Integrated circuit device
US-2025194217-A1 · Jun 12, 2025 · US
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Kwon Uihui patents
Kwon Uihui is listed as an inventor on 32 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Kwon Uihui |
| Total patents | 32 |
| First publication | Sep 8, 2015 |
| Latest publication | Jun 12, 2025 |
Notable patents
Publications ranked by popularity score, then publication date.
Integrated circuit device
US-12261208-B2 · Mar 25, 2025 · US
Semiconductor device
US-2025098224-A1 · Mar 20, 2025 · US
Semiconductor device
US-12191368-B2 · Jan 7, 2025 · US
Semiconductor protection device
US-12002890-B2 · Jun 4, 2024 · US
Method and apparatus for estimating aging of integrated circuit
US-11972185-B2 · Apr 30, 2024 · US
Integrated circuit device
US-2024113182-A1 · Apr 4, 2024 · US
Integrated circuit device
US-11888039-B2 · Jan 30, 2024 · US
Image sensor
US-2023352509-A1 · Nov 2, 2023 · US
Metal oxide semiconductor field-effect transistor (MOSFET) devices and manufacturing methods thereof
US-11791394-B2 · Oct 17, 2023 · US
Recent patents
Latest publications not already listed above.
Image sensor
US-2023282662-A1 · Sep 7, 2023 · US
Image sensors having grating structures therein that provide enhanced diffraction of incident light
US-2023246050-A1 · Aug 3, 2023 · US
Method and electronic device for guiding semiconductor manufacturing process
US-11693386-B2 · Jul 4, 2023 · US
Image sensors having grating structures therein that provide enhanced diffraction of incident light
US-11658194-B2 · May 23, 2023 · US
Metal oxide semiconductor field-effect transistor (mosfet) devices and manufacturing methods thereof
US-2023068212-A1 · Mar 2, 2023 · US
Metal oxide semiconductor field-effect transistor (MOSFET) devices and manufacturing methods thereof
US-11522064-B2 · Dec 6, 2022 · US
Semiconductor protection device
US-2022376119-A1 · Nov 24, 2022 · US
Semiconductor device
US-2022285511-A1 · Sep 8, 2022 · US
Integrated circuit device
US-2022165857-A1 · May 26, 2022 · US
Image sensor
US-11222918-B1 · Jan 11, 2022 · US
Metal oxide semiconductor field-effect transistor (mosfet) devices and manufacturing methods thereof
US-2021336026-A1 · Oct 28, 2021 · US
Method and apparatus for estimating aging of integrated circuit
US-2021165940-A1 · Jun 3, 2021 · US
Method and electronic device for guiding semiconductor manufacturing process
US-2021063999-A1 · Mar 4, 2021 · US
Standard cell design system, standard cell design optimization method thereof, and semiconductor design system
US-10796068-B2 · Oct 6, 2020 · US
Standard cell design system, standard cell design optimization method thereof, and semiconductor design system
US-2020082051-A1 · Mar 12, 2020 · US
Image sensors having grating structures therein that provide enhanced diffraction of incident light
US-2020075656-A1 · Mar 5, 2020 · US
Simulation system estimating self-heating characteristic of circuit and design method thereof
US-2019294748-A1 · Sep 26, 2019 · US
Simulation system estimating self-heating characteristic of circuit and design method thereof
US-2019130059-A1 · May 2, 2019 · US
Simulation system estimating self-heating characteristic of circuit and design method thereof
US-10216876-B2 · Feb 26, 2019 · US
Semiconductor devices having tapered active regions
US-9634092-B2 · Apr 25, 2017 · US
Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Samsung Electronics Co Ltd | 32 |
| Jeon Jongwook | 1 |
| Yun Yeoil | 1 |
| Pae Sangwoo | 1 |
| Kwon Uihui | 1 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| H10D30/6757 | 9 |
| H10D30/6735 | 9 |
| H10D62/121 | 9 |
| H10D30/43 | 9 |
| H10D84/83 | 8 |