Back grinding apparatus and wear amount measuring method using the same
US-2024424637-A1 · Dec 26, 2024 · US
US2016204020A1 · US · A1
| Field | Value |
|---|---|
| Publication number | US-2016204020-A1 |
| Application number | US-201514592788-A |
| Country | US |
| Kind code | A1 |
| Filing date | Jan 8, 2015 |
| Priority date | Jan 8, 2015 |
| Publication date | Jul 14, 2016 |
| Grant date | — |
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A bonding chuck is discussed with methods of using the bonding chuck and tools including the bonding chuck. A method includes loading a first wafer on first surface of a first bonding chuck, loading a second wafer on a second bonding chuck, and bonding the first wafer to the second wafer. The first surface is defined at least in part by a first portion of a first spherical surface and a second portion of a second spherical surface. The first spherical surface has a first radius, and the second spherical surface has a second radius. The first radius is less than the second radius.
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1 . A method comprising: loading a first wafer on first surface of a first bonding chuck, the first surface being defined at least in part by a first portion of a first spherical surface and a second portion of a second spherical surface, the first spherical surface having a first radius, the second spherical surface having a second radius, the first radius being less than the second radius; loading a second wafer on a second bonding chuck; and bonding the first wafer to the second wafer.…
Electricity · mapped topic
Electricity · mapped topic
Electricity · mapped topic
Electricity · mapped topic
Electricity · mapped topic
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