Photoinduced carrier lifetime measurement device and photoinduced carrier lifetime measurement method
US-10126253-B2 · Nov 13, 2018 · US
using non-ionising electromagnetic radiation, e.g. optical radiation
using non-ionising electromagnetic radiation, e.g. optical radiation · Cooperative Patent Classification (CPC)
Computing, optics, measurement, and control technologies.
Related technology areas
Mapped technology topics for this CPC code.
| Metric | Value |
|---|---|
| CPC code | G01R31/2656 |
| Official title | {using non-ionising electromagnetic radiation, e.g. optical radiation} |
| Display label | using non-ionising electromagnetic radiation, e.g. optical radiation |
| Total patents | 274 |
Filing trend
Year-over-year patent counts classified under this CPC code.
Filing activity over the last five years is declining.
| Year | Patents |
|---|---|
| 2015 | 19 |
| 2016 | 14 |
| 2017 | 24 |
| 2018 | 23 |
| 2019 | 29 |
| 2020 | 20 |
| 2021 | 33 |
| 2022 | 32 |
| 2023 | 25 |
| 2024 | 31 |
| 2025 | 22 |
| 2026 | 2 |
Representative patents
Representative publications under this CPC code from precomputed stats, or recent filings when stats are unavailable.
Method for measuring temperature by refraction and change in velocity of waves with magnetic susceptibility
US-10041842-B2 · Aug 7, 2018 · US
Method and apparatus for non-contact measurement of sheet resistance and shunt resistance of p-n junctions
US-9921261-B2 · Mar 20, 2018 · US
Semiconductor device and wafer with reference circuit and related methods
US-2017363507-A1 · Dec 21, 2017 · US
Semiconductor film and semiconductor device
US-9829533-B2 · Nov 28, 2017 · US
Opto electrical test measurement system for integrated photonic devices and circuits
US-2017307687-A1 · Oct 26, 2017 · US
Semiconductor device and wafer with reference circuit and related methods
US-2017307468-A1 · Oct 26, 2017 · US
Radiometric test and configuration of an infrared focal plane array at wafer probe
US-9797942-B2 · Oct 24, 2017 · US
Analysis system and analysis method
US-2017299534-A1 · Oct 19, 2017 · US
Semiconductor device and wafer with reference circuit and related methods
US-9791346-B1 · Oct 17, 2017 · US
Method for evaluating quality of oxide semiconductor thin film and laminated body having protective film on surface of oxide semiconductor thin film, and method for managing quality of oxide semiconductor thin film
US-9780005-B2 · Oct 3, 2017 · US
Electric field concentration location observation device and electric field concentration location observation method
US-9733297-B2 · Aug 15, 2017 · US
Non-Contact Sheet Resistance Measurement of Barrier and/or Seed Layers Prior to Electroplating
US-2017226655-A1 · Aug 10, 2017 · US
Method for evaluating quality of oxide semiconductor thin film and laminated body having protective film on surface of oxide semiconductor thin film, and method for managing quality of oxide semiconductor thin film
US-2017194218-A1 · Jul 6, 2017 · US
Quality evaluation method for laminate having protective layer on surface of oxide semiconductor thin film and quality control method for oxide semiconductor thin film
US-2017184660-A1 · Jun 29, 2017 · US
Tunable wavelength electro-optical analyzer
US-2017176520-A1 · Jun 22, 2017 · US
Semiconductor device inspection device and semiconductor device inspection method
US-2017176521-A1 · Jun 22, 2017 · US
Contactless damage inspection of perimeter region of semiconductor device
US-9658279-B2 · May 23, 2017 · US
Visible laser probing for circuit debug and defect analysis
US-9651610-B2 · May 16, 2017 · US
Method and apparatus for inspection of light emitting semiconductor devices using photoluminescence imaging
US-9638741-B2 · May 2, 2017 · US
Frequently asked questions
Answers are generated from the same data shown on this page.
- What is CPC G01R31/2656?
- CPC G01R31/2656 is the Cooperative Patent Classification code for “using non-ionising electromagnetic radiation, e.g. optical radiation.”
- How many patents are filed under CPC G01R31/2656 (using non-ionising electromagnetic radiation, e.g. optical radiation)?
- Our database includes 274 publications tagged with this CPC code.
- Is patent activity under CPC G01R31/2656 growing?
- Publication counts under this code: 31 in 2024 vs 22 in 2025 (latest complete years).