Inspection device
US-10157722-B2 · Dec 18, 2018 · US
by measuring secondary emission from the material
by measuring secondary emission from the material · Cooperative Patent Classification (CPC)
Computing, optics, measurement, and control technologies.
Related technology areas
Mapped technology topics for this CPC code.
| Metric | Value |
|---|---|
| CPC code | G01N23/22 |
| Official title | by measuring secondary emission from the material |
| Display label | by measuring secondary emission from the material |
| Total patents | 191 |
Filing trend
Year-over-year patent counts classified under this CPC code.
Filing activity over the last five years is declining.
| Year | Patents |
|---|---|
| 2015 | 9 |
| 2016 | 14 |
| 2017 | 20 |
| 2018 | 20 |
| 2019 | 16 |
| 2020 | 21 |
| 2021 | 23 |
| 2022 | 12 |
| 2023 | 16 |
| 2024 | 20 |
| 2025 | 18 |
| 2026 | 2 |
Representative patents
Representative publications under this CPC code from precomputed stats, or recent filings when stats are unavailable.
Electron vibrometer and determining displacement of a cantilever
US-10060946-B2 · Aug 28, 2018 · US
Systems and methods for component identification
US-10048213-B2 · Aug 14, 2018 · US
System for determining and imaging wax deposition and corrosion in pipelines
US-10031092-B2 · Jul 24, 2018 · US
Statistical analysis in x-ray imaging
US-2018204647-A1 · Jul 19, 2018 · US
Charged Particle Beam Device and Pattern Measurement Device
US-2018182595-A1 · Jun 28, 2018 · US
Cross sectional depth composition generation utilizing scanning electron microscopy
US-2018158649-A1 · Jun 7, 2018 · US
Cross sectional depth composition generation utilizing scanning electron microscopy
US-2018151330-A1 · May 31, 2018 · US
Chip Assembly For Measuring Electrochemical Reaction On Solid-Liquid Phase Interface In Situ
US-2018136148-A1 · May 17, 2018 · US
Method for distinguishing carbon nanotubes
US-9963342-B1 · May 8, 2018 · US
Systems and methods for component identification
US-2018120239-A1 · May 3, 2018 · US
XRF/XRD system with dynamic management of multiple data processing units
US-9933375-B2 · Apr 3, 2018 · US
Scanning electron microscope system capable of measuring in-cell overlay offset using high-energy electron beam and method thereof
US-9934939-B2 · Apr 3, 2018 · US
Cross sectional depth composition generation utilizing scanning electron microscopy
US-9928991-B2 · Mar 27, 2018 · US
Cross sectional depth composition generation utilizing scanning electron microscopy
US-9928990-B2 · Mar 27, 2018 · US
Cathodoluminescence-activated nanoscale imaging
US-2018080885-A1 · Mar 22, 2018 · US
Light amount detection device, immune analyzing apparatus and charged particle beam apparatus that each use the light amount detection device
US-2018066986-A1 · Mar 8, 2018 · US
Method for estimating shape before shrink and CD-SEM apparatus
US-9830524-B2 · Nov 28, 2017 · US
Automated SEM nanoprobe tool
US-9805910-B1 · Oct 31, 2017 · US
Methods and systems for non-invasive measurement of soil chlorine and/or nitrogen content and for detecting sub-surface chlorine or nitrogen-containing objects
US-2017307550-A1 · Oct 26, 2017 · US
Frequently asked questions
Answers are generated from the same data shown on this page.
- What is CPC G01N23/22?
- CPC G01N23/22 is the Cooperative Patent Classification code for “by measuring secondary emission from the material.”
- How many patents are filed under CPC G01N23/22 (by measuring secondary emission from the material)?
- Our database includes 191 publications tagged with this CPC code.
- Is patent activity under CPC G01N23/22 growing?
- Publication counts under this code: 20 in 2024 vs 18 in 2025 (latest complete years).