Substrate liquid processing method, substrate liquid processing apparatus, and computer-readable recording medium

US2022290302A1 · US · A1

Patent metadata
FieldValue
Publication numberUS-2022290302-A1
Application numberUS-202017753264-A
CountryUS
Kind codeA1
Filing dateAug 14, 2020
Priority dateAug 27, 2019
Publication dateSep 15, 2022
Grant date

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

A substrate liquid processing method includes preparing a substrate having a surface including a recess on which a seed layer is stacked; supplying an electroless plating liquid onto the surface of the substrate to fill the recess with the electroless plating liquid while forming a liquid film of the electroless plating liquid on the surface; and adjusting a temperature of the liquid film from a first temperature at which a metal is precipitated on the seed layer to a second temperature lower than the first temperature to fill the recess with the metal starting from a bottom portion of the recess such that a void is not formed therein.

First claim

Opening claim text (preview).

1 . A substrate liquid processing method, comprising: preparing a substrate having a surface including a recess on which a seed layer is stacked; supplying an electroless plating liquid onto the surface of the substrate to fill the recess with the electroless plating liquid while forming a liquid film of the electroless plating liquid on the surface; and adjusting a temperature of the liquid film from a first temperature at which a metal is precipitated on the seed layer to a second temperature lower than the first temperature to fill the recess with the metal starting from a bottom portion of the recess such that a void is not formed therein. 2 . The substrate liquid processing method of claim 1 , wherein the second temperature is a room temperature. 3 . The substrate liquid processing method of claim 1 , wherein the liquid film is adjusted to the second temperature before an opening portion of the recess is closed by the metal precipitated thereat. 4 . The substrate liquid processing method of claim 1 , further comprising: heating, after the adjusting of the temperature of the liquid film to the second temperature, the liquid film to a third temperature which is higher than the second temperature and at which the metal is precipitated. 5 . The substrate liquid processing method of claim 1 , wherein increasing the temperature of the liquid film to accelerate precipitation of the metal and decreasing the temperature of the liquid film are repeated alternately. 6 . The substrate liquid processing method of claim 4 , wherein the liquid film having the second temperature dissolves and reduces the metal at least in an opening portion of the recess. 7 . The substrate liquid processing method of claim 1 , wherein the liquid film is heated as a cover member having a heater is placed above the surface of the substrate, and the temperature of the liquid film is adjusted as a distance between the surface of the substrate and the heater is changed. 8 . The substrate liquid processing method of claim 7 , wherein, in the adjusting of the temperature of the liquid film to the second temperature, a gas is supplied into a gap between the surface of the substrate and the cover member. 9 . The substrate liquid processing method of claim 1 , wherein, in the adjusting of the temperature of the liquid film to the second temperature, the electroless plating liquid having a temperature lower than the first temperature is supplied onto the surface of the substrate. 10 . A substrate liquid processing apparatus, comprising: a plating liquid supply configured to supply an electroless plating liquid onto a surface of a substrate including a recess on which a seed layer is stacked, to fill the recess with the electroless plating liquid while forming a liquid film of the electroless plating liquid on the surface; a temperature adjusting unit configured to adjust a temperature of the liquid film; and a controller configured to control the temperature adjusting unit, wherein the controller controls the temperature adjusting unit to adjust the temperature of the liquid film from a first temperature at which a metal is precipitated on the seed layer to a second temperature lower than the first temperature to fill the recess with the metal starting from a bottom portion of the recess such that a void is not formed therein. 11 . A computer-readable recording medium having stored thereon computer-executable instructions that, in response to execution, cause an apparatus to perform a substrate liquid processing method comprising: preparing a substrate having a surface including a recess on which a seed layer is stacked; supplying an electroless plating liquid onto the surface of the substrate to fill the recess with the electroless plating liquid while forming a liquid film of the electroless plating liquid on the surface; and adjusting a temperature of the liquid film from a first temperature at which a metal is precipitated on the seed layer to a second temperature lower than the first temperature to fill the recess with the metal starting from a bottom portion of the recess such that a void is not formed therein.

Assignees

Inventors

Classifications

  • by selectively depositing, e.g. by using selective CVD or plating · CPC title

  • using a liquid · CPC title

  • Specific elements or parts of the apparatus · CPC title

  • using hypophosphites · CPC title

  • using reducing agents · CPC title

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Frequently asked questions

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What does patent US2022290302A1 cover?
A substrate liquid processing method includes preparing a substrate having a surface including a recess on which a seed layer is stacked; supplying an electroless plating liquid onto the surface of the substrate to fill the recess with the electroless plating liquid while forming a liquid film of the electroless plating liquid on the surface; and adjusting a temperature of the liquid film from …
Who is the assignee on this patent?
Tokyo Electron Ltd
What technology area does this patent fall under?
Primary CPC classification C23C18/1676. Mapped technology areas include Chemistry & Metallurgy.
When was this patent published?
Publication date Thu Sep 15 2022 00:00:00 GMT+0000 (Coordinated Universal Time) (A1). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 2 related publications on this page (citations in our corpus or others sharing the same primary CPC).