Method and apparatus for at-speed scan shift frequency test optimization
US-10746795-B2 · Aug 18, 2020 · US
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Berkovitz Asher patents
Berkovitz Asher is listed as an inventor on 26 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Berkovitz Asher |
| Total patents | 26 |
| First publication | May 19, 2015 |
| Latest publication | Aug 18, 2020 |
Notable patents
Publications ranked by popularity score, then publication date.
Method and apparatus for validating a test pattern
US-10102329-B2 · Oct 16, 2018 · US
Method and apparatus for calculating delay timing values for an integrated circuit design
US-9977849-B2 · May 22, 2018 · US
Scan test system with a test interface having a clock control unit for stretching a power shift cycle
US-9903916-B2 · Feb 27, 2018 · US
Method of simulating a semiconductor integrated circuit, computer program product, and device for simulating a semiconductor integrated circuit
US-9836567-B2 · Dec 5, 2017 · US
Integrated circuit hierarchical design tool apparatus and method of hierarchically designing an integrated circuit
US-9792399-B2 · Oct 17, 2017 · US
Method and control device for launch-off-shift at-speed scan testing
US-9709629-B2 · Jul 18, 2017 · US
Method and apparatus for performing logic synthesis
US-9652572-B2 · May 16, 2017 · US
Method and apparatus for calculating delay timing values for an integrated circuit design
US-9607117-B2 · Mar 28, 2017 · US
Method and apparatus for selecting data path elements for cloning
US-9542523-B2 · Jan 10, 2017 · US
Recent patents
Latest publications not already listed above.
Integrated circuit including overlapping scan domains
US-2016377676-A1 · Dec 29, 2016 · US
Method and apparatus for validating a test pattern
US-2016314240-A1 · Oct 27, 2016 · US
Apparatus for and a method of making a hierarchical integrated circuit design of an integrated circuit design, a computer program product and a non-transitory tangible computer readable storage medium
US-9235673-B2 · Jan 12, 2016 · US
Method and apparatus for calculating delay timing values for an integrated circuit design
US-2015347653-A1 · Dec 3, 2015 · US
Apparatus for and a method of making a hierarchical integrated circuit design of an integrated circuit design, a computer program product and a non-transitory tangible computer readable storage medium
US-2015347655-A1 · Dec 3, 2015 · US
Method and apparatus for performing logic synthesis
US-2015339413-A1 · Nov 26, 2015 · US
Integrated circuit hierarchical design tool apparatus and method of hierarchically designing an integrated circuit
US-2015339427-A1 · Nov 26, 2015 · US
Method and control device for launch-off-shift at-speed scan testing
US-2015338460-A1 · Nov 26, 2015 · US
Method and apparatus for calculating delay timing values for an integrated circuit design
US-2015310152-A1 · Oct 29, 2015 · US
Method for ranking paths for power optimization of an integrated circuit design and corresponding computer program product
US-9171117-B2 · Oct 27, 2015 · US
Method and apparatus for at-speed scan shift frequency test optimization
US-2015276869-A1 · Oct 1, 2015 · US
Method for placing operational cells in a semiconductor device
US-9141753-B2 · Sep 22, 2015 · US
Scan test system
US-2015247899-A1 · Sep 3, 2015 · US
Method of simulating a semiconductor integrated circuit, computer program product, and device for simulating a semiconductor integrated circuit
US-2015242544-A1 · Aug 27, 2015 · US
Method and apparatus for selecting data path elements for cloning
US-2015199468-A1 · Jul 16, 2015 · US
Method and apparatus for generating gate-level activity data for use in clock gating efficiency analysis
US-9038006-B2 · May 19, 2015 · US
Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Berkovitz Asher | 20 |
| Freescale Semiconductor Inc | 17 |
| Priel Michael | 15 |
| Sofer Sergey | 9 |
| Nxp Usa Inc | 9 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| G06F30/398 | 14 |
| G06F17/5081 | 12 |
| G06F30/3312 | 8 |
| G06F2119/12 | 7 |
| G01R31/318575 | 6 |