Notch filter for high throughput x-ray photon spectroscopy
US-2026081103-A1 · Mar 19, 2026 · US
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Litman Alon patents
Litman Alon is listed as an inventor on 38 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Litman Alon |
| Total patents | 38 |
| First publication | Jan 29, 2015 |
| Latest publication | Mar 19, 2026 |
Notable patents
Publications ranked by popularity score, then publication date.
Method and system for 3d reconstruction of wafer structure by diagonal milling
US-2025391707-A1 · Dec 25, 2025 · US
Multiple electron beam optics
US-2024387140-A1 · Nov 21, 2024 · US
X-ray imaging in cross-section using un-cut lamella with background material
US-2022367146-A1 · Nov 17, 2022 · US
X-ray imaging in cross-section using un-cut lamella with background material
US-11501951-B1 · Nov 15, 2022 · US
Detecting backscattered electrons in a multibeam charged particle column
US-11366072-B2 · Jun 21, 2022 · US
Adaptive geometry for optimal focused ion beam etching
US-11315754-B2 · Apr 26, 2022 · US
Generating three dimensional information regarding structural elements of a specimen
US-11264202-B2 · Mar 1, 2022 · US
Generating three dimensional information regarding structural elements of a specimen
US-2021358712-A1 · Nov 18, 2021 · US
Detecting backscattered electrons in a multi-beam charged particle column
US-2021341398-A1 · Nov 4, 2021 · US
Recent patents
Latest publications not already listed above.
Adaptive geometry for optimal focused ion beam etching
US-2021335571-A1 · Oct 28, 2021 · US
Filling empty structures with deposition under high-energy SEM for uniform DE layering
US-10903044-B1 · Jan 26, 2021 · US
Retractable detector
US-10714305-B2 · Jul 14, 2020 · US
System and method for scanning an object with an electron beam using overlapping scans and electron beam counter-deflection
US-10541104-B2 · Jan 21, 2020 · US
Retractable detector
US-2019189391-A1 · Jun 20, 2019 · US
Retractable detector
US-10211026-B2 · Feb 19, 2019 · US
Inspection of a lithographic mask that is protected by a pellicle
US-10156785-B2 · Dec 18, 2018 · US
Multi mode systems with retractable detectors
US-10074513-B2 · Sep 11, 2018 · US
System for electrical measurements of objects in a vacuumed environment
US-9958501-B1 · May 1, 2018 · US
Multi mode system with a dispersion x-ray detector
US-2018012728-A1 · Jan 11, 2018 · US
Inspection of regions of interest using an electron beam system
US-9847209-B2 · Dec 19, 2017 · US
Multi mode system with a dispersion X-ray detector
US-9818577-B2 · Nov 14, 2017 · US
Multi mode systems with retractable detectors
US-2017213696-A1 · Jul 27, 2017 · US
Multi mode system with a dispersion x-ray detector
US-2017213697-A1 · Jul 27, 2017 · US
Method for charging and imaging an object
US-9666412-B1 · May 30, 2017 · US
Imaging bottom of high aspect ratio holes
US-9632044-B1 · Apr 25, 2017 · US
System and method for scanning an object with an electron beam
US-2017011883-A1 · Jan 12, 2017 · US
Inspection of regions of interest using an electron beam system
US-2016322195-A1 · Nov 3, 2016 · US
Detecting open and short of conductors
US-9470751-B2 · Oct 18, 2016 · US
Inspection of regions of interest using an electron beam system
US-9466462-B2 · Oct 11, 2016 · US
Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Applied Materials Israel Ltd | 43 |
| Applieed Mat Israel Ltd | 1 |
| Applied Mat Isreal Ltd | 1 |
| Applied Materials Inc | 1 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| H01J37/28 | 26 |
| H01J37/244 | 16 |
| H01J37/20 | 13 |
| H01J2237/2445 | 11 |
| G01N23/2251 | 8 |