Method and apparatus for calculating delay timing values for an integrated circuit design

US9607117B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9607117-B2
Application numberUS-201314650319-A
CountryUS
Kind codeB2
Filing dateJan 8, 2013
Priority dateJan 8, 2013
Publication dateMar 28, 2017
Grant dateMar 28, 2017

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

A method of calculating at least one delay timing value for at least one setup timing stage within an integrated circuit design includes applying Negative/Positive Bias Temperature Instability (N/PBTI) compensation margins to delay values for elements within the at least one setup timing stage, and calculating the at least one delay timing value for the at least one setup timing stage based at least partly on the N/PBTI compensation margins applied to the delay values. The method further includes identifying at least partially equivalent elements within the parallel timing paths of the at least one setup timing stage, and applying reduced N/PBTI compensation margins to delay values for the identified at least partially equivalent elements within parallel timing paths of the at least one setup timing stage.

First claim

Opening claim text (preview).

The invention claimed is: 1. A method of calculating at least one delay timing value for at least one setup timing stage within an integrated circuit design, the method comprising: applying Negative/Positive Bias Temperature Instability (N/PBTI) compensation margins to delay values for elements within the at least one setup timing stage; and calculating the at least one delay timing value for the at least one setup timing stage based at least partly on the N/PBTI compensation margins applied to the delay values; identifying at least partially equivalent elements within parallel timing paths of the at least one setup timing stage; and applying reduced N/PBTI compensation margins to the delay values for the identified at least partially equivalent elements within the parallel timing paths of the at least one setup timing stage. 2. The method of claim 1 , wherein the method further comprises: applying default N/PBTI compensation margins to delay values for elements within the at least one setup timing stage; identifying at least partially equivalent elements within parallel timing paths of the at least one setup timing stage; and reducing the default N/PBTI compensation margins applied to the identified at least partially equivalent elements within parallel timing paths of the at least one setup timing stage. 3. The method of claim 1 , wherein the method further comprises: applying default N/PBTI compensation margins to delay values for elements within the at least one setup timing stage; calculating at least one delay timing value for the at least one setup timing stage based at least partly on the delay values to which the default N/PBTI compensation margins have been applied; determining whether timing constraints have been met based on the at least one delay timing value calculated using the delay values to which the default N/PBTI compensation margins have been applied; and if at least one timing constraint has not been met: identifying at least partially equivalent elements within parallel timing paths of the at least one setup timing stage; reducing the default N/PBTI compensation margins applied to delay values for the identified at least partially equivalent elements within the parallel timing paths of the at least one setup timing stage; and recalculating the at least one delay timing value for the at least one setup timing stage based at least partly on the delay values to which the reduced N/PBTI compensation margins have been applied. 4. The method of claim 1 , wherein the method comprises applying no N/PBTI compensation margin to the delay values for the identified equivalent elements within the parallel timing paths of the at least one setup timing stage. 5. The method of claim 1 , wherein the method comprises applying partially reduced N/PBTI compensation margins to the delay values for the identified partially equivalent elements within the parallel timing paths of the at least one setup timing stage. 6. A method of performing static timing analysis of at least a part of an integrated circuit design, the method comprising calculating at least one delay timing value for at least one setup timing stage within the integrated circuit design in accordance with claim 1 . 7. An apparatus comprising at least one signal processing module arranged to calculate at least one delay timing value for at least one setup timing stage within an integrated circuit design, the at least one signal processing module being arranged to: apply Negative/Positive Bias Temperature Instability (N/PBTI) compensation margins to delay values for elements within the at least one setup timing stage; calculate the at least one delay timing value for the at least one setup timing stage based at least partly on the N/PBTI compensation margins applied to the delay values; identify at least partially equivalent elements within parallel timing paths of the at least one setup timing stage; and apply reduced N/PBTI compensation margins to the delay values of the identified at least partially equivalent elements within the parallel timing paths of the at least one setup timing stage. 8. The apparatus of claim 7 , wherein the at least one signal processing module is arranged to calculate at least one delay timing value for at least one setup timing stage within an integrated circuit design as part of performing static timing analysis of the at least one setup timing stage of the integrated circuit design. 9. An article of manufacture including at least one non-transitory, tangible machine readable storage medium containing instructions that, when executed by a machine, cause the machine to calculate at least one delay timing value for at least one setup timing stage within an integrated circuit design, the instructions comprising: applying Negative/Positive Bias Temperature Instability (N/PBTI) compensation margins to delay values for elements within the at least one setup timing stage; and calculating the at least one delay timing value for the at least one setup timing stage based at least partly on the N/PBTI compensation margins applied to the delay values; identifying at least partially equivalent elements within parallel timing paths of the at least one setup timing stage; and applying reduced N/PBTI compensation margins to the delay values for the identified at least partially equivalent elements within the parallel timing paths of the at least one setup timing stage. 10. The article of claim 9 , wherein the instructions further comprise: applying default N/PBTI compensation margins to delay values for elements within the at least one setup timing stage; identifying at least partially equivalent elements within parallel timing paths of the at least one setup timing stage; and reducing the default N/PBTI compensation margins applied to the identified at least partially equivalent elements within parallel timing paths of the at least one setup timing stage. 11. The article of claim 9 , wherein the instructions further comprise: applying default N/PBTI compensation margins to delay values for elements within the at least one setup timing stage; calculating at least one delay timing value for the at least one setup timing stage based at least partly on the delay values to which the default N/PBTI compensation margins have been applied; determining whether timing constraints have been met based on the at least one delay timing value calculated using the delay values to which the default N/PBTI compensation margins have been applied; and if at least one timing constraint has not been met: identifying at least partially equivalent elements within parallel timing paths of the at least one setup timing stage; reducing the default N/PBTI compensation margins applied to delay values for the identified at least partially equivalent elements within the parallel timing paths of the at least one setup timing stage; and recalculating the at least one delay timing value for the at least one setup timing stage based at least partly on the delay values to which the reduced N/PBTI compensation margins have been applied. 12. The article of claim 9 , wherein the instructions further comprise: applying no N/PBTI compensation margin to the delay values for the identified equivalent elements within the parallel timing paths of the at least one setup timing stage. 13. The article of claim 9 , wherein the instructions further comprise: applying partially reduced N/PBTI compensation margins to the delay values for the identified partially equivalent elements within the parallel timing paths of the at least one setup timing stage.

Assignees

Inventors

Classifications

  • Timing analysis · CPC title

  • Timing analysis or timing optimisation · CPC title

  • Delay-insensitive circuit design, e.g. asynchronous or self-timed · CPC title

  • Design verification or optimisation, e.g. using design rule check [DRC], layout versus schematics [LVS] or finite element methods [FEM] (optical proximity correction [OPC] design processes G03F1/36) · CPC title

  • H03K3/0375Primary

    provided with means for increasing reliability; for protection; for ensuring a predetermined initial state when the supply voltage has been applied; for storing the actual state when the supply voltage fails (digital storage cells each combining volatile and non-volatile storage properties G11C14/00) · CPC title

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What does patent US9607117B2 cover?
A method of calculating at least one delay timing value for at least one setup timing stage within an integrated circuit design includes applying Negative/Positive Bias Temperature Instability (N/PBTI) compensation margins to delay values for elements within the at least one setup timing stage, and calculating the at least one delay timing value for the at least one setup timing stage based at …
Who is the assignee on this patent?
Berkovitz Asher, Priel Michael, Sofer Sergey, and 1 more
What technology area does this patent fall under?
Primary CPC classification G06F30/3312. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Mar 28 2017 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 1 related publication on this page (citations in our corpus or others sharing the same primary CPC).