Scanning electron microscope device and electron beam inspection apparatus
US-11908657-B2 · Feb 20, 2024 · US
Contrast, resolution or power of penetration
Contrast, resolution or power of penetration · Cooperative Patent Classification (CPC)
Electric circuits, power, telecommunications, and semiconductors.
Related technology areas
Mapped technology topics for this CPC code.
| Metric | Value |
|---|---|
| CPC code | H01J37/263 |
| Official title | {Contrast, resolution or power of penetration} |
| Display label | Contrast, resolution or power of penetration |
| Total patents | 231 |
Filing trend
Year-over-year patent counts classified under this CPC code.
Filing activity over the last five years is stable.
| Year | Patents |
|---|---|
| 2015 | 23 |
| 2016 | 22 |
| 2017 | 21 |
| 2018 | 19 |
| 2019 | 20 |
| 2020 | 20 |
| 2021 | 19 |
| 2022 | 14 |
| 2023 | 26 |
| 2024 | 23 |
| 2025 | 21 |
| 2026 | 3 |
Representative patents
Representative publications under this CPC code from precomputed stats, or recent filings when stats are unavailable.
Electron microscope device and imaging method using same
US-9824853-B2 · Nov 21, 2017 · US
Electron microscope
US-9818576-B2 · Nov 14, 2017 · US
Calibration standard with pre-determined features
US-9797924-B2 · Oct 24, 2017 · US
Determination of spatial distribution of charged particle beams
US-9754360-B2 · Sep 5, 2017 · US
Charged particle beam apparatus and sample image acquiring method
US-9741526-B2 · Aug 22, 2017 · US
Test structure for electron beam inspection and method for defect determination using electron beam inspection
US-2017207060-A1 · Jul 20, 2017 · US
Test structure for electron beam inspection and method for defect determination using electron beam inspection
US-9711326-B1 · Jul 18, 2017 · US
Scanning electron microscope and method for controlling same
US-2017186583-A1 · Jun 29, 2017 · US
Electron microscope device and imaging method using same
US-2017169992-A1 · Jun 15, 2017 · US
Pattern dimension measurement method using electron microscope, pattern dimension measurement system, and method for monitoring changes in electron microscope equipment over time
US-9671223-B2 · Jun 6, 2017 · US
Scanning transmission electron microscope having multiple beams and post-detection image correction
US-9607804-B2 · Mar 28, 2017 · US
Weak signal detection system and electron microscope equipped with same
US-9576769-B2 · Feb 21, 2017 · US
Method of using an environmental transmission electron microscope
US-9570270-B2 · Feb 14, 2017 · US
Scanning Electron Microscope
US-2017018394-A1 · Jan 19, 2017 · US
Method and device for manipulating particle beam
US-2016343536-A1 · Nov 24, 2016 · US
Scanning transmission electron microscope having multiple beams and post-detection image correction
US-2016300688-A1 · Oct 13, 2016 · US
Scanning transmission electron microscope having multiple beams and post-detection image correction
US-2016300689-A1 · Oct 13, 2016 · US
Phase plate for a transmission electron microscope
US-9460890-B2 · Oct 4, 2016 · US
Inspection equipment
US-9460891-B2 · Oct 4, 2016 · US
Frequently asked questions
Answers are generated from the same data shown on this page.
- What is CPC H01J37/263?
- CPC H01J37/263 is the Cooperative Patent Classification code for “Contrast, resolution or power of penetration.”
- How many patents are filed under CPC H01J37/263 (Contrast, resolution or power of penetration)?
- Our database includes 231 publications tagged with this CPC code.
- Is patent activity under CPC H01J37/263 growing?
- Publication counts under this code: 23 in 2024 vs 21 in 2025 (latest complete years).