Quality control evaluation method of cyanate ester matrix resin material within cfrp composite concerning localized hydrolytic degradation
US-2024183805-A1 · Jun 6, 2024 · US
AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes · Cooperative Patent Classification (CPC)
Computing, optics, measurement, and control technologies.
Related technology areas
Mapped technology topics for this CPC code.
| Metric | Value |
|---|---|
| CPC code | G01Q60/24 |
| Official title | AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes |
| Display label | AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes |
| Total patents | 263 |
Filing trend
Year-over-year patent counts classified under this CPC code.
Filing activity over the last five years is declining.
| Year | Patents |
|---|---|
| 2015 | 18 |
| 2016 | 22 |
| 2017 | 19 |
| 2018 | 22 |
| 2019 | 12 |
| 2020 | 27 |
| 2021 | 31 |
| 2022 | 27 |
| 2023 | 35 |
| 2024 | 23 |
| 2025 | 24 |
| 2026 | 3 |
Representative patents
Representative publications under this CPC code from precomputed stats, or recent filings when stats are unavailable.
Indium phosphide substrate, method of inspecting indium phosphide substrate, and method of producing indium phosphide substrate
US-2017363406-A1 · Dec 21, 2017 · US
Evaluation system and a method for evaluating a substrate
US-9835563-B2 · Dec 5, 2017 · US
Scanning probe microscope and sample holder therefor
US-2017343580-A1 · Nov 30, 2017 · US
Surface measurement apparatus
US-9823065-B2 · Nov 21, 2017 · US
Method and apparatus of operating a scanning probe microscope
US-9810713-B2 · Nov 7, 2017 · US
Method for detecting toxic metal ions in sample
US-2017307581-A1 · Oct 26, 2017 · US
Iridium tip, gas field ion source, focused ion beam apparatus, electron source, electron microscope, electron beam applied analysis apparatus, ion-electron multi-beam apparatus, scanning probe microscope, and mask repair apparatus
US-9773634-B2 · Sep 26, 2017 · US
Method and apparatus for avoiding damage when analysing a sample surface with a scanning probe microscope
US-2017261532-A1 · Sep 14, 2017 · US
Measurement method, manufacturing method of device, and measurement system
US-2017263508-A1 · Sep 14, 2017 · US
Situ tribometer and methods of use
US-2017254740-A1 · Sep 7, 2017 · US
Sample holder for an atomic force microscope
US-9746493-B2 · Aug 29, 2017 · US
Method and Apparatus of Operating a Scanning Probe Microscope
US-2017242052-A1 · Aug 24, 2017 · US
Targeted sequencing of biomolecules by pulling through a liquid-liquid interface with an atomic force microscope
US-9689034-B2 · Jun 27, 2017 · US
Automatic tuning of atomic force microscope
US-9678103-B2 · Jun 13, 2017 · US
Iridium Tip, Gas Field Ion Source, Focused Ion Beam Apparatus, Electron Source, Electron Microscope, Electron Beam Applied Analysis Apparatus, Ion-Electron Multi-Beam Apparatus, Scanning Probe Microscope, and Mask Repair Apparatus
US-2017148603-A1 · May 25, 2017 · US
Head-integrated atomic force microscope and composite microscope including same
US-2017138983-A1 · May 18, 2017 · US
Method and apparatus of operating a scanning probe microscope
US-9588136-B2 · Mar 7, 2017 · US
Iridium tip, gas field ion source, focused ion beam apparatus, electron source, electron microscope, electron beam applied analysis apparatus, ion-electron multi-beam apparatus, scanning probe microscope, and mask repair apparatus
US-9583299-B2 · Feb 28, 2017 · US
Force detection for microscopy based on direct tip trajectory observation
US-9562927-B2 · Feb 7, 2017 · US
Frequently asked questions
Answers are generated from the same data shown on this page.
- What is CPC G01Q60/24?
- CPC G01Q60/24 is the Cooperative Patent Classification code for “AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes.”
- How many patents are filed under CPC G01Q60/24 (AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes)?
- Our database includes 263 publications tagged with this CPC code.
- Is patent activity under CPC G01Q60/24 growing?
- Publication counts under this code: 23 in 2024 vs 24 in 2025 (latest complete years).