Nondestructive inspection method for coatings and ceramic matrix composites

Patent metadata

Field	Value
Publication number	US-10648937-B2
Application number	US-201615335822-A
Country	US
Kind code	B2
Filing date	Oct 27, 2016
Priority date	Oct 27, 2016
Publication date	May 12, 2020
Grant date	May 12, 2020

Abstract

A method for nondestructive inspection of ceramic structures present as either a ceramic matrix composite structure or a ceramic based coating. Such non-metallic structures are used to provide thermal protection or weight reduction or both to aircraft and their components. The nonmetallic structure is scanned with an electromagnetic pulse in the range of 200 GHz to 4 THz. The electromagnetic pulse includes a plurality of frequencies within the Terahertz range and is not restricted to a single designated frequency. The frequency range is sensitive to changes in impedances and refractive index within the structure. After the electromagnetic pulse passes through the nonmetallic structure, it may be evaluated for changes in impedance in the nonmetallic structure at different locations, and, when present, whether the changes in impedance impact the ability of the structure to perform the function for which it was designed.

First claim

What is claimed is:

1. A method for nondestructively inspecting a nonmetallic structure, comprising the steps of:
providing a nonmetallic structure having an interior between two surfaces;
scanning the interior of the structure with an electromagnetic pulse in the range of 200 GHz to 4 THz;
evaluating the electromagnetic pulse after it passes through the non-metallic structure;
determining impedance differences in the non-metallic structure based on the evaluation of the electromagnetic pulse; and
based on the impedance differences identifying the presence of a defect in the interior of the structure.

2. The method of claim 1 wherein the step of providing a nonmetallic structure, further includes providing the nonmetallic structure a portion of which has two phases further comprising particles uniformly distributed within a ceramic-based matrix.

3. The method of claim 1 wherein the step of providing a nonmetallic structure wherein the nonmetallic structure is a ceramic matrix composite material.

4. The method of claim 3 wherein the ceramic matrix composite material further comprises multiple layers of ceramic material bonded at interfaces between layers.

5. The method of claim 4 wherein the ceramic matrix composite material including the multiple layers of ceramic material and the interfaces between layers are scanned, evaluated and impedance differences are determined and assessed.

6. The method of claim 2 wherein the step of providing a nonmetallic structure a portion of which has two phases further includes providing particles uniformly distributed within the matrix having no dimension greater than 0.0005 inches (0.5 mils).

7. The method of claim 1 wherein the nonmetallic structure comprises a non-conductive coating overlying a metallic substrate.

8. The method of claim 1 wherein the nonmetallic structure further comprises a non-conductive coating overlying a ceramic matrix composite structure wherein the non-conductive coating is selected from the group consisting of a thermal barrier coating, an environmental coating, a wear coating and combinations thereof.

9. The method of claim 3 wherein the ceramic matrix composite material comprises woven fabric layers of alumina-boria-silica fibers in a ceramic matrix.

10. The method of claim 7 wherein the metallic substrate is an aircraft component.

11. The method of claim 1 wherein the step of scanning is accomplished in the range of 0.3-3 THz.

12. The method of claim 1 further including a step of recording the electromagnetic pulse after the pulse passes through the non-metallic structure.

13. The method of claim 12 wherein the step of recording includes printing an image of the pulse representing impedance differences in the nonmetallic structure.

14. The method of claim 12 wherein the step of recording includes storing a signal representative of the electromagnetic pulse after it passes through the nonmetallic structure.

15. The method of claim 14 further including a step of recalling the stored signals representative of the electromagnetic pulse, further evaluating the electromagnetic pulse and further determining impedance differences in the non-metallic structure.

16. The method of claim 1 further including the step of assessing the impedance differences to establish acceptance/rejection criteria for the nonmetallic structure undergoing Terahertz testing and comparing the determined impedance differences to the established acceptance/rejection criteria.

Assignees

• Gen Electric

Inventors

• Baucke Russell Craig
• Hilderbrand Glen David
• Decker Timothy Francis
• Crowgey Benjamin Reid

Classifications

• G01N21/3581

  using far infrared light; using Terahertz radiation · CPC title

• G01N21/3563

  for analysing solids; Preparation of samples therefor · CPC title

• G01R19/30

  Measuring the maximum or the minimum value of current or voltage reached in a time interval (G01R19/04 takes precedence) · CPC title

• G01R15/12

  Circuits for multi-testers {, i.e. multimeters}, e.g. for measuring voltage, current, or impedance at will · CPC title

• G01N22/02

  Investigating the presence of flaws · CPC title