Single-crystal pulling apparatus with saddle-shaped superconducting coils and single-crystal pulling method
US-12188153-B2 · Jan 7, 2025 · US
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Kamada Hiroyuki patents
Kamada Hiroyuki is listed as an inventor on 21 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Kamada Hiroyuki |
| Total patents | 21 |
| First publication | Jan 22, 2015 |
| Latest publication | Jan 7, 2025 |
Notable patents
Publications ranked by popularity score, then publication date.
Single crystal pulling apparatus and method for pulling single crystal
US-2024141548-A1 · May 2, 2024 · US
Arrhythmic state detection assisting device and program
US-2024138690-A1 · May 2, 2024 · US
Single crystal pulling apparatus and method for pulling single crystal
US-2024076800-A1 · Mar 7, 2024 · US
Single-crystal pulling apparatus and single-crystal pulling method
US-2023175166-A1 · Jun 8, 2023 · US
Single-crystal pulling apparatus and single-crystal pulling method
US-2023138632-A1 · May 4, 2023 · US
Silicon carbide semiconductor device
US-11081556-B2 · Aug 3, 2021 · US
Silicon carbide semiconductor device
US-2020251564-A1 · Aug 6, 2020 · US
Method for controlling resistivity and N-type silicon single crystal
US-10400353-B2 · Sep 3, 2019 · US
Method for heat treatment of silicon single crystal wafer
US-10066322-B2 · Sep 4, 2018 · US
Recent patents
Latest publications not already listed above.
Method for heat treatment of silicon single crystal wafer
US-9938640-B2 · Apr 10, 2018 · US
Method for heat treatment of silicon single crystal wafer
US-9850595-B2 · Dec 26, 2017 · US
Method for heat treatment of silicon single crystal wafer
US-2017342596-A1 · Nov 30, 2017 · US
Method for evaluating concentration of defect in silicon single crystal substrate
US-9773710-B2 · Sep 26, 2017 · US
Method for controlling resistivity and n-type silicon single crystal
US-2017260645-A1 · Sep 14, 2017 · US
Method for manufacturing a defect-controlled low-oxygen concentration silicon single crystal wafer
US-9650725-B2 · May 16, 2017 · US
Method for heat treatment of silicon single crystal wafer
US-2017037541-A1 · Feb 9, 2017 · US
Method for heat treatment of silicon single crystal wafer
US-2017002480-A1 · Jan 5, 2017 · US
Method for evaluating concentration of defect in silicon single crystal substrate
US-2016300768-A1 · Oct 13, 2016 · US
Method for evaluating silicon single crystal and method for manufacturing silicon single crystal
US-9111883-B2 · Aug 18, 2015 · US
Method for manufacturing silicon single crystal wafer
US-2015020728-A1 · Jan 22, 2015 · US
Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Shinetsu Handotai Kk | 18 |
| Sumitomo Electric Industries | 2 |
| Astellas Pharma Inc | 1 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| C30B29/06 | 16 |
| H10P14/3458 | 8 |
| C30B15/20 | 7 |
| C30B33/02 | 7 |
| H10P36/03 | 6 |