Transmission electron microscope with variable effective focal length
US-2025182997-A1 · Jun 5, 2025 · US
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Buijsse Bart patents
Buijsse Bart is listed as an inventor on 42 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Buijsse Bart |
| Total patents | 42 |
| First publication | Apr 14, 2015 |
| Latest publication | Jun 5, 2025 |
Notable patents
Publications ranked by popularity score, then publication date.
Methods and systems for determining the absolute structure of crystal
US-12306119-B2 · May 20, 2025 · US
Pole piece incorporating optical cavity for improved phase-contrast in electron microscope imaging
US-2024203685-A1 · Jun 20, 2024 · US
Method and system for generating a diffraction image
US-12009176-B2 · Jun 11, 2024 · US
Method and system to determine crystal structure
US-11988618-B2 · May 21, 2024 · US
Methods and systems for determining the absolute structure of crystal
US-2024077436-A1 · Mar 7, 2024 · US
Methods and systems for acquiring three-dimensional electron diffraction data
US-11815476-B2 · Nov 14, 2023 · US
Method and system for generating a diffraction image
US-2023298853-A1 · Sep 21, 2023 · US
Method and system for generating a diffraction image
US-11694874-B2 · Jul 4, 2023 · US
Method and system for generating a diffraction image
US-2023020957-A1 · Jan 19, 2023 · US
Recent patents
Latest publications not already listed above.
Method and system to determine crystal structure
US-2022317067-A1 · Oct 6, 2022 · US
Methods and systems for acquiring three-dimensional electron diffraction data
US-2022317066-A1 · Oct 6, 2022 · US
Methods and systems for acquiring 3D diffraction data
US-11456149-B2 · Sep 27, 2022 · US
Dual beam microscope system for imaging during sample processing
US-2021391145-A1 · Dec 16, 2021 · US
Dual beam microscope system for imaging during sample processing
US-11183364-B1 · Nov 23, 2021 · US
Methods and systems for acquiring 3d diffraction data
US-2021305010-A1 · Sep 30, 2021 · US
Laser-based phase plate image contrast manipulation
US-11101101-B2 · Aug 24, 2021 · US
Diffraction pattern detection in a transmission charged particle microscope
US-11004655-B2 · May 11, 2021 · US
Method and system for determining molecular structure
US-10935506-B2 · Mar 2, 2021 · US
Method and system for determining molecular structure
US-2020400594-A1 · Dec 24, 2020 · US
Laser-based phase plate image contrast manipulation
US-2020365366-A1 · Nov 19, 2020 · US
Diffraction pattern detection in a transmission charged particle microscope
US-10651008-B2 · May 12, 2020 · US
Diffraction pattern detection in a transmission charged particle microscope
US-2020144022-A1 · May 7, 2020 · US
X-ray imaging technique
US-10545100-B2 · Jan 28, 2020 · US
Diffraction Pattern Detection In A Transmission Charged Particle Microscope
US-2019057836-A1 · Feb 21, 2019 · US
Arrangement for X-Ray tomography
US-9958403-B1 · May 1, 2018 · US
Arrangement for x-ray tomography
US-2018100815-A1 · Apr 12, 2018 · US
Method of producing a freestanding thin film of nano-crystalline graphite
US-9908778-B2 · Mar 6, 2018 · US
User interface for an electron microscope
US-9865427-B2 · Jan 9, 2018 · US
Novel x-ray imaging technique
US-2017138870-A1 · May 18, 2017 · US
Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Fei Co | 42 |
| Max Planck Gesellschaft | 3 |
| Buijsse Bart | 2 |
| Kooijman Cornelis Sander | 2 |
| Van Leeuwen Hugo | 2 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| H01J37/28 | 20 |
| H01J37/26 | 16 |
| G01N23/20058 | 16 |
| G01N2223/0565 | 14 |
| H01J2237/2802 | 13 |