Plasma processing apparatus and method of manufacturing semiconductor device using the same

Patent metadata

Field	Value
Publication number	US-12106945-B2
Application number	US-202117528321-A
Country	US
Kind code	B2
Filing date	Nov 17, 2021
Priority date	Dec 4, 2018
Publication date	Oct 1, 2024
Grant date	Oct 1, 2024

Abstract

A plasma processing apparatus includes a process chamber, a substrate support chuck configured to support a substrate in the process chamber, the substrate support chuck including an upper cooling channel and a lower cooling channel that are symmetrically separated from each other, and a support chuck temperature controller configured to supply a first coolant to the upper cooling channel and to supply a second coolant to the lower cooling channel.

First claim

What is claimed is:

1. A method of manufacturing a semiconductor device, the method comprising:
a substrate loading operation of loading a substrate on a substrate support chuck provided in a process chamber, the substrate having a material film and a mask pattern having an opening for exposing part of the material film; and
a plasma etching operation of removing the part of the material film exposed through the opening of the mask pattern, by generating plasma in the process chamber,
wherein the substrate support chuck comprises:
a center plate;
an upper cooling channel provided in the center plate, the upper cooling channel extending in a spiral direction from a first end adjacent to a center of the substrate support chuck to a second end adjacent to an edge of the substrate support chuck;
a lower cooling channel provided in the center plate, the lower cooling channel extending in a spiral direction from a third end adjacent to the center of the substrate support chuck to a fourth end adjacent to the edge of the substrate support chuck;
an upper cover plate attached to an upper surface of the center plate to cover the upper cooling channel, the upper cover plate closing a upwardly open portion of the upper cooling channel;
a lower cover plate attached to a lower surface of the center plate opposite to the upper surface of the center plate to cover the lower cooling channel, the lower cover plate closing a downwardly open portion of the lower cooling channel; and
a first fin protruding from an inner wall of the upper cooling channel and a second fin protruding from an inner wall of the lower cooling channel, the first fin spirally extending along an extending direction of the upper cooling channel, and the second fin spirally extending along an extending direction of the lower cooling channel,

wherein the plasma etching operation comprises adjusting a temperature of the substrate support chuck by supplying a first coolant to the upper cooling channel and a second coolant to the lower cooling channel,
wherein the upper cooling channel is separated from the lower cooling channel such that the first coolant is not mixed with the second coolant within the substrate support chuck,
wherein a thickness of the center plate is greater than a thickness of the upper cover plate and greater than a thickness of the lower cover plate, in a vertical direction,
wherein, when viewed in a cross section of the substrate support chuck, the upper cooling channel and the lower cooling channel are mirror-symmetric with respect to a plane horizontally traversing the center plate, and
wherein, in the plasma etching operation, while the part of the material film is removed, the temperature of the substrate support chuck is adjusted between about −50° C. and about −100° C.

2. The method of claim 1 , wherein the plasma etching operation further comprises determining a flow direction of the first coolant in the upper cooling channel and a flow direction of the second coolant in the lower cooling channel.

3. The method of claim 1 , wherein the first end of the upper cooling channel is an outlet of the upper cooling channel through which the first coolant flows out,
wherein the second end of the upper cooling channel is an inlet of the upper cooling channel through which the first coolant flows in,
wherein the third end of the lower cooling channel is an inlet of the lower cooling channel through which the second coolant flows in,
wherein the fourth end of the lower cooling channel is an outlet of the lower cooling channel through which the second coolant flows out, and
wherein the plasma etching operation comprises supplying the first coolant to the second end of the upper cooling channel, and the second coolant to the third end of the lower cooling channel.

4. The method of claim 1 , wherein the first end of the upper cooling channel is an outlet of the upper cooling channel through which the first coolant flows out,
wherein the second end of the upper cooling channel is an inlet of the upper cooling channel through which the first coolant flows in,
wherein the third end of the lower cooling channel is an outlet of the lower cooling channel through which the second coolant flows out,
wherein the fourth end of the lower cooling channel is an inlet of the lower cooling channel through which the second coolant flows in, and
wherein the plasma etching operation comprises supplying the first coolant to the second end of the upper cooling channel, and the second coolant to the fourth end of the lower cooling channel.

5. The method of claim 1 , wherein the first end of the upper cooling channel is an inlet of the upper cooling channel through which the first coolant flows in,
wherein the second end of the upper cooling channel is an outlet of the upper cooling channel through which the first coolant flows out,
wherein the third end of the lower cooling channel is an inlet of the lower cooling channel through which the second coolant flows in,
wherein the fourth end of the lower cooling channel is an outlet of the lower cooling channel through which the second coolant flows out, and
wherein the plasma etching operation comprises supplying the first coolant to the first end of the upper cooling channel, and the second coolant to the third end of the lower cooling channel.

6. The method of claim 1 , wherein the plasma etching operation further comprises determining a flow rate of the first coolant and a flow rate of the second coolant.

7. The method of claim 6 , wherein the flow rate of the first coolant and the flow rate of the second coolant are different from each other.

8. The method of claim 6 , wherein the flow rate of the first coolant and the flow rate of the second coolant are identical to each other.

9. The method of claim 1 , further comprising:
merging the first coolant flowing out from an outlet of the upper cooling channel and the second coolant flowing out from an outlet of the lower cooling channel;
adjusting a temperature of a merged coolant of the first coolant and the second coolant; and
separating the merged coolant into two coolants, and
supplying one of the two coolants into an inlet of the upper cooling channel and the other one of the two coolants into an inlet of the lower cooling channel.

10. The method of claim 1 , wherein the first fin comprises a plurality of fin portions extending parallel to each other, and
wherein the second fin comprises a plurality of fin portions extending parallel to each other.

11. The method of claim 1 , wherein a radial distance between the edge of the substrate support chuck and the first end of the upper cooling channel is greater than a radial distance between the edge of the substrate support chuck and the second end of the upper cooling channel, and
wherein a radial distance between the edge of the substrate support chuck and the third end of the lower cooling channel is greater than a radial distance between the edge of the substrate support chuck and the fourth end of the lower cooling channel.

12. The method of claim 1 , wherein the upper cover plate is attached to the center plate by a first adhesive layer, and
wherein the lower cover plate is attached to the center plate by a second adhesive layer.

13. The method of claim 1 , wherein the substrate support chuck further comprises:
an electrostatic dielectric layer in contact with the substrate;
an adsorption electrode provided in the electrostatic dielectric layer, and configured to generate an electrostatic force to support the substrate; and
a chucking power source supplying power to the adsorption electrode.

Assignees

• Samsung Electronics Co Ltd

Inventors

• Lu Siqing
• Lee Cheonkyu
• Noguchi Takafumi

Classifications

• H10P72/0602

  Temperature monitoring · CPC title

• H10P72/0434

  mainly by convection · CPC title

• C23C16/4586

  Elements in the interior of the support, e.g. electrodes, heating or cooling devices · CPC title

• C23C16/463

  Cooling of the substrate · CPC title

• C23C14/541

  Heating or cooling of the substrates · CPC title