Color imaging for CMP monitoring
US-11715193-B2 · Aug 1, 2023 · US
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Ravid Abraham patents
Ravid Abraham is listed as an inventor on 18 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Ravid Abraham |
| Total patents | 18 |
| First publication | Jul 21, 2016 |
| Latest publication | Aug 1, 2023 |
Notable patents
Publications ranked by popularity score, then publication date.
Position and temperature monitoring of ALD platen susceptor
US-11430680-B2 · Aug 30, 2022 · US
Particle detection for substrate processing
US-11119051-B2 · Sep 14, 2021 · US
Particle detection for substrate processing
US-2021018449-A1 · Jan 21, 2021 · US
Particle detection for substrate processing
US-10845317-B2 · Nov 24, 2020 · US
Color imaging for cmp monitoring
US-2020151868-A1 · May 14, 2020 · US
Color imaging for CMP monitoring
US-10565701-B2 · Feb 18, 2020 · US
Position And Temperature Monitoring Of ALD Platen Susceptor
US-2019244842-A1 · Aug 8, 2019 · US
Position and temperature monitoring of ALD platen susceptor
US-10312120-B2 · Jun 4, 2019 · US
Electroplating tool with feedback of metal thickness distribution and correction
US-10260855-B2 · Apr 16, 2019 · US
Recent patents
Latest publications not already listed above.
Particle detection for substrate processing
US-2019072497-A1 · Mar 7, 2019 · US
Wafer placement and gap control optimization through in situ feedback
US-10196741-B2 · Feb 5, 2019 · US
Methods and apparatus to determine parameters in metal-containing films
US-9880233-B2 · Jan 30, 2018 · US
Non-Contact Sheet Resistance Measurement of Barrier and/or Seed Layers Prior to Electroplating
US-2017226655-A1 · Aug 10, 2017 · US
Non-contact sheet resistance measurement of barrier and/or seed layers prior to electroplating
US-9631919-B2 · Apr 25, 2017 · US
Method of aligning substrate-scale mask with substrate
US-9490154-B2 · Nov 8, 2016 · US
Apparatus and method for optical calibration of wafer placement by a robot
US-9405287-B1 · Aug 2, 2016 · US
Substrate-scale mask alignment
US-2016211185-A1 · Jul 21, 2016 · US
Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Applied Materials Inc | 18 |
| Ravid Abraham | 1 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| H10P74/23 | 5 |
| H10P72/0606 | 5 |
| G01B7/105 | 4 |
| H10P72/7621 | 4 |
| C23C16/45544 | 4 |