Manufacturing apparatus of SiC single crystal and method for manufacturing SiC single crystal

US9617655B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9617655-B2
Application numberUS-201113997722-A
CountryUS
Kind codeB2
Filing dateDec 26, 2011
Priority dateDec 27, 2010
Publication dateApr 11, 2017
Grant dateApr 11, 2017

How to read this patent

A practical reading order for non-experts. Skip the full description unless you need deep technical detail.

  1. Title

    What the patent document calls the invention.

  2. Abstract

    A short plain-language summary of the technical disclosure.

  3. Assignees and inventors

    Who owns or filed the patent and who is credited as inventor.

  4. Key dates

    Filing, priority, publication, and grant dates set the timeline.

  5. First independent claim

    The legal scope of protection — read this for what is actually claimed.

  6. CPC / IPC classifications

    Technology tags used to group this patent with similar filings.

  7. Citations and related patents

    Prior art links and similar publications in this corpus.

Abstract

Official abstract text for this publication.

An apparatus for SIC single crystal has an induction heating control unit such that frequency f (Hz) of alternating current to the induction heating unit satisfies Formula (1); D1 (mm) is permeation depth of electromagnetic waves into a crucible side wall by the heating unit, D2 (mm) is permeation depth of electromagnetic waves into a SIC solution, T (mm) is thickness of the crucible side wall of the crucible, and R (mm) is crucible inner radius: ( D 1− T )× D 2/ R >1.5  (1) where, D1 is defined by Formula (2) and D2 by Formula (3): D 1=503292×(1/( f×σc×μc )) 1/2   (2) D 2=503292×(1/( f×σs×μs )) 1/2   (3); σc is electric conductivity (S/m) of the sidewall, σs is electric conductivity (S/m) of the SiC solution; μc is relative permeability of the sidewall, and μs is relative permeability of the SIC solution.

First claim

Opening claim text (preview).

The invention claimed is: 1. A method for manufacturing a SiC single crystal, comprising steps of: providing a manufacturing apparatus comprising: a crucible including a tubular side wall made up of graphite and having a side wall thickness of 5 mm to 25 mm, and a bottom wall disposed at a lower end of the tubular side wall, the crucible housing a SiC solution; a chamber housing the crucible; a vertical seed shaft, a SiC seed crystal attached to a lower end surface of the seed shaft; and an induction heating unit disposed around the tubular side wall of the crucible in the chamber; bringing the SiC seed crystal attached to the seed shaft into contact with the SiC solution in the crucible; controlling the induction heating unit such that a frequency f (Hz) of alternating current to be passed to the induction heating unit satisfies Formula (1), where D1 (mm) indicates a permeation depth of electromagnetic waves into the tubular side wall by the induction heating unit, D2 (mm) indicates a permeation depth of electromagnetic waves into the SiC solution by the induction heating unit, T (mm) indicates the thickness of the tubular side wall, and R (mm) indicates an inner radius of the crucible; and growing the SiC single crystal on the SiC seed crystal while rotating the seed shaft: ( D 1− T )× D 2/ R> 1.5  (1) where, D1 is defined by Formula (2), and D2 is defined by Formula (3): D 1=503292×(1/( f×σc×μc )) 1/2   (2) D 2=503292×(1/( f×σs×μs )) 1/2   (3) where, σc is an electric conductivity (S/m) of the tubular side wall, and σs is an electric conductivity (S/m) of the SiC solution; μc is a relative permeability (dimensionless quantity) of the tubular side wall, and μs is a relative permeability (dimensionless quantity) of the SiC solution. 2. The method of claim 1 , wherein the manufacturing apparatus providing step further comprises: providing a memory-containing central processing unit for controlling the induction heating unit, wherein the control unit controls the induction heating unit such that the frequency f (Hz) of alternating current to be passed to the induction heating unit satisfies the Formula (1), where the D1 (mm) indicates the permeation depth of electromagnetic waves into the side wall by the induction heating unit, the D2 (mm) indicates the permeation depth of electromagnetic waves into the SiC solution by the induction heating unit, the T (mm) indicates the thickness of the side wall, and the R (mm) indicates the inner radius of the crucible: ( D 1− T )× D 2/ R> 1.5  (1) where, the D1 is defined by the Formula (2), and the D2 is defined by the Formula (3): D 1=503292×(1/( f×σc×μc )) 1/2   (2) D 2=503292×(1/( f×σs×μs )) 1/2   (3) where, the σc is the electric conductivity (S/m) of the tubular side wall, the σs is the electric conductivity (S/m) of the SIC solution, the μc is the relative permeability (dimensionless quantity) of the tubular side wall, and the μs is the relative permeability (dimensionless quantity) of the SIC solution. 3. The method of claim 1 , wherein the frequency f (Hz) of alternating current to be passed to the induction heating unit is not less than 1 kHz. 4. A manufacturing apparatus of a SiC single crystal, comprising: a crucible including a tubular side wall made up of graphite and having a side wall thickness of 5 mm to 25 mm, and a bottom wall disposed at a lower end of the side wall, the crucible being able to house a SiC solution; a chamber housing the crucible; a vertical seed shaft having a lower end surface to which a SiC seed crystal is to be attached, the seed shaft being able to bring the SiC seed crystal attached to the lower end surface into contact with the SiC solution; an induction heating unit disposed around the side wall of the crucible in the chamber; and a control unit comprising a central processing unit, memories, and a control program for controlling the induction heating unit, wherein the control unit controls the induction heating unit such that a frequency f (Hz) of alternating current to be passed to the induction heating unit satisfies Formula (1), where D1 (mm) indicates a permeation depth of electromagnetic waves into the side wall by the induction heating unit, D2 (mm) indicates a permeation depth of electromagnetic waves into the SiC solution by the induction heating unit, T (mm) indicates the thickness of the side wall, and R (mm) indicates an inner radius of the crucible: ( D 1− T )× D 2/ R> 1.5  (1) where, D1 is defined by Formula (2), and D2 is defined by Formula (3): D 1=503292×(1/( f×σc×μc )) 1/2   (2) D 2=503292×(1/( f×σs×μs )) 1/2   (3) where, σc is an electric conductivity (S/m) of the side wall, σs is an electric conductivity (S/m) of the SiC solution, μc is a relative permeability (dimensionless quantity) of the side wall, and μs is a relative permeability (dimensionless quantity) of the SiC solution.

Assignees

Inventors

Classifications

  • including heating or cooling details [e.g., shield configuration] · CPC title

  • C30B15/20Primary

    Controlling or regulating (controlling or regulating in general G05) · CPC title

  • Heating of the melt or the crystallised materials · CPC title

  • Stirring of the melt · CPC title

  • Single-crystal growth onto a seed which remains in the melt during growth, e.g. Nacken-Kyropoulos method (C30B15/00 takes precedence) · CPC title

Patent family

Related publications grouped by family.

External sources

Frequently asked questions

Answers are generated from the same data shown on this page.

What does patent US9617655B2 cover?
An apparatus for SIC single crystal has an induction heating control unit such that frequency f (Hz) of alternating current to the induction heating unit satisfies Formula (1); D1 (mm) is permeation depth of electromagnetic waves into a crucible side wall by the heating unit, D2 (mm) is permeation depth of electromagnetic waves into a SIC solution, T (mm) is thickness of the crucible side wall …
Who is the assignee on this patent?
Okada Nobuhiro, Kamei Kazuhito, Kusunoki Kazuhiko, and 10 more
What technology area does this patent fall under?
Primary CPC classification C30B15/20. Mapped technology areas include Chemistry & Metallurgy.
When was this patent published?
Publication date Tue Apr 11 2017 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).