Power electronic test automation circuit

Patent metadata

Field	Value
Publication number	US-10739411-B2
Application number	US-201815997216-A
Country	US
Kind code	B2
Filing date	Jun 4, 2018
Priority date	Jun 4, 2018
Publication date	Aug 11, 2020
Grant date	Aug 11, 2020

Abstract

A system for testing a phase leg of an inverter includes a load coupled to an output terminal of the phase leg. A test circuit includes a capacitor coupled between an inverter power input and a switch module operative to couple the capacitor to the load. The circuit further includes a switch operative to select a polarity of a voltage across the capacitor. The circuit also includes a pair of switching elements operative to selectively couple the first terminal to the inverter power input and the inverter power return. The components can be operated by a controller configured to selectively couple the load to the inverter power and return terminals, selectively charge and couple the capacitor to the load, and interface with the inverter to control a path of current flow through active and passive elements of the phase leg.

First claim

What is claimed is:

1. A circuit comprising:
a capacitor coupled between an inverter power input and a switch module operative to couple the capacitor to a first terminal of a load having a second terminal coupled to an inverter phase output;
a switch operative to select a polarity of a voltage across the capacitor; and
switching elements operative to selectively couple the first terminal to each and only one of the inverter power input and an inverter power return.

2. The circuit of claim 1 wherein the switch module includes a pair of Insulated Gate Bipolar Transistors (IGBT) that are arranged to, responsive to being in a conductive state, permit current flow in opposite directions.

3. The circuit of claim 1 wherein the switching elements are a pair of relays.

4. The circuit of claim 1 further comprising a controller configured to interface with the switch module, the switch, the switching elements, and an inverter under test to selectively control a flow of current through active and passive elements of an inverter phase leg to which the circuit is connected.

5. The circuit of claim 4 wherein the controller is configured to operate the switching elements such that no more than one of the switching elements is closed at a time.

6. The circuit of claim 4 wherein the controller is further configured to interface with the inverter under test to operate active elements of the inverter phase leg during a test cycle.

7. The circuit of claim 1 wherein the capacitor has a capacitance value greater than an inverter capacitance across the inverter power input and the inverter power return.

8. The circuit of claim 1 wherein the load is configured to have a selectable inductance.

9. The circuit of claim 1 further including a diode electrically coupled between the inverter power input and one of the switching elements.

10. A system for testing an inverter phase leg having output, power, and return terminals comprising:
a load coupled to the output terminal; and
a controller configured to selectively couple the load to each and only one of the power terminal and the return terminal, selectively charge and couple a capacitor to the load, and interface with the inverter phase leg to control a current path through active and passive elements of the inverter phase leg, wherein the controller is configured to drive a pair of Insulated Gate Bipolar Transistors (IGBTs) that are coupled between a terminal of the capacitor and the load such that each of the pair of IGBTs is configured to permit current flow in opposite directions when driven to a conductive state.

11. The system of claim 10 wherein the controller is configured to drive a relay that is electrically coupled between the power terminal and a terminal of the load.

12. The system of claim 10 wherein the controller includes a relay electrically coupled between the return terminal and a terminal of the load.

13. The system of claim 10 wherein the controller is further configured to selectively connect a voltage source to adjust a voltage polarity with which the capacitor is charged.

14. The system of claim 10 wherein the load is configured to have a selectable inductance and the controller is further configured to select an inductance value.

15. A circuit for testing an inverter phase leg having output, power, and return terminals comprising:
a capacitor;
a switch circuit coupling the capacitor to a first terminal of a load having a second terminal coupled to the output terminal;
a switch operative to select a polarity of a voltage connected across the capacitor; and
a pair of switches operative to selectively couple the first terminal to the power and return terminals.

16. The circuit of claim 15 wherein the capacitor has a capacitance value greater than an inverter capacitance connected across the power and return terminals internal to the inverter phase leg.

17. The circuit of claim 15 wherein the load is configured to have a selectable inductance.

18. The circuit of claim 15 wherein the switch circuit includes a pair of Insulated Gate Bipolar Transistors (IGBT) configured to permit current flow in opposite directions when activated.

19. The circuit of claim 15 further comprising a controller configured to interface with the switch circuit, the switch, the pair of switches, and the inverter phase leg to selectively control a flow of current through active and passive elements of the inverter phase leg to which the circuit is connected.

Assignees

• Ford Global Tech Llc

Inventors

• Bhat Krishna Prasad
• Chen Chingchi

Classifications

• G01R31/00

  Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere ({measuring superconductive properties G01R33/1238;} testing line transmission systems H04B3/46; testing or measuring semiconductors or solid state devices during manufacture {H10P74/00}) · CPC title

• H02M7/537

  using semiconductor devices only, e.g. single switched pulse inverters · CPC title

• G01R31/40 Primary

  Testing power supplies (testing photovoltaic devices H02S50/10) · CPC title

• G01R31/2632

  for testing diodes · CPC title

• G01R31/2607

  Circuits therefor (G01R31/2642 takes precedence) · CPC title