Electronics tester

Patent metadata

Field	Value
Publication number	US-11635459-B2
Application number	US-202117523646-A
Country	US
Kind code	B2
Filing date	Nov 10, 2021
Priority date	Mar 3, 2017
Publication date	Apr 25, 2023
Grant date	Apr 25, 2023

Abstract

A tester apparatus is described. Various components contribute to the functionality of the tester apparatus, including an insertion and removal apparatus, thermal posts, independent gimbaling, the inclusion of a photo detector, a combination of thermal control methods, a detect circuitry in a socket lid, through posts with stand-offs, and a voltage retargeting.

First claim

What is claimed:

1. A cartridge comprising:
a socket of insulative material and having upper and lower sides, a first formation on the upper side to hold a first electronic device, and a second formation on the upper side to hold a second electronic device;
a lid;
a first pusher plate rotatably mounted to the lid;
a second pusher plate rotatably mounted to the lid, the lid being locatable over the socket and movable towards the socket, the rotatable mounting of the first pusher plate allowing for the first electronic device to rotate the first pusher plate relative to the lid and the rotatable mounting of the second pusher plate allowing the second electronic device to rotate the second pusher plate independently from the first pusher plate relative to the lid;
a first set of contacts held in the socket to connect to the first electronic device;
a first set of terminals connected to the first set of contacts;
a second set of contacts held in the socket to connect to the second electronic device; and
a second set of terminals connected to the second set of contacts.

2. The cartridge of claim 1 , wherein the first pusher plate is rotatable about first and second orthogonal axes relative to the lid and the second pusher plate is rotatable about first and second orthogonal axes relative to the lid.

3. The cartridge of claim 1 , further comprising:
a first thermal surface within the first formation, wherein the rotation of the first pusher plate relative to the lid allows for seating of a lower surface of the first electronic device against the first thermal surface; and
a second thermal surface within the second formation, wherein the rotation of the second pusher plate relative to the lid allows for seating of a lower surface of the second electronic device against the second thermal surface.

4. The cartridge of claim 3 , wherein the first set of contacts are resiliently depressible to bring the first electronic device into contact with the first thermal surface and the second set of contacts are resiliently depressible to bring the second electronic device into contact with the second thermal surface.

5. The cartridge of claim 1 , further comprising:
a first spring connected between the lid and the first pusher plate, the first pusher plate being linearly movable by the first electronic device relative to the lid to cause deformation of the first spring; and
a second spring connected between the lid and the second pusher plate, the second pusher plate being lineally movable by the second electronic device relative to the lid to cause deformation of the second spring.

6. The cartridge of claim 5 , wherein the first pusher plate has a first pusher plate lip and the lid has a first lid ledge, wherein the first pusher plate lip rests on the first lid ledge to prevent the first spring from moving the first pusher plate out of the lid and the second pusher plate has a second pusher plate lip and the lid has a second lid ledge, wherein the second pusher plate lip rests on the second lid ledge to prevent the second spring from moving the second pusher plate out of the lid.

7. The cartridge of claim 1 , further comprising:
a securing formation on the lid; and
a securing formation on the socket, the securing formation on being engageable with one another to secure the lid to the socket after moving the lid towards the socket.

8. The cartridge of claim 1 , wherein the socket has a third formation on the upper side to hold a third device, further comprising:
a third pusher plate rotatably mounted to the lid, the rotatable mounting of the third pusher plate allowing the third device to rotate the third pusher plate independently from the second pusher plate relative to the lid;
a third set of terminals held in the socket to connect to the third device; and
a third set of contacts connected to the third set of terminals.

9. A method of testing one or more electronic devices comprising:
releasably holding a first electronic device in a first formation on an upper side of a socket of insulative material;
releasably holding a second electronic device in a second formation on an upper side of the socket;
locating a lid over the socket, the lid having a first pusher plate rotatably mounted to the lid and a second pusher plate rotatably mounted to the lid;
moving the lid towards the socket, the rotatable mounting of the first pusher plate allowing for the first electronic device to rotate the first pusher plate relative to the lid and the rotatable mounting of the second pusher plate allowing the second electronic device to rotate the second pusher plate independently from the first pusher plate relative to the lid; and
connecting the first and second electronic devices to an electric tester through an interface connected to the socket.

Assignees

• Aehr Test Systems

Inventors

• Jovanovic Jovan
• Deboe Kenneth W
• Steps Steven C
• Lindsey Scott E

Classifications

• H10P72/76

  using mechanical means, e.g. clamps or pinches · CPC title

• H10P72/7616

  characterised by a coating, a hardness or a material · CPC title

• G01R31/2642

  Testing semiconductor operation lifetime or reliability, e.g. by accelerated life tests · CPC title

• G01R31/2601

  Apparatus or methods therefor (G01R31/2607, G01R31/2642 take precedence) · CPC title

• H05K7/1417

  having securing means for mounting boards, plates or wiring boards (H05K7/1461 takes precedence) · CPC title