Etching compositions and methods for fabricating semiconductor devices by using the same

US12297385B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-12297385-B2
Application numberUS-202217573734-A
CountryUS
Kind codeB2
Filing dateJan 12, 2022
Priority dateFeb 22, 2021
Publication dateMay 13, 2025
Grant dateMay 13, 2025

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

Etching compositions are provided. The etching compositions can be used for etching cobalt. The etching compositions may include a chelator, water, an oxidizer, and an organic solvent, and the chelator may include an organic acid, an amine compound and/or a polyhydric alcohol. Water may be present in an amount of 1 wt % to 10 wt % based on a total weight of the etching composition.

First claim

Opening claim text (preview).

What is claimed is: 1. An etching composition for etching cobalt, the etching composition comprising: a chelator in an amount of 1 wt % to 23 wt % based on the total weight of the etching composition; water; an oxidizer; and an organic solvent, wherein the chelator includes an organic acid, an amine compound, and/or a polyhydric alcohol, wherein the water is present in an amount of 1 wt % to 10 wt % based on a total weight of the etching composition, wherein the etching composition is devoid of a fluorine compound, wherein the chelator is configured to bind to cobalt to form a compound having a pentagonal ring structure or a hexagonal ring structure, represented by Formula 1 or Formula 2: and wherein in Formula 1 and Formula 2, M is cobalt. 2. The etching composition of claim 1 , wherein the chelator includes the organic acid, and the organic acid includes methanesulfonic acid, ethanesulfonic acid, benzenesulfonic acid, p-toluenesulfonic acid, sulfobenzoic acid, sulfosuccinic acid, sulfophthalic acid, sulfosalicylic acid, acetic acid, butanoic acid, citric acid, formic acid, caprylic acid, imminodiacetic acid, propenoic acid, isocitric acid, tartaric acid, glycolic acid, malonic acid, oxalic acid, pentanoic acid, phthalic acid, salicylic acid, benzoic acid, lactic acid, propionic acid, glutaric acid, fumaric acid, adipic acid, glutamic acid, glyceric acid, succinic acid, malic acid, maleic acid, glycine, ethylenediaminetetraacetic acid, and/or nitrilotriacetic acid. 3. The etching composition of claim 1 , wherein the chelator includes the amine compound, and the amine compound includes an alkyl group, a cycloalkyl group or an aryl group bound to an amine, and the amine compound includes at least one primary amine at one end of the amine compound. 4. The etching composition of claim 1 , wherein the chelator includes the polyhydric alcohol, and the polyhydric alcohol includes diol, ethylene glycol, propylene glycol, glycerine and/or nitrilotriethanol. 5. The etching composition of claim 1 , wherein the oxidizer further comprises hydrogen peroxide. 6. The etching composition of claim 1 , wherein the organic solvent includes dimethyl sulfoxide, dimethylsulfone, diethylsulfone, methylsulfolane, sulfolane, γ-butyro lactone, delta-valerolactone, diethyl ketone, ethyleneglycol, diethyl acetamide, triethylphosphate, monomethyl ether acetate, and/or 1,3-dimethyl-2-imidazolinone. 7. The etching composition of claim 1 , wherein the etching composition has a pH of 4 to 9. 8. The etching composition of claim 1 , wherein the oxidizer is present in an amount of 0.7 wt % to 10 wt % based on the total weight of the etching composition. 9. The etching composition of claim 1 , wherein etching composition comprises the organic solvent in an amount of 50 wt % to 80 wt % based on the total weight of the etching composition.

Assignees

Inventors

Classifications

  • the principal metal being a transition metal · CPC title

  • H10P50/667Primary

    by liquid etching only · CPC title

  • Local interconnections · CPC title

  • the openings being via holes penetrating underlying conductors · CPC title

  • in openings in dielectrics · CPC title

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Frequently asked questions

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What does patent US12297385B2 cover?
Etching compositions are provided. The etching compositions can be used for etching cobalt. The etching compositions may include a chelator, water, an oxidizer, and an organic solvent, and the chelator may include an organic acid, an amine compound and/or a polyhydric alcohol. Water may be present in an amount of 1 wt % to 10 wt % based on a total weight of the etching composition.
Who is the assignee on this patent?
Samsung Electronics Co Ltd, Dongwoo Fine Chem Co Ltd
What technology area does this patent fall under?
Primary CPC classification H10P50/667. Mapped technology areas include Electricity.
When was this patent published?
Publication date Tue May 13 2025 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 9 related publications on this page (citations in our corpus or others sharing the same primary CPC).