Sample container mounting member and sample container sealing method

Patent metadata

Field	Value
Publication number	US-10830791-B2
Application number	US-201916297138-A
Country	US
Kind code	B2
Filing date	Mar 8, 2019
Priority date	May 18, 2018
Publication date	Nov 10, 2020
Grant date	Nov 10, 2020

Abstract

A holding member, a sample container, and a mounting member are used in a scanning probe microscope. The mounting member is made of an elastically deformable material such as a rubber material. The mounting member includes an annular main body. When the mounting member is mounted on the holding member and the sample container, the holding member is inserted into the sample container while the main body of the mounting member is elastically deformed along an outer circumferential surface of the sample container. One end of the mounting member is detached from the outer circumferential surface of the sample container, and brought into close contact with an outer circumferential surface of the holding member. When the holding member and the sample container are relatively moved, the main body of the mounting member is elastically deformed.

First claim

What is claimed is:

1. A scanning probe microscope, comprising:
a stage;
a tubular sample container having a bottom;
a holding member holding a cantilever brought close to a sample disposed in the tubular sample container; wherein a surface image of the sample is acquired by scanning the cantilever along a surface of the sample in a state where the holding member is inserted into the sample container, and
a sample container mounting member comprising an annular main body that is mounted while being elastically deformed along an outer circumferential surface of the sample container, the mounting member having the main body and a protrusion, wherein the protrusion mechanically contacts an outer circumferential surface of the holding member.

2. The scanning probe microscope according to claim 1 , wherein in the main body of the mounting member, a length of an inner circumference in a state where the main body is not elastically deformed is shorter than a length of the outer circumferential surface of the sample container, and is shorter than the outer circumferential surface of the holding member.

3. The scanning probe microscope of claim 1 , wherein the sample in the sample container is in a solution.

4. The scanning probe microscope of claim 3 , wherein the holding member is made of a transparent material.

5. The scanning probe microscope of claim 3 , wherein a portion of the tubular sample container is capable of being attracted by magnetic forces of a magnet in the scanning probe microscope.

6. The scanning probe microscope of claim 5 , wherein the protrusion of the mounting member protrudes outward from an outer circumferential surface at one end of the mounting member.

7. A method of analyzing a sample in a scanning probe microscope, comprising:
providing the scanning probe microscope of claim 1 ;
further providing a light irradiator, an optical system and a light receiving unit;
placing the sample container on the stage of the scanning probe microscope and moving the sample container relative to the holding member and cantilever such that a location of light on the light receiving unit is changed;
wherein the cantilever scans a surface of the sample and a light reflecting surface of the cantilever reflects light to different portions of the light receiving unit;
and wherein the mounting member elastically deforms when the stage and sample container move relative to the holding member and cantilever.

8. A method comprising:
providing a scanning probe microscope having a stage, a tubular sample container having a bottom and a sample disposed therein, a holding member holding a cantilever, and a sample container mounting member comprising an elastic annular main body and a protrusion;
a mounting step of mounting the mounting member such that the mounting member is elastically deformed along an outer circumferential surface of the sample container and inserting the holding member into the sample container such that the cantilever is brought close to the sample disposed in the sample container; and
a sealing step of, while the mounting member is elastically deformed along the outer circumferential surface of the sample container, detaching a one end of the mounting member having the protrusion from the outer circumferential surface of the sample container while the holding member is inserted into the sample container, and sealing the sample container by bringing the one end of the mounting member into close contact with an outer circumferential surface of the holding member such that the protrusion mechanically contacts the outer circumferential surface of the holding member; and
a scanning step of acquiring a surface image of the sample by scanning the cantilever along a surface of the sample in a state where the holding member is inserted into the sample container.

9. The method of claim 8 , wherein the sample in the sample container is in a solution and evaporation of the solution is prevented by the sealing step.

10. The method of claim 9 , wherein during the sealing step, a user grips the protrusion of the mounting member to allow upward force to act on the protrusion whereby the one end of the mounting member is detached from the outer circumferential surface of the sample container and mounted on the outer circumferential surface of the holding member.

Assignees

• Shimadzu Corp

Inventors

• Arai Hiroshi
• Kogure Akinori

Classifications

• G01Q30/14 Primary

  Liquid environment · CPC title

• G01Q30/20 Primary

  Sample handling devices or methods · CPC title

• G01Q30/18

  Means for protecting or isolating the interior of a sample chamber from external environmental conditions or influences, e.g. vibrations or electromagnetic fields · CPC title

• G01Q10/065

  Feedback mechanisms, i.e. wherein the signal for driving the probe is modified by a signal coming from the probe itself · CPC title