Sample container mounting member and sample container sealing method
US-10830791-B2 · Nov 10, 2020 · US
Sample handling devices or methods
Sample handling devices or methods · Cooperative Patent Classification (CPC)
Computing, optics, measurement, and control technologies.
Related technology areas
Mapped technology topics for this CPC code.
| Metric | Value |
|---|---|
| CPC code | G01Q30/20 |
| Official title | Sample handling devices or methods |
| Display label | Sample handling devices or methods |
| Total patents | 109 |
Filing trend
Year-over-year patent counts classified under this CPC code.
Filing activity over the last five years is stable.
| Year | Patents |
|---|---|
| 2015 | 11 |
| 2016 | 6 |
| 2017 | 12 |
| 2018 | 10 |
| 2019 | 11 |
| 2020 | 12 |
| 2021 | 11 |
| 2022 | 5 |
| 2023 | 13 |
| 2024 | 4 |
| 2025 | 13 |
| 2026 | 1 |
Representative patents
Representative publications under this CPC code from precomputed stats, or recent filings when stats are unavailable.
Surface Analyzer
US-2020319229-A1 · Oct 8, 2020 · US
Biosensor for the detection of a biological target, and method for manufacturing the same
US-10794932-B2 · Oct 6, 2020 · US
Method for determining the shape of a sample tip for atom probe tomography
US-10746759-B2 · Aug 18, 2020 · US
Method of preparing a sample for microstructure diagnostics, and sample for microstructure diagnostics
US-10734193-B2 · Aug 4, 2020 · US
Biosensor for the Detection of a Biological Target, and Method for Manufacturing the Same
US-2020225262-A1 · Jul 16, 2020 · US
Face-on, gas-assisted etching for plan-view lamellae preparation
US-2020126756-A1 · Apr 23, 2020 · US
Specimen preparation and inspection in a dual-beam charged particle microscope
US-10629409-B2 · Apr 21, 2020 · US
Face-on, gas-assisted etching for plan-view lamellae preparation
US-10546719-B2 · Jan 28, 2020 · US
Method and apparatus for transmission electron microscopy
US-10541108-B2 · Jan 21, 2020 · US
Peakforce photothermal-based detection of IR nanoabsorption
US-10520426-B2 · Dec 31, 2019 · US
Sample container mounting member and sample container sealing method
US-2019353680-A1 · Nov 21, 2019 · US
Non-local scanning probes for scanning probe microscopy
US-2019324055-A1 · Oct 24, 2019 · US
Scanning probe microscopy system for mapping nanostructures on a surface of a sample and metrology frame therefore
US-10451650-B2 · Oct 22, 2019 · US
Microscopy sample stage for gas hydrate tests and temperature and pressure controlling system of the stage
US-2019317125-A1 · Oct 17, 2019 · US
Method for determining the shape of a sample tip for atom probe tomography
US-2019277881-A1 · Sep 12, 2019 · US
Sample holder, fixing member and method for fixing sample
US-10354833-B2 · Jul 16, 2019 · US
Sample vessel retention structure for scanning probe microscope
US-2019212361-A1 · Jul 11, 2019 · US
Definably switchable magnetic holding device
US-10330698-B2 · Jun 25, 2019 · US
Specimen preparation and inspection in a dual-beam charged particle microscope
US-2019108971-A1 · Apr 11, 2019 · US
Frequently asked questions
Answers are generated from the same data shown on this page.
- What is CPC G01Q30/20?
- CPC G01Q30/20 is the Cooperative Patent Classification code for “Sample handling devices or methods.”
- How many patents are filed under CPC G01Q30/20 (Sample handling devices or methods)?
- Our database includes 109 publications tagged with this CPC code.
- Is patent activity under CPC G01Q30/20 growing?
- Publication counts under this code: 4 in 2024 vs 13 in 2025 (latest complete years).