in 2024 vs 36 in 2025 (latest complete years).