Defect detection using thermal laser stimulation and atomic force microscopy
US-2024069095-A1 · Feb 29, 2024 · US
by optical means
by optical means · Cooperative Patent Classification (CPC)
Computing, optics, measurement, and control technologies.
Related technology areas
Mapped technology topics for this CPC code.
| Metric | Value |
|---|---|
| CPC code | G01Q20/02 |
| Official title | by optical means |
| Display label | by optical means |
| Total patents | 228 |
Filing trend
Year-over-year patent counts classified under this CPC code.
Filing activity over the last five years is declining.
| Year | Patents |
|---|---|
| 2015 | 15 |
| 2016 | 20 |
| 2017 | 16 |
| 2018 | 28 |
| 2019 | 24 |
| 2020 | 26 |
| 2021 | 32 |
| 2022 | 23 |
| 2023 | 22 |
| 2024 | 8 |
| 2025 | 14 |
Representative patents
Representative publications under this CPC code from precomputed stats, or recent filings when stats are unavailable.
Filed-mapping and focal-spot tracking for s-SNOM
US-10161960-B1 · Dec 25, 2018 · US
Scanning probe microscopy utilizing separable components
US-2018299481-A1 · Oct 18, 2018 · US
Systems and methods for nano-tribological manufacturing of nanostructures
US-2018210007-A1 · Jul 26, 2018 · US
Photonic probe for atomic force microscopy
US-2018172728-A1 · Jun 21, 2018 · US
Scanning probe microscope
US-2018106832-A1 · Apr 19, 2018 · US
Chemical nano-identification of a sample using normalized near-field spectroscopy
US-9933453-B2 · Apr 3, 2018 · US
Atomic-force microscope system with integrated fabry-perot resonator
US-9869695-B1 · Jan 16, 2018 · US
Minute object characteristics measuring apparatus
US-9857216-B2 · Jan 2, 2018 · US
Chemical nano-identification of a sample using normalized near-field spectroscopy
US-9846178-B2 · Dec 19, 2017 · US
Optical cantilever based analysis
US-9835591-B2 · Dec 5, 2017 · US
Evaluation system and a method for evaluating a substrate
US-9835563-B2 · Dec 5, 2017 · US
Method and apparatus of operating a scanning probe microscope
US-9810713-B2 · Nov 7, 2017 · US
Scanning probe microscope and probe contact detection method
US-2017285067-A1 · Oct 5, 2017 · US
Actuator position calculation device, actuator position calculation method, and actuator position calculation program
US-9766267-B2 · Sep 19, 2017 · US
Method and Apparatus of Operating a Scanning Probe Microscope
US-2017242052-A1 · Aug 24, 2017 · US
Field-Mapping and Focal-Spot Tracking for S-SNOM
US-2017219621-A1 · Aug 3, 2017 · US
Automatic tuning of atomic force microscope
US-9678103-B2 · Jun 13, 2017 · US
Scanning probe microscope
US-9678104-B2 · Jun 13, 2017 · US
Measuring surface curvature
US-9677875-B2 · Jun 13, 2017 · US
Frequently asked questions
Answers are generated from the same data shown on this page.
- What is CPC G01Q20/02?
- CPC G01Q20/02 is the Cooperative Patent Classification code for “by optical means.”
- How many patents are filed under CPC G01Q20/02 (by optical means)?
- Our database includes 228 publications tagged with this CPC code.
- Is patent activity under CPC G01Q20/02 growing?
- Publication counts under this code: 8 in 2024 vs 14 in 2025 (latest complete years).