Cathodoluminescence detector including inner and outer tubes sealed from a vacuum chamber of an associated particle beam system
US-10157726-B2 · Dec 18, 2018 · US
Moving components not otherwise provided for
Moving components not otherwise provided for · Cooperative Patent Classification (CPC)
Electric circuits, power, telecommunications, and semiconductors.
Related technology areas
Mapped technology topics for this CPC code.
| Metric | Value |
|---|---|
| CPC code | H01J2237/024 |
| Official title | Moving components not otherwise provided for |
| Display label | Moving components not otherwise provided for |
| Total patents | 205 |
Filing trend
Year-over-year patent counts classified under this CPC code.
Filing activity over the last five years is growing.
| Year | Patents |
|---|---|
| 2015 | 11 |
| 2016 | 11 |
| 2017 | 15 |
| 2018 | 24 |
| 2019 | 24 |
| 2020 | 24 |
| 2021 | 16 |
| 2022 | 11 |
| 2023 | 26 |
| 2024 | 15 |
| 2025 | 20 |
| 2026 | 8 |
Representative patents
Representative publications under this CPC code from precomputed stats, or recent filings when stats are unavailable.
Substrate treating apparatus
US-2018358211-A1 · Dec 13, 2018 · US
Multi-Column Scanning Electron Microscopy System
US-2018358200-A1 · Dec 13, 2018 · US
Multi charged particle beam drawing apparatus and multi charged particle beam drawing method
US-2018350552-A1 · Dec 6, 2018 · US
Enclosure for a target processing machine
US-10144134-B2 · Dec 4, 2018 · US
RF ion source with dynamic volume control
US-10134568-B2 · Nov 20, 2018 · US
Electron microscope electron gun for facilitating position adjustment and electron microscope including same
US-10128077-B2 · Nov 13, 2018 · US
Object preparation device and particle beam device with an object preparation device and methods of operating the particle beam device
US-2018286632-A1 · Oct 4, 2018 · US
Scanning Electron Microscope
US-2018261422-A1 · Sep 13, 2018 · US
Multi mode systems with retractable detectors
US-10074513-B2 · Sep 11, 2018 · US
Apparatus and method for improved ion beam current
US-10074514-B1 · Sep 11, 2018 · US
Electron Source Architecture for a Scanning Electron Microscopy System
US-2018240640-A1 · Aug 23, 2018 · US
Electron microscope electron gun for facilitating position adjustment and electron microscope including same
US-2018218874-A1 · Aug 2, 2018 · US
Imaging device for imaging an object and for imaging a structural unit in a particle beam apparatus
US-2018218877-A1 · Aug 2, 2018 · US
Enhanced FIB-SEM Systems for Large-Volume 3D Imaging
US-2018218878-A1 · Aug 2, 2018 · US
Substrate processing apparatus
US-10026596-B2 · Jul 17, 2018 · US
Rf ion source with dynamic volume control
US-2018138020-A1 · May 17, 2018 · US
Electron Microscope and Image Acquisition Method
US-2018130634-A1 · May 10, 2018 · US
Multi-electrode electron optics
US-9905322-B2 · Feb 27, 2018 · US
RF ion source with dynamic volume control
US-9899193-B1 · Feb 20, 2018 · US
Frequently asked questions
Answers are generated from the same data shown on this page.
- What is CPC H01J2237/024?
- CPC H01J2237/024 is the Cooperative Patent Classification code for “Moving components not otherwise provided for.”
- How many patents are filed under CPC H01J2237/024 (Moving components not otherwise provided for)?
- Our database includes 205 publications tagged with this CPC code.
- Is patent activity under CPC H01J2237/024 growing?
- Publication counts under this code: 15 in 2024 vs 20 in 2025 (latest complete years).