Device and method for testing semiconductor devices
US-2022390502-A1 · Dec 8, 2022 · US
for measuring break-down voltage therefor
for measuring break-down voltage therefor · Cooperative Patent Classification (CPC)
Computing, optics, measurement, and control technologies.
Related technology areas
Mapped technology topics for this CPC code.
| Metric | Value |
|---|---|
| CPC code | G01R31/2623 |
| Official title | {for measuring break-down voltage therefor} |
| Display label | for measuring break-down voltage therefor |
| Total patents | 97 |
Filing trend
Year-over-year patent counts classified under this CPC code.
Filing activity over the last five years is stable.
| Year | Patents |
|---|---|
| 2015 | 7 |
| 2016 | 7 |
| 2017 | 11 |
| 2018 | 8 |
| 2019 | 5 |
| 2020 | 7 |
| 2021 | 5 |
| 2022 | 14 |
| 2023 | 17 |
| 2024 | 10 |
| 2025 | 5 |
| 2026 | 1 |
Representative patents
Representative publications under this CPC code from precomputed stats, or recent filings when stats are unavailable.
Safety container for high power device testing over a range of temperatures
US-2022381813-A1 · Dec 1, 2022 · US
Deterioration checking apparatus and deterioration checking
US-2022381814-A1 · Dec 1, 2022 · US
Device and method for testing semiconductor devices
US-11448685-B2 · Sep 20, 2022 · US
Method and apparatus for calculating kink current of SOI device
US-11442097-B2 · Sep 13, 2022 · US
High-side gate over-voltage stress testing
US-2022260627-A1 · Aug 18, 2022 · US
Body-contacted field effect transistors configured for test and methods
US-11367790-B2 · Jun 21, 2022 · US
High-side gate over-voltage stress testing
US-11353494-B2 · Jun 7, 2022 · US
Measuring device for determining a dielectric constant
US-2022128486-A1 · Apr 28, 2022 · US
Semiconductor test apparatus and semiconductor test method
US-2022128616-A1 · Apr 28, 2022 · US
Method and Apparatus for Calculating Kink Current of SOI Device
US-2021405107-A1 · Dec 30, 2021 · US
Universal driver systems and methods of operating the same
US-11022654-B1 · Jun 1, 2021 · US
RDSON/dRON MEASUREMENT METHOD AND CIRCUIT FOR HIGH VOLTAGE HEMTS
US-2021080498-A1 · Mar 18, 2021 · US
Semiconductor device configured for gate dielectric monitoring
US-2021072304-A1 · Mar 11, 2021 · US
Body-contacted field effect transistors configured for test and methods
US-2021066503-A1 · Mar 4, 2021 · US
Power electronic test automation circuit
US-10739411-B2 · Aug 11, 2020 · US
In-wafer reliability testing
US-2020241071-A1 · Jul 30, 2020 · US
Charge trap evaluation method and semiconductor element
US-2020203493-A1 · Jun 25, 2020 · US
High-side gate over-voltage stress testing
US-2020182925-A1 · Jun 11, 2020 · US
Nondestructive inspection method for coatings and ceramic matrix composites
US-10648937-B2 · May 12, 2020 · US
Frequently asked questions
Answers are generated from the same data shown on this page.
- What is CPC G01R31/2623?
- CPC G01R31/2623 is the Cooperative Patent Classification code for “for measuring break-down voltage therefor.”
- How many patents are filed under CPC G01R31/2623 (for measuring break-down voltage therefor)?
- Our database includes 97 publications tagged with this CPC code.
- Is patent activity under CPC G01R31/2623 growing?
- Publication counts under this code: 10 in 2024 vs 5 in 2025 (latest complete years).