Particle-induced x-ray emission (pixe) using hydrogen and multi-species focused ion beams
US-2024418660-A1 · Dec 19, 2024 · US
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Toth Milos patents
Toth Milos is listed as an inventor on 25 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Toth Milos |
| Total patents | 25 |
| First publication | Apr 9, 2015 |
| Latest publication | Dec 19, 2024 |
Notable patents
Publications ranked by popularity score, then publication date.
Particle-induced x-ray emission (PIXE) using hydrogen and multi-species focused ion beams
US-12061159-B2 · Aug 13, 2024 · US
Particle-induced x-ray emission (pixe) using hydrogen and multi-species focused ion beams
US-2023341341-A1 · Oct 26, 2023 · US
Nanofabrication using a new class of electron beam induced surface processing techniques
US-11377740-B2 · Jul 5, 2022 · US
Method and system for plasma assisted low vacuum charged-particle microscopy
US-11152189-B2 · Oct 19, 2021 · US
Method and system for plasma assisted low vacuum charged-particle microscopy
US-2021296086-A1 · Sep 23, 2021 · US
Method for alignment of a light beam to a charged particle beam
US-10777383-B2 · Sep 15, 2020 · US
Nanofabrication using a new class of electron beam induced surface processing techniques
US-2020190669-A1 · Jun 18, 2020 · US
Nanofabrication using a new class of electron beam induced surface processing techniques
US-10538844-B2 · Jan 21, 2020 · US
Attachment of nano-objects to beam-deposited structures
US-10501851-B2 · Dec 10, 2019 · US
Recent patents
Latest publications not already listed above.
Electron beam-induced etching
US-10304658-B2 · May 28, 2019 · US
Method for alignment of a light beam to a charged particle beam
US-2019013178-A1 · Jan 10, 2019 · US
Method of depositing material
US-9951417-B2 · Apr 24, 2018 · US
Attachment of nano-objects to beam-deposited structures
US-2017327951-A1 · Nov 16, 2017 · US
Localized, in-vacuum modification of small structures
US-9812286-B2 · Nov 7, 2017 · US
Charged particle beam processing using process gas and cooled surface
US-9799490-B2 · Oct 24, 2017 · US
Electron beam microscope with improved imaging gas and method of use
US-9633816-B2 · Apr 25, 2017 · US
Nanofabrication using a new class of electron beam induced surface processing techniques
US-2017073814-A1 · Mar 16, 2017 · US
Electron beam microscope with improved imaging gas and method of use
US-2016343537-A1 · Nov 24, 2016 · US
Charged particle beam processing using process gas and cooled surface
US-2016293380-A1 · Oct 6, 2016 · US
Localized, in-vacuum modification of small structures
US-2016189920-A1 · Jun 30, 2016 · US
Localized, in-vacuum modification of small structures
US-9255339-B2 · Feb 9, 2016 · US
Electron beam-induced etching
US-2016020068-A1 · Jan 21, 2016 · US
Electron beam-induced etching
US-9123506-B2 · Sep 1, 2015 · US
Method of depositing material
US-2015099071-A1 · Apr 9, 2015 · US
Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Fei Co | 25 |
| Botman Aurelien Philippe Jean Maclou | 1 |
| Toth Milos | 1 |
| Randolph Steven | 1 |
| Narum David H | 1 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| H01J37/28 | 14 |
| H01J2237/31732 | 9 |
| H01J37/18 | 7 |
| H01J37/3056 | 7 |
| H01J2237/2003 | 7 |