Systems and methods for optimizing full horizontal scanned beam distance
US-12191113-B2 · Jan 7, 2025 · US
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Scheuer Jay T patents
Scheuer Jay T is listed as an inventor on 35 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Scheuer Jay T |
| Total patents | 35 |
| First publication | Dec 15, 2016 |
| Latest publication | Jan 7, 2025 |
Notable patents
Publications ranked by popularity score, then publication date.
Device to control uniformity of extracted ion beam
US-12154753-B2 · Nov 26, 2024 · US
Single-slot tubular cathode
US-D1051838-S · Nov 19, 2024 · US
Xray diffraction angle verification in an ion implanter
US-2024222072-A1 · Jul 4, 2024 · US
Xray diffraction angle verification in an ion implanter
US-2024222070-A1 · Jul 4, 2024 · US
Systems and methods for optimizing full horizontal scanned beam distance
US-2023386785-A1 · Nov 30, 2023 · US
Variable thickness ion source extraction plate
US-11810746-B2 · Nov 7, 2023 · US
Mismatched optics for angular control of extracted ion beam
US-11651932-B1 · May 16, 2023 · US
Mismatched Optics for Angular Control of Extracted Ion Beam
US-2023131410-A1 · Apr 27, 2023 · US
Ion source with single-slot tubular cathode
US-11631567-B2 · Apr 18, 2023 · US
Recent patents
Latest publications not already listed above.
Variable Thickness Ion Source Extraction Plate
US-2023080083-A1 · Mar 16, 2023 · US
Device To Control Uniformity Of Extraction Ion Beam
US-2023082224-A1 · Mar 16, 2023 · US
Particle yield via beam-line pressure control
US-11562885-B2 · Jan 24, 2023 · US
In-situ plasma cleaning of process chamber components
US-11495434-B2 · Nov 8, 2022 · US
Electrostatic filter providing reduced particle generation
US-11437215-B2 · Sep 6, 2022 · US
Particle yield via beam-line pressure control
US-2022037114-A1 · Feb 3, 2022 · US
Ion source with single-slot tubular cathode
US-2021383995-A1 · Dec 9, 2021 · US
Ion source with single-slot tubular cathode
US-11127557-B1 · Sep 21, 2021 · US
Ion source with single-slot tubular cathode
US-2021287872-A1 · Sep 16, 2021 · US
Electrostatic filter providing reduced particle generation
US-2021183609-A1 · Jun 17, 2021 · US
In-situ plasma cleaning of process chamber components
US-11037758-B2 · Jun 15, 2021 · US
In-situ plasma cleaning of process chamber components
US-2021013001-A1 · Jan 14, 2021 · US
Cylindrical shaped arc chamber for indirectly heated cathode ion source
US-10818469-B2 · Oct 27, 2020 · US
Cylindrical Shaped Arc Chamber For Indirectly Heated Cathode Ion Source
US-2020194220-A1 · Jun 18, 2020 · US
In-situ plasma cleaning of process chamber components
US-2020126757-A1 · Apr 23, 2020 · US
In-situ plasma cleaning of process chamber components
US-10522330-B2 · Dec 31, 2019 · US
RF clean system for electrostatic elements
US-10410844-B2 · Sep 10, 2019 · US
Rf clean system for electrostatic elements
US-2018166261-A1 · Jun 14, 2018 · US
Liquid immersion doping
US-9805931-B2 · Oct 31, 2017 · US
Apparatus and method for in-situ cleaning in ion beam apparatus
US-9761410-B2 · Sep 12, 2017 · US
Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Applied Materials Inc | 21 |
| Varian Semiconductor Equipment Ass Inc | 14 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| H01J37/3171 | 31 |
| H01J37/08 | 16 |
| H01J2237/057 | 12 |
| H01J2237/022 | 12 |
| H01J2237/061 | 11 |