Electronics tester
US-12584958-B2 · Mar 24, 2026 · US
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Lindsey Scott E patents
Lindsey Scott E is listed as an inventor on 72 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Lindsey Scott E |
| Total patents | 72 |
| First publication | Feb 3, 2015 |
| Latest publication | Mar 24, 2026 |
Notable patents
Publications ranked by popularity score, then publication date.
System for testing an integrated circuit of a device and its method of use
US-2025224423-A1 · Jul 10, 2025 · US
System for testing an integrated circuit of a device and its method of use
US-12326472-B2 · Jun 10, 2025 · US
Controlling alignment during a thermal cycle
US-12298328-B2 · May 13, 2025 · US
Electronics tester
US-2025093399-A1 · Mar 20, 2025 · US
Electronics tester
US-2025093398-A1 · Mar 20, 2025 · US
Electronics tester
US-2025093400-A1 · Mar 20, 2025 · US
System for testing an integrated circuit of a device and its method of use
US-2025085338-A1 · Mar 13, 2025 · US
System for testing an integrated circuit of a device and its method of use
US-2025085337-A1 · Mar 13, 2025 · US
Electronics tester
US-12169217-B2 · Dec 17, 2024 · US
Recent patents
Latest publications not already listed above.
System for testing an integrated circuit of a device and itsmethod of use
US-2024410938-A1 · Dec 12, 2024 · US
Apparatus for testing electronic devices
US-12163999-B2 · Dec 10, 2024 · US
System for testing an integrated circuit of a device and its method of use
US-2024402243-A1 · Dec 5, 2024 · US
System for testing an integrated circuit of a device and its method of use
US-2024393388-A1 · Nov 28, 2024 · US
System for testing an integrated circuit of a device and its method of use
US-2024393387-A1 · Nov 28, 2024 · US
Controlling alignment during a thermal cycle
US-2024230714-A1 · Jul 11, 2024 · US
Electronics tester
US-2024219455-A1 · Jul 4, 2024 · US
System for testing an integrated circuit of a device and its method of use
US-11977098-B2 · May 7, 2024 · US
Apparatus for testing electronic devices
US-2024103068-A1 · Mar 28, 2024 · US
Electronics tester
US-2024036103-A1 · Feb 1, 2024 · US
Apparatus for testing electronic devices
US-11860221-B2 · Jan 2, 2024 · US
Electronics tester
US-11821940-B2 · Nov 21, 2023 · US
Electronics tester
US-2023204651-A1 · Jun 29, 2023 · US
System for testing an integrated circuit of a device and its method of use system for testing an integrated circuit of a device and its method of use
US-2023168277-A1 · Jun 1, 2023 · US
Electronics tester
US-11635459-B2 · Apr 25, 2023 · US
Pressure relief valve
US-11592465-B2 · Feb 28, 2023 · US
System for testing an integrated circuit of a device and its method of use
US-2022373595-A1 · Nov 24, 2022 · US
System for testing an integrated circuit of a device and its method of use
US-11448695-B2 · Sep 20, 2022 · US
Apparatus for testing electronic devices
US-2022137121-A1 · May 5, 2022 · US
Electronics tester
US-2022065921-A1 · Mar 3, 2022 · US
Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Aehr Test Systems | 70 |
| Lindsey Scott E | 3 |
| Jovanovic Jovan | 2 |
| Richmond Ii Donald P | 2 |
| Aehr Test Systems | 2 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| G01R31/2863 | 44 |
| G01R1/0491 | 41 |
| G01R31/2886 | 29 |
| G01R31/2855 | 29 |
| G01R31/2601 | 28 |