In-situ wafer stress measurement by chromatic confocal sensor scanning with vibration compensation

Patent metadata

Field	Value
Publication number	US-2025354803-A1
Application number	US-202418957387-A
Country	US
Kind code	A1
Filing date	Nov 22, 2024
Priority date	May 17, 2024
Publication date	Nov 20, 2025
Grant date	—

Abstract

A system includes a process chamber, a transport chamber connected to the process chamber, a robot arm configured to support a workpiece, a chromatic confocal sensor, and a processor in electronic communication with the chromatic confocal sensor. The robot arm is configured to move the workpiece along a movement path between the process chamber and the transport chamber, and the chromatic confocal sensor is configured to measure a wavelength of light reflected by the workpiece as the robot arm moves the workpiece along the movement path. The processor is configured to receive a first scanning signal from the chromatic confocal sensor, filter the first scanning signal to produce a first filtered signal that compensates for vibrations of the robot arm while the robot arm moves the workpiece from the transport chamber to the process chamber, and generate a first bow profile of the workpiece based on the first filtered signal.

First claim

What is claimed is:

1 . A system comprising:
a process chamber; a transport chamber connected to the process chamber via a slot valve, wherein the slot valve is operable between an open position, in which the transport chamber is in fluid communication with the process chamber, and a closed position, in which the process chamber is sealed from the transport chamber; a robot arm configured to support a workpiece and move the workpiece along a movement path between the process chamber and the transport chamber with the slot valve in the open position; a chromatic confocal sensor configured to measure a wavelength of light reflected by the workpiece as the robot arm moves the workpiece along the movement path; and a processor in electronic communication with the chromatic confocal sensor, wherein the processor is configured to:
receive a first scanning signal from the chromatic confocal sensor based on the wavelength of the light reflected by the workpiece as the robot arm moves the workpiece from the transport chamber to the process chamber;
filter the first scanning signal to produce a first filtered signal that compensates for vibrations of the robot arm while the robot arm moves the workpiece from the transport chamber to the process chamber; and
generate a first bow profile of the workpiece based on the first filtered signal.

2 . The system of claim 1 , wherein the processor is further configured to:
receive a second scanning signal from the chromatic confocal sensor based on the wavelength of the light reflected by the workpiece as the robot arm moves the workpiece from the process chamber to the transport chamber; filter the second scanning signal to produce a second filtered signal that compensates for vibrations of the robot arm while the robot arm moves the workpiece from the process chamber to the transport chamber; generate a second bow profile of the workpiece based on the second filtered signal; and generate a stress profile of the workpiece based on the first bow profile and the second bow profile.

3 . The system of claim 1 , wherein the chromatic confocal sensor is configured to emit polychromatic light across a surface of the workpiece as the robot arm moves the workpiece along the movement path and detect the wavelength of the light reflected by the workpiece.

4 . The system of claim 3 , wherein the chromatic confocal sensor is disposed outside of the slot valve at atmospheric pressure and is configured to emit the polychromatic light through a window of the slot valve across the surface of the workpiece as the robot arm moves the workpiece along the movement path.

5 . The system of claim 1 , further comprising:
a vacuum pump in fluid communication with the process chamber and the transport chamber, wherein the vacuum pump is configured to produce a vacuum pressure in the process chamber and the transport chamber.

6 . The system of claim 1 , further comprising:
a chuck disposed in the process chamber, wherein the robot arm is configured to removably dispose the workpiece on the chuck; and a deposition tool disposed in the process chamber, wherein the deposition tool is configured to deposit a film layer on a surface of the workpiece disposed on the chuck with the slot valve in the closed position.

7 . The system of claim 1 , further comprising:
a plurality of process chambers, wherein the transport chamber is connected to each of the plurality of process chambers by a respective slot valve, and the robot arm is configured to move the workpiece along a movement path between each of the plurality of process chambers and the transport chamber with the respective slot valve in the open position; and a plurality of chromatic confocal sensors, wherein each of the plurality of chromatic confocal sensors is configured to measure a wavelength of light reflected by the workpiece as the robot arm moves the workpiece along the movement path between the plurality of process chambers and the transport chamber; wherein the processor is further configured to:
receive a plurality of first scanning signals from the plurality of chromatic confocal sensors based on the wavelength of the light reflected by the workpiece as the robot arm moves the workpiece from the transport chamber to each respective one of the plurality of process chambers;
filter the plurality of first scanning signals to produce a plurality of first filtered signals that compensate for vibrations of the robot arm while the robot arm moves the workpiece from the transport chamber to the respective one of the plurality of process chambers; and
generate a plurality of first bow profiles of the workpiece based on the plurality of first filtered signals.

8 . The system of claim 7 , wherein the plurality of process chambers are clustered around the transport chamber, and the movement path of the robot arm from the transport chamber to each of the plurality of process chambers is in a different radial direction relative to the transport chamber.

9 . The system of claim 1 , further comprising:
a temperature sensor configured to measure a surface temperature of the workpiece as the robot arm moves the workpiece along the movement path between the process chamber and the transport chamber; wherein the processor is in electronic communication with the temperature sensor, and the processor is further configured to:
receive a first temperature signal from the temperature sensor based on the surface temperature of the workpiece measured by the temperature sensor as the robot arm moves the workpiece from the transport chamber to the process chamber; and
wherein the first filtered signal further compensates for temperature variations of the workpiece according to the first temperature signal.

10 . The system of claim 9 , wherein the temperature sensor is a pyrometer configured to emit infrared light across a surface of the workpiece as the robot arm moves the workpiece along the movement path and detect an intensity of the light reflected by the workpiece to measure the surface temperature of the workpiece.

11 . The system of claim 10 , wherein the pyrometer is disposed outside of the slot valve at atmospheric pressure and is configured to emit the infrared light through a window of the slot valve across the surface of the workpiece as the robot arm moves the workpiece along the movement path.

12 . The system of claim 1 , further comprising:
an equipment front end module (EFEM) connected to the transport chamber; and a rotary stage disposed within the EFEM, wherein the robot arm is configured to removably dispose the workpiece on the rotary stage, and the rotary stage is configured to rotate the workpiece to a different rotary alignment with the workpiece disposed on the rotary stage; wherein the robot arm is further configured to move the workpiece along the movement path between the process chamber and the transport chamber from the EFEM, with a rotary alignment of the workpiece being set by the rotary stage.

13 . The system of claim 12 , wherein the processor is further configured to generate the first bow profile of the workpiece based on the first scanning signal received from the chromatic confocal sensor based on the light reflected by the workpiece in each different rotary alignment.

14 . The system of claim 1 , wherein the chromatic confocal sensor is configured to emit polychromatic light in a line across a surface of the workpiece as the robot arm moves the workpiece along the movement path, a width of the line being greater than or equal to a width of the workpiece.

15 . The system of claim

Assignees

• Orbotech Ltd

Inventors

• Haymore Scott
• Bronfman Arkady
• Goichman Tal
• Wilby Tony
• Rosenberg Boaz

Classifications

• H10P72/0454

  surrounding a central transfer chamber · CPC title

• H10P72/7602

  the wafers being placed on a robot blade or gripped by a gripper for conveyance · CPC title

• H10P72/0616

  Monitoring of warpages, curvatures, damages, defects or the like · CPC title

• H10P72/0602

  Temperature monitoring · CPC title

• H10P72/3302

  Mechanical parts of transfer devices · CPC title