Method of electroplating photoresist defined features from copper electroplating baths containing reaction products of imidazole compounds, bisepoxides and halobenzyl compounds

US10006136B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-10006136-B2
Application numberUS-201615220476-A
CountryUS
Kind codeB2
Filing dateJul 27, 2016
Priority dateAug 6, 2015
Publication dateJun 26, 2018
Grant dateJun 26, 2018

How to read this patent

A practical reading order for non-experts. Skip the full description unless you need deep technical detail.

  1. Title

    What the patent document calls the invention.

  2. Abstract

    A short plain-language summary of the technical disclosure.

  3. Assignees and inventors

    Who owns or filed the patent and who is credited as inventor.

  4. Key dates

    Filing, priority, publication, and grant dates set the timeline.

  5. First independent claim

    The legal scope of protection — read this for what is actually claimed.

  6. CPC / IPC classifications

    Technology tags used to group this patent with similar filings.

  7. Citations and related patents

    Prior art links and similar publications in this corpus.

Abstract

Official abstract text for this publication.

Electroplating methods enable the plating of photoresist defined features which have substantially uniform morphology. The electroplating methods include copper electroplating baths with reaction products of imidazole compounds, bisepoxides and halobenzyl compounds to electroplate the photoresist defined features. Such features include pillars, bond pads and line space features.

First claim

Opening claim text (preview).

What is claimed is: 1. A method comprising: a) providing a substrate comprising a layer of photoresist, wherein the layer of photoresist comprises a plurality of apertures; b) providing a copper electroplating bath comprising one or more sources of copper ions; one or more reaction products of one or more imidazole compounds, one or more bisepoxides and one or more halobenzyl compounds; an electrolyte; one or more accelerators; and one or more suppressors; c) immersing the substrate comprising the layer of photoresist with the plurality of apertures in the copper electroplating bath; and d) electroplating a plurality of copper photoresist defined features in the plurality of apertures, the plurality of photoresist defined features comprise an average % TIR of 5% to 10%. 2. The method of claim 1 , wherein a % WID of the plurality of photoresist defined features is from 8% to 10%. 3. The method of claim 1 , wherein the one or more imidazole compounds have a formula: where R 1 , R 2 and R 3 may be the same or different and chosen from hydrogen atom, linear or branched (C 1 -C 10 )alkyl; hydroxyl; linear or branched alkoxy; linear or branched hydroxy(C 1 -C 10 )alkyl; linear or branched alkoxy(C 1 -C 10 )alkyl; linear or branched, carboxy(C 1 -C 10 )alkyl; linear or branched amino(C 1 -C 10 )alkyl; and substituted or unsubstituted phenyl. 4. The method of claim 1 wherein the one or more bisepoxides are chosen from compounds having formula: wherein R 4 and R 5 may be the same or different and are chosen from hydrogen and (C 1 -C 4 )alkyl; R 6 and R 7 may be the same of different and are chosen from hydrogen, methyl and hydroxyl; m=1-6 and n=1-20. 5. The method of claim 1 , wherein the one or more halobenzyls have a formula: wherein R 8 , R 9 , R 10 , R 11 , R 12 and R 13 are independently chosen from hydrogen, linear or branched (C 1 -C 10 )alkyl halide, and linear or branched (C 1 -C 10 )alkyl with the proviso that at least two of R 8 , R 9 , R 10 , R 11 , R 12 and R 13 are alkyl halide in the same instance and with the proviso that R 10 , and R 12 , or R 9 , R 11 and R 13 are not methyl groups in the same instance. 6. The method of claim 1 , wherein the reaction product is in amounts of 0.25 ppm to 20 ppm. 7. The method of claim 1 , wherein electroplating is performed at a current density of 0.25 ASD to 40 ASD. 8. The method of claim 1 , wherein the one or more copper photoresist defined features are pillars, bond pads or line space features.

Assignees

Inventors

Classifications

  • C25D3/38Primary

    of copper · CPC title

  • Electroplating characterised by the article coated · CPC title

  • Semiconductors · CPC title

  • of plastics · CPC title

  • using a pattern electroplated or electroformed on a metallic carrier · CPC title

Patent family

Related publications grouped by family.

External sources

Frequently asked questions

Answers are generated from the same data shown on this page.

What does patent US10006136B2 cover?
Electroplating methods enable the plating of photoresist defined features which have substantially uniform morphology. The electroplating methods include copper electroplating baths with reaction products of imidazole compounds, bisepoxides and halobenzyl compounds to electroplate the photoresist defined features. Such features include pillars, bond pads and line space features.
Who is the assignee on this patent?
Rohm & Haas Elect Mat, Dow Global Technologies Llc
What technology area does this patent fall under?
Primary CPC classification C25D3/38. Mapped technology areas include Chemistry & Metallurgy.
When was this patent published?
Publication date Tue Jun 26 2018 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 3 related publications on this page (citations in our corpus or others sharing the same primary CPC).