Structure estimation system and structure estimation program for estimating height of structure based on data from charged particle beam device
US-12561823-B2 · Feb 24, 2026 · US
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Fukuda Muneyuki patents
Fukuda Muneyuki is listed as an inventor on 65 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Fukuda Muneyuki |
| Total patents | 65 |
| First publication | Mar 19, 2015 |
| Latest publication | Feb 24, 2026 |
Notable patents
Publications ranked by popularity score, then publication date.
Charged particle beam device
US-12555737-B2 · Feb 17, 2026 · US
Charged particle beam apparatus
US-12525430-B2 · Jan 13, 2026 · US
Charged Particle Beam System and Sample Evaluation Information Generation Method
US-2025362255-A1 · Nov 27, 2025 · US
System for deriving electrical characteristics and non-transitory computer-readable medium
US-12394041-B2 · Aug 19, 2025 · US
Analysis System, Analysis Method, and Analysis Program
US-2025208076-A1 · Jun 26, 2025 · US
Analysis System, Analysis Method, and Analysis Program
US-2025189468-A1 · Jun 12, 2025 · US
Inspection Device and Inspection Method
US-2024280520-A1 · Aug 22, 2024 · US
Adjusting method of charged particle beam device and charged particle beam device system
US-12001521-B2 · Jun 4, 2024 · US
Image processing system
US-11852599-B2 · Dec 26, 2023 · US
Recent patents
Latest publications not already listed above.
Charged Particle Beam Device
US-2023290606-A1 · Sep 14, 2023 · US
Charged particle beam apparatus
US-11749494-B2 · Sep 5, 2023 · US
System for Deriving Electrical Characteristics and Non-Transitory Computer-Readable Medium
US-2023274417-A1 · Aug 31, 2023 · US
System for deriving electrical characteristics and non-transitory computer-readable medium
US-11694325-B2 · Jul 4, 2023 · US
Charged Particle Beam Apparatus
US-2023170182-A1 · Jun 1, 2023 · US
Charged particle beam apparatus
US-11646172-B2 · May 9, 2023 · US
Device defect detection method using a charged particle beam
US-11631568-B2 · Apr 18, 2023 · US
Charged particle beam device
US-11501950-B2 · Nov 15, 2022 · US
Charged particle beam apparatus
US-11398367-B2 · Jul 26, 2022 · US
Charged particle beam apparatus
US-11398366-B2 · Jul 26, 2022 · US
Charged particle beam device
US-11355308-B2 · Jun 7, 2022 · US
Charged particle beam apparatus
US-11335535-B2 · May 17, 2022 · US
Charged particle beam device
US-11328897-B2 · May 10, 2022 · US
Structure Estimation System and Structure Estimation Program
US-2022130027-A1 · Apr 28, 2022 · US
Device defect detection method using a charged particle beam
US-2022108866-A1 · Apr 7, 2022 · US
Charged particle beam apparatus
US-2022102109-A1 · Mar 31, 2022 · US
Charged particle beam apparatus
US-2022102108-A1 · Mar 31, 2022 · US
Image processing system
US-2022042936-A1 · Feb 10, 2022 · US
Method for determining irradiation conditions for charged particle beam device and charged particle beam device
US-11232929-B2 · Jan 25, 2022 · US
Charged particle beam apparatus
US-11211224-B2 · Dec 28, 2021 · US
Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Hitachi High Tech Corp | 65 |
| Fukuda Muneyuki | 3 |
| Ohashi Takeyoshi | 2 |
| Ishijima Tatsuaki | 1 |
| Nasu Osamu | 1 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| H01J37/28 | 51 |
| H01J37/244 | 29 |
| H01J2237/2817 | 24 |
| G01N23/2251 | 15 |
| H01J37/22 | 15 |