Resistor and method for making same
US-10147524-B2 · Dec 4, 2018 · US
US9184362B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9184362-B2 |
| Application number | US-201313966317-A |
| Country | US |
| Kind code | B2 |
| Filing date | Aug 14, 2013 |
| Priority date | Feb 24, 2011 |
| Publication date | Nov 10, 2015 |
| Grant date | Nov 10, 2015 |
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An electronic-component mounting structure includes an electronic component which includes a metal substrate, a semiconductor ceramic layer located on the metal substrate, a pair of split electrodes located on the semiconductor ceramic layer, and plating films located on the split electrodes and the metal substrate, and a mounting body on which lands to be connected to the respective split electrodes of the electronic component are provided. The position of a peripheral end portion of each land to be connected to the corresponding split electrode is located farther inside than the position of a peripheral end portion of the split electrode. In addition, a plane area of the land is smaller than that of the split electrode.
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What is claimed is: 1. An electronic-component mounting structure comprising: an electronic component which includes a metal substrate, a semiconductor ceramic layer located on the metal substrate, a pair of split electrodes located on the semiconductor ceramic layer, and plating films located on the split electrodes and the metal substrate; and a mounting body on which lands to be connected to the respective split electrodes of the electronic component are located; wherein a position of a peripheral end portion of each land to be connected to the corresponding split electrode is located farther inside than a position of a peripheral end portion of the split electrode; a thickness of the metal substrate of the electronic component is about 10 μm to about 80 μm, and a thickness of the ceramic layer is about 1 μm to about 10 μm; the position of the peripheral end portion of the split electrode is located farther inside than a position of a peripheral end portion of the semiconductor ceramic layer; and the position of the peripheral end portion of the split electrode is located farther inside than a position of a peripheral end portion of the metal substrate. 2. The electronic-component mounting structure according to claim 1 , wherein a plane area of each land is smaller than that of the corresponding split electrode. 3. The electronic-component mounting structure according to claim 1 , wherein the metal substrate of the electronic component has a sheet shape and is made from a metal powder paste, and the ceramic layer has a sheet shape and is made from a ceramic slurry. 4. The electronic-component mounting structure according to claim 3 , wherein the sheet-shaped metal substrate and the sheet-shaped ceramic layer are defined by a fired integral laminate. 5. The electronic-component mounting structure according to claim 1 , further comprising a protective layer including an insulating material and located on at least a surface of the ceramic layer on which the split electrodes are located. 6. The electronic-component mounting structure according to claim 1 , wherein an electrolytic plating film is located on a surface of the metal substrate. 7. The electronic-component mounting structure according to claim 1 , wherein the electronic component is a thermistor. 8. The electronic-component mounting structure according to claim 1 , wherein a total thickness of the thermistor is about 10 μm to about 100 μm. 9. The electronic-component mounting structure according to claim 1 , wherein the plating films include a Ni plating film and a Sn plating film. 10. The electronic-component mounting structure according to claim 1 , wherein the semiconductor ceramic layer includes an NTC characteristic. 11. The electronic-component mounting structure according to claim 1 , wherein the semiconductor ceramic layer includes at least one of Mn, Ni, Fe, Ti, Co, Al, and Zn. 12. The electronic-component mounting structure according to claim 1 , wherein the metal substrate and the split electrodes are made of at least one of a single noble metal, a single base metal, and an alloy of at least one of the single noble metal and the single base metal. 13. The electronic-component mounting structure according to claim 1 , wherein the metal substrate and the split electrodes are made of at least one of Ag, Pd, Pt, Au, Cu, Ni, Al, W and Ti, and an alloy of at least one of Ag, Pd, Pt, Au, Cu, Ni, Al, W and Ti. 14. The electronic-component mounting structure according to claim 1 , wherein the position of the peripheral end portion of each land to be connected to the corresponding split electrode is located farther inside than a position of a peripheral end portion of the plating film located on the corresponding split electrode.
Terminals or tapping points specially adapted for resistors; Arrangements of terminals or tapping points on resistors · CPC title
Thermistors (H01C7/02 - H01C7/06 take precedence) · CPC title
the resistor being suspended between and being supported by two supporting sections (H01C1/016 takes precedence) · CPC title
the terminals or tapping points being welded or soldered · CPC title
Terminals or electrodes formed on resistive elements having positive temperature coefficient · CPC title
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