Atomic Force Microscope Based Infrared Spectroscopy With Multiple Laser Pulse Repetition Rate Excitation And Optional Force Volume Operation
US-2025290948-A1 · Sep 18, 2025 · US
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Su Chanmin patents
Su Chanmin is listed as an inventor on 66 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Su Chanmin |
| Total patents | 66 |
| First publication | Mar 5, 2015 |
| Latest publication | Sep 18, 2025 |
Notable patents
Publications ranked by popularity score, then publication date.
Probe-Based Instrument and Method Using Torsional Oscillation Sensing
US-2025277809-A1 · Sep 4, 2025 · US
Nano-Mechanical Infrared Spectroscopy System and Method Using Gated Peak Force IR
US-2024168053-A1 · May 23, 2024 · US
Torsion wing probe assembly
US-11555827-B2 · Jan 17, 2023 · US
Torsion Wing Probe Assembly
US-2022107339-A1 · Apr 7, 2022 · US
Device, and Method of Manufacture, for use in Mechanically Cleaning Nanoscale Debris from a Sample Surface
US-2021396784-A1 · Dec 23, 2021 · US
Torsion wing probe assembly
US-11119118-B2 · Sep 14, 2021 · US
Method and apparatus of operating a scanning probe microscope
US-11002757-B2 · May 11, 2021 · US
Infrared characterization of a sample using oscillating mode
US-10845382-B2 · Nov 24, 2020 · US
Method and Apparatus of Operating a Scanning Probe Microscope
US-2020191826-A1 · Jun 18, 2020 · US
Recent patents
Latest publications not already listed above.
Method and apparatus of using peak force tapping mode to measure physical properties of a sample
US-10663483-B2 · May 26, 2020 · US
Peakforce photothermal-based detection of IR nanoabsorption
US-10520426-B2 · Dec 31, 2019 · US
Method and apparatus of operating a scanning probe microscope
US-10502761-B2 · Dec 10, 2019 · US
Sample vessel retention structure for scanning probe microscope
US-2019212361-A1 · Jul 11, 2019 · US
Scanning probe microscopy utilizing separable components
US-10345337-B2 · Jul 9, 2019 · US
Method and apparatus of operating a scanning probe microscope
US-10197596-B2 · Feb 5, 2019 · US
Dual-probe scanning probe microscope
US-10197595-B2 · Feb 5, 2019 · US
Method and Apparatus of Using Peak Force Tapping Mode to Measure Physical Properties of a Sample
US-2019018040-A1 · Jan 17, 2019 · US
Sample vessel retention structure for scanning probe microscope
US-10175263-B2 · Jan 8, 2019 · US
Scanning probe microscopy utilizing separable components
US-2018299481-A1 · Oct 18, 2018 · US
Force Measurement with Real-Time Baseline Determination
US-2018299479-A1 · Oct 18, 2018 · US
Sample vessel retention structure for scanning probe microscope
US-2018188286-A1 · Jul 5, 2018 · US
Method and apparatus of using peak force tapping mode to measure physical properties of a sample
US-9995765-B2 · Jun 12, 2018 · US
Method and Apparatus of Operating a Scanning Probe Microscope
US-2018136251-A1 · May 17, 2018 · US
Peakforce Photothermal-Based Detection of IR Nanoabsorption
US-2018106715-A1 · Apr 19, 2018 · US
Chemical nano-identification of a sample using normalized near-field spectroscopy
US-9933453-B2 · Apr 3, 2018 · US
Force measurement with real-time baseline determination
US-9910064-B2 · Mar 6, 2018 · US
Chemical nano-identification of a sample using normalized near-field spectroscopy
US-2018059136-A1 · Mar 1, 2018 · US
Infrared Characterization of a Sample Using Oscillating Mode
US-2018052186-A1 · Feb 22, 2018 · US
Method and apparatus of electrical property measurement using an AFM operating in peak force tapping mode
US-9869694-B2 · Jan 16, 2018 · US
Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Bruker Nano Inc | 66 |
| Univ Lehigh | 3 |
| Andreev Gregory | 2 |
| Osechinskiy Sergey | 2 |
| Minne Stephen | 2 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| G01Q10/065 | 36 |
| G01Q60/32 | 35 |
| B82Y35/00 | 30 |
| G01Q20/02 | 29 |
| G01Q60/34 | 25 |