Sample holder, fixing member and method for fixing sample

Patent metadata

Field	Value
Publication number	US-10354833-B2
Application number	US-201815966537-A
Country	US
Kind code	B2
Filing date	Apr 30, 2018
Priority date	May 15, 2017
Publication date	Jul 16, 2019
Grant date	Jul 16, 2019

Abstract

A sample holder includes a sample container and a fixing member. The fixing member is inserted into the sample container in a state in which a sample is placed, and fixes the sample by sandwiching the sample between the fixing member and a bottom surface of the sample container. At this time, a peripheral edge portion of the fixing member is elastically deformed by being inserted into the sample container, and the fixing member sandwiches the sample by its elastic force. Therefore, even when the sample is placed in the sample container in the state of being immersed in a liquid, the sample can be held in a stable state by the fixing member.

First claim

The invention claimed is:

1. A sample holder used in a scanning probe microscope which performs measurement by relatively moving a probe along a surface of a sample, the sample holder comprising:
a sample container having an insertion hole, the sample being insertable into the sample container from the insertion hole; and
a fixing member which is inserted into the sample container from the insertion hole and fixes the sample by sandwiching the sample between the fixing member and an inner surface of the sample container,
wherein, when the fixing member is inserted into the sample container, a peripheral edge portion is elastically deformed, the fixing member holds the sample by an elastic force thereof, and an opening section for exposing the surface of the sandwiched sample is formed.

2. The sample holder according to claim 1 , wherein, by bending the peripheral edge portion of the fixing member, a spring plate section is formed, and by elastic deformation of the spring plate section, the fixing member sandwiches the sample by the elastic force.

3. The sample holder according to claim 2 , wherein a plurality of notches is formed in the peripheral edge portion of the fixing member, and a plurality of spring plate sections is formed by the plurality of notches.

4. A fixing member which is used in a scanning probe microscope which performs measurement by relatively moving a probe along a surface of a sample, the fixing member sandwiching and fixing the sample between the fixing member and an inner surface of a sample container, the fixing member comprising:
an opening section for exposing the surface of the sandwiched sample; and
a spring plate section formed by bending a peripheral edge portion.

5. The fixing member according to claim 4 , wherein a plurality of notches is formed in the peripheral edge portion, and a plurality of spring plate sections is formed by the plurality of notches.

6. A sample fixing method for fixing a sample in a scanning probe microscope which performs measurement by relatively moving a probe along a surface of the sample, the method comprising:
a sample installing step of installing the sample in a sample container having an insertion hole in a state of being immersed in a liquid;
a sample fixing step of inserting a fixing member into the interior of the sample container from the insertion hole to immerse the fixing member in the liquid, sandwiching and fixing the sample between the fixing member and an inner surface of the sample container, and exposing the surface of the sample from an opening section formed in the fixing member,
wherein in the sample fixing step, when the fixing member is inserted into the sample container, a peripheral edge portion of the fixing member is elastically deformed, and the sample is held by an elastic force.

Assignees

• Shimadzu Corp

Inventors

• Arai Hiroshi
• Kogure Akinori

Classifications

• G01Q30/20 Primary

  Sample handling devices or methods · CPC title

• H01J37/20 Primary

  Means for supporting or positioning the object or the material; Means for adjusting diaphragms or lenses associated with the support · CPC title

• G01Q30/14 Primary

  Liquid environment · CPC title

• G01Q60/00

  Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof · CPC title

• G02B21/34

  Microscope slides, e.g. mounting specimens on microscope slides · CPC title