Systems and methods for component identification

Patent metadata

Field	Value
Publication number	US-10048213-B2
Application number	US-201615336020-A
Country	US
Kind code	B2
Filing date	Oct 27, 2016
Priority date	Oct 27, 2016
Publication date	Aug 14, 2018
Grant date	Aug 14, 2018

Abstract

A method of forming of an item includes: selecting a component of the item that is formed of an element; mixing one or more identifiable additives with the element; forming the component with the mixture; performing an atomic level test on at least a portion of the component; and recording the results of the test.

First claim

What is claimed is:

1. A method of forming of an item made from at least one component so that the authenticity of the item can later be verified, the method comprising:
selecting a component of the item that is formed of at least one element;
mixing one or more identifiable additives having an atomic level characteristic different from the at least one element, with the at least one element to create a mixture;
forming the component with the mixture;
performing an atomic level test on at least a portion of the component to determine the atomic level characteristic of the component; and
recording the results of the test;
wherein the one or more identifiable additives are unstable isotopes or one or more metastable isotopes with a characteristic fraction of events emitting gamma rays of a specific energy.

2. The method of claim 1 , wherein the atomic level test is spectrum analysis.

3. The method of claim 2 , wherein the spectrum analysis is gamma spectroscopy.

4. The method of claim 1 ,
wherein the test includes both a mass spectrometry test and a spectrum analysis.

5. A method of forming of an item made from at least one component so that the authenticity of the item can later be verified, the method comprising:
selecting a component of the item that is formed of at least one element;
mixing one or more identifiable additives having an atomic level characteristic different from the at least one element, with the at least one element to create a mixture;
forming the component with the mixture;
performing an atomic level test on at least a portion of the component to determine the atomic level characteristic of the component; and
recording the results of the test;
wherein the one or more identifiable additives are neutron capturing or neutron scattering elements;
wherein the atomic level test is neutron spectroscopy and is performed after the item is bombarded by neutrons.

6. A method of verifying the authenticity of an item made from at least one element, the method comprising:
receiving the results of an a first atomic level test on the item, the item having had one or more identifiable additives having an atomic level characteristic different from the at least one element introduced therein;
performing a second atomic level test on the item to determine the atomic level characteristic of the item; and
comparing results of the first and second atomic level tests to determine the authenticity of the item;
wherein the one or more identifiable additives are unstable isotopes or one or more metastable isotope with a characteristic fraction of events emitting gamma rays of a specific energy.

7. The method of claim 6 , wherein the first and second atomic level tests are is spectrum analysis.

8. The method of claim 7 , wherein the spectrum analysis is performed by a scintillation detector.

9. A method of verifying the authenticity of an item made from at least one element, the method comprising:
receiving the results of an a first atomic level test on the item, the item having had one or more identifiable additives having an atomic level characteristic different from the at least one element introduced therein;
performing a second atomic level test on the item to determine the atomic level characteristic of the item; and
comparing results of the first and second atomic level tests to determine the authenticity of the item;
wherein the one or more identifiable additives are neutron capturing or neutron scattering elements;
wherein the first and second atomic level tests are spectrum analysis;
wherein the spectrum analysis of the first and second atomic level tests are is performed after the item is bombarded by neutrons.

Assignees

• Raytheon Co

Inventors

• Wilds Andrew M
• Theriault Philip C
• Burkland Michael K

Classifications

• B29K2105/0052

  Tracing elements, e.g. to detect the origin of articles · CPC title

• H01J49/0031

  Step by step routines describing the use of the apparatus (H01J49/0081 takes precedence) · CPC title

• B29C64/386 Primary

  Data acquisition or data processing for additive manufacturing · CPC title

• G01N23/22

  by measuring secondary emission from the material · CPC title

• B33Y10/00

  Processes of additive manufacturing · CPC title