Apparatus for testing electronic devices

Patent metadata

Field	Value
Publication number	US-11860221-B2
Application number	US-202217574300-A
Country	US
Kind code	B2
Filing date	Jan 12, 2022
Priority date	Apr 27, 2005
Publication date	Jan 2, 2024
Grant date	Jan 2, 2024

Abstract

An apparatus is described for burn-in and/or functional testing of microelectronic circuits of unsingulated wafers. A large number of power, ground, and signal connections can be made to a large number of contacts on a wafer. The apparatus has a cartridge that allows for fanning-in of electric paths. A distribution board has a plurality of interfaces that are strategically positioned to provide a dense configuration. The interfaces are connected through flexible attachments to an array of first connector modules. Each one of the first connector modules can be independently connected to a respective one of a plurality of second connector modules, thereby reducing stresses on a frame of the apparatus. Further features include for example a piston that allows for tight control of forces exerted by terminals onto contacts of a wafer.

First claim

What is claimed:

1. An apparatus for testing integrated circuits of devices, comprising:
at least one frame;
a holder for a device, secured to the frame;
a contactor support structure held by the frame;
a plurality of terminals, held by the contactor support structure, for contacting respective contacts of a device;
at least first and second interfaces, on the contactor support structure, each having at least one row of contacts for contacting a respective terminal of a connector, the rows of the contacts of the interfaces being at an angle between 0° and 180° relative to one another; and
a plurality of conductors, held by the contactor support structure, connecting the contacts of the interfaces and the terminals on the contactor support structure to one another, the holder and contactor support structure being movable relative to one another so that each one of the terminals releasably makes contact with a respective contact of the device;
a power source;
a power electrical path connecting the power source to a power terminal of the terminals held by the support structure;
a signal source; and

a plurality of signal electrical paths, each connecting the signal source to a respective signal terminal of the terminals held by the support structure.

2. The apparatus of claim 1 , wherein the angle is substantially 90°.

3. The apparatus of claim 1 , comprising at least a third of said interfaces, wherein the row of contacts of the third interface is between the row of contacts of the first interface and the terminals held by the contactor support structure.

4. The apparatus of claim 3 , wherein the rows of contacts of the first and third interfaces are substantially parallel to one another.

5. The apparatus of claim 1 , wherein the contactor support structure has two threaded openings at opposing ends of each interface, for securing the respective connectors to the contactor support structure.

6. The apparatus of claim 1 , wherein the contactor support structure includes a distribution substrate and a circular contactor substrate secured to the distribution substrate, the terminals held by the contactor support structure being held by the contactor substrate and the contacts on the contactor support structure being on the distribution substrate.

7. An apparatus for testing integrated circuits of devices, comprising:
at least one frame;
a holder for a device, secured to the frame;
a contactor support structure held by the frame;
a plurality of terminals, held by the contactor support structure, for contacting respective contacts of a device;
at least first and second interfaces, on the contactor support structure, each having at least one row of contacts for contacting a respective terminal of a connector, the row of contacts of the second interface being between the row of contacts of the first interface and the terminals held by the contactor support structure; and
a plurality of conductors, held by the contactor support structure, connecting the contacts of the interfaces and the terminals on the contactor support structure to one another;
a plurality of terminals held by the contactor support structure, the holder and contactor support structure being movable relative to one another so that each one of the terminals releasably makes contact with a respective contact of the device;
a power source;
a power electrical path connecting the power source to a power terminal of the terminals held by the support structure;
a signal source; and

a plurality of signal electrical paths, each connecting the signal source to a respective signal terminal of the terminals held by the support structure.

8. The apparatus of claim 7 , comprising at least a third of said interfaces, wherein the row of contacts of the second interface is between the row of contacts of the first interface and the terminals held by the contactor support structure.

9. The apparatus of claim 7 , wherein the contactor support structure has two threaded openings at opposing ends of each interface, for securing the respective connectors to the contactor support structure.

10. An apparatus for testing integrated circuits of devices, comprising:
at least one frame;
a holder for a device, secured to the frame;
a contactor support structure held by the frame;
a plurality of terminals, held by the contactor support structure within an inner area of the contactor support structure, for contacting respective contacts of a device under test;
a plurality of interfaces on the contactor support structure, each interface having at least one row of contacts for contacting a respective terminal of a connector, a combined length of the rows being more than a length of a periphery of the inner area; and
a plurality of conductors, held by the contactor support structure, connecting the contacts of the interfaces and the terminals on the contactor support structure to one another;
a plurality of terminals held by the support structure, the holder and support structure being movable relative to one another so that each one of the terminals releasably makes contact with a respective contact of the device;
a power source;
a power electrical path connecting the power source to a power terminal of the terminals held by the contactor support structure;
a signal source; and

a plurality of signal electrical paths, each connecting the signal source to a respective signal terminal of the terminals held by the contactor support structure.

11. The apparatus of claim 10 , the rows of the contacts of the interfaces being at an angle between 0° and 180° relative to one another.

12. The apparatus of claim 10 , a row of contacts of a first of the interfaces being between a row of contacts of a second of the interfaces.

Assignees

• Aehr Test Systems

Inventors

• Richmond Ii Donald P
• Deboe Kenneth W
• Uher Frank O
• Jovanovic Jovan
• Lindsey Scott E
• Maenner Thomas T
• Shepherd Patrick M
• Tyson Jeffrey L
• Carbone Mark C
• Burke Paul W
• Cao Doan D
• Tomic James F
• Vu Long V

Classifications

• H10P74/00 Primary

  Testing or measuring during manufacture or treatment of wafers, substrates or devices · CPC title

• G01R31/287 Primary

  Procedures; Software aspects · CPC title

• G01R31/003

  Environmental or reliability tests (of individual semiconductors G01R31/2642; of PCB's G01R31/2817; of IC's G01R31/2855; of other circuits G01R31/2849) · CPC title

• G01R31/26

  Testing of individual semiconductor devices (testing of photovoltaic devices H02S50/10; testing or measuring during manufacture or treatment {H10P74/00}) · CPC title

• G01R31/2642

  Testing semiconductor operation lifetime or reliability, e.g. by accelerated life tests · CPC title